SG11202106084SA - Measurement guide device and simulation computing device used therefor - Google Patents

Measurement guide device and simulation computing device used therefor

Info

Publication number
SG11202106084SA
SG11202106084SA SG11202106084SA SG11202106084SA SG11202106084SA SG 11202106084S A SG11202106084S A SG 11202106084SA SG 11202106084S A SG11202106084S A SG 11202106084SA SG 11202106084S A SG11202106084S A SG 11202106084SA SG 11202106084S A SG11202106084S A SG 11202106084SA
Authority
SG
Singapore
Prior art keywords
used therefor
computing device
measurement guide
simulation computing
device used
Prior art date
Application number
SG11202106084SA
Inventor
Takuya Kanazawa
Akinori Asahara
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of SG11202106084SA publication Critical patent/SG11202106084SA/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F16/00—Information retrieval; Database structures therefor; File system structures therefor
    • G06F16/20—Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
    • G06F16/24—Querying
    • G06F16/245—Query processing
    • G06F16/2458—Special types of queries, e.g. statistical queries, fuzzy queries or distributed queries
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F16/00—Information retrieval; Database structures therefor; File system structures therefor
    • G06F16/20—Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
    • G06F16/24—Querying
    • G06F16/245—Query processing
    • G06F16/2458—Special types of queries, e.g. statistical queries, fuzzy queries or distributed queries
    • G06F16/2462—Approximate or statistical queries
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Probability & Statistics with Applications (AREA)
  • Chemical & Material Sciences (AREA)
  • Software Systems (AREA)
  • Data Mining & Analysis (AREA)
  • Databases & Information Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Computational Linguistics (AREA)
  • Mathematical Physics (AREA)
  • Fuzzy Systems (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
SG11202106084SA 2019-02-13 2020-01-23 Measurement guide device and simulation computing device used therefor SG11202106084SA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019023370A JP7222749B2 (en) 2019-02-13 2019-02-13 Measurement guide device and simulation arithmetic device used therefor
PCT/JP2020/002319 WO2020166300A1 (en) 2019-02-13 2020-01-23 Measurement guide device, and simulation computation device used in same

Publications (1)

Publication Number Publication Date
SG11202106084SA true SG11202106084SA (en) 2021-07-29

Family

ID=72044006

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202106084SA SG11202106084SA (en) 2019-02-13 2020-01-23 Measurement guide device and simulation computing device used therefor

Country Status (5)

Country Link
US (1) US11741113B2 (en)
JP (1) JP7222749B2 (en)
CN (1) CN113396327A (en)
SG (1) SG11202106084SA (en)
WO (1) WO2020166300A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7221536B2 (en) * 2019-12-27 2023-02-14 株式会社リガク Scattering measurement analysis method, scattering measurement analysis apparatus, and scattering measurement analysis program

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5200910A (en) * 1991-01-30 1993-04-06 The Board Of Trustees Of The Leland Stanford University Method for modelling the electron density of a crystal
JP2005258480A (en) 2002-02-20 2005-09-22 Nec Corp Active learning system, active learning method used in the same and program for the same
JP2008159574A (en) * 2006-11-27 2008-07-10 Hitachi High-Technologies Corp Scanning electron microscope
CN101231252B (en) * 2007-09-03 2012-11-14 清华大学 Method and device for eliminating energy jitter of electronic microscope electron energy loss spectrum
JP5375398B2 (en) * 2008-06-30 2013-12-25 株式会社デンロコーポレーション Paint degradation diagnosis method and apparatus
WO2011021346A1 (en) 2009-08-21 2011-02-24 株式会社 日立ハイテクノロジーズ Pattern shape estimation method and pattern measuring device
JP5771866B2 (en) 2011-08-01 2015-09-02 株式会社日立製作所 Area survey support system, area survey support method, and area survey support device
JP5730721B2 (en) * 2011-09-08 2015-06-10 株式会社日立ハイテクノロジーズ Pattern measuring apparatus and pattern measuring method
US10190875B2 (en) * 2014-06-27 2019-01-29 Hitachi High-Technologies Corporation Pattern measurement condition setting device and pattern measuring device
WO2016035147A1 (en) * 2014-09-02 2016-03-10 株式会社ニコン Measurement processing device, measurement processing method, measurement processing program, and structure production method
EP3222098B1 (en) * 2014-11-21 2019-03-20 Sony Corporation Telecommunications apparatus and method for obtaining a measurement result
JP6377582B2 (en) 2015-08-06 2018-08-22 株式会社リガク X-ray analysis operation guide system, operation guide method, and operation guide program
US20180268015A1 (en) * 2015-09-02 2018-09-20 Sasha Sugaberry Method and apparatus for locating errors in documents via database queries, similarity-based information retrieval and modeling the errors for error resolution
WO2017116692A1 (en) * 2015-12-28 2017-07-06 Dexcom, Inc. Systems and methods for remote and host monitoring communications
US20180308030A1 (en) * 2017-04-24 2018-10-25 Walmart Apollo, Llc System and Method for Establishing Regional Distribution Center Inventory Levels for New Third Party Products
US11406257B2 (en) * 2018-07-27 2022-08-09 Welch Allyn, Inc. Vision screening device and methods

Also Published As

Publication number Publication date
US11741113B2 (en) 2023-08-29
JP2020134156A (en) 2020-08-31
WO2020166300A1 (en) 2020-08-20
US20220027364A1 (en) 2022-01-27
JP7222749B2 (en) 2023-02-15
CN113396327A (en) 2021-09-14

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