SG11202103597SA - Device and method for tuning plasma distribution using phase control - Google Patents
Device and method for tuning plasma distribution using phase controlInfo
- Publication number
- SG11202103597SA SG11202103597SA SG11202103597SA SG11202103597SA SG11202103597SA SG 11202103597S A SG11202103597S A SG 11202103597SA SG 11202103597S A SG11202103597S A SG 11202103597SA SG 11202103597S A SG11202103597S A SG 11202103597SA SG 11202103597S A SG11202103597S A SG 11202103597SA
- Authority
- SG
- Singapore
- Prior art keywords
- phase control
- plasma distribution
- tuning plasma
- tuning
- distribution
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32137—Radio frequency generated discharge controlling of the discharge by modulation of energy
- H01J37/32155—Frequency modulation
- H01J37/32165—Plural frequencies
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32467—Material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4585—Devices at or outside the perimeter of the substrate support, e.g. clamping rings, shrouds
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4586—Elements in the interior of the support, e.g. electrodes, heating or cooling devices
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
- C23C16/509—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
- C23C16/5096—Flat-bed apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32091—Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32715—Workpiece holder
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02263—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
- H01L21/02271—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H01L21/02274—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02296—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer
- H01L21/02299—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer pre-treatment
- H01L21/02312—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer pre-treatment treatment by exposure to a gas or vapour
- H01L21/02315—Forming insulating materials on a substrate characterised by the treatment performed before or after the formation of the layer pre-treatment treatment by exposure to a gas or vapour treatment by exposure to a plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/245—Detection characterised by the variable being measured
- H01J2237/24564—Measurements of electric or magnetic variables, e.g. voltage, current, frequency
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/332—Coating
- H01J2237/3321—CVD [Chemical Vapor Deposition]
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Plasma Technology (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201862770547P | 2018-11-21 | 2018-11-21 | |
PCT/US2019/057949 WO2020106408A1 (en) | 2018-11-21 | 2019-10-24 | Device and method for tuning plasma distribution using phase control |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202103597SA true SG11202103597SA (en) | 2021-06-29 |
Family
ID=70727094
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202103597SA SG11202103597SA (en) | 2018-11-21 | 2019-10-24 | Device and method for tuning plasma distribution using phase control |
Country Status (7)
Country | Link |
---|---|
US (1) | US11908662B2 (en) |
JP (1) | JP7465265B2 (en) |
KR (1) | KR20210080555A (en) |
CN (1) | CN112955997B (en) |
SG (1) | SG11202103597SA (en) |
TW (1) | TWI835901B (en) |
WO (1) | WO2020106408A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20240090369A (en) * | 2021-10-18 | 2024-06-21 | 램 리써치 코포레이션 | Systems and methods for determining phase difference between RF signals provided to electrodes |
Family Cites Families (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4557819A (en) * | 1984-07-20 | 1985-12-10 | Varian Associates, Inc. | System for igniting and controlling a wafer processing plasma |
JPH0627341B2 (en) * | 1988-02-05 | 1994-04-13 | 株式会社半導体エネルギー研究所 | Thin film formation method |
JPH0747820B2 (en) | 1989-09-22 | 1995-05-24 | 株式会社日立製作所 | Film forming equipment |
JPH05205898A (en) | 1991-07-24 | 1993-08-13 | Tokyo Electron Yamanashi Kk | Plasma processing device |
KR0184675B1 (en) | 1991-07-24 | 1999-04-15 | 이노우에 쥰이치 | Plasma processing apparatus capable of detecting and regulating actual rf power at electrode within chamber |
JPH0613196A (en) | 1992-06-25 | 1994-01-21 | Matsushita Electric Ind Co Ltd | Plasma generating method and generating device |
KR100302167B1 (en) * | 1993-11-05 | 2001-11-22 | 히가시 데쓰로 | Plasma Treatment Equipment and Plasma Treatment Methods |
JP3328625B2 (en) * | 1994-04-28 | 2002-09-30 | 東京エレクトロン株式会社 | Plasma processing method and plasma processing apparatus |
US5885356A (en) * | 1994-11-30 | 1999-03-23 | Applied Materials, Inc. | Method of reducing residue accumulation in CVD chamber using ceramic lining |
US5846332A (en) * | 1996-07-12 | 1998-12-08 | Applied Materials, Inc. | Thermally floating pedestal collar in a chemical vapor deposition chamber |
JPH10237657A (en) | 1997-02-26 | 1998-09-08 | Furontetsuku:Kk | Plasma treating device |
TW507256B (en) | 2000-03-13 | 2002-10-21 | Mitsubishi Heavy Ind Ltd | Discharge plasma generating method, discharge plasma generating apparatus, semiconductor device fabrication method, and semiconductor device fabrication apparatus |
JP4672169B2 (en) | 2001-04-05 | 2011-04-20 | キヤノンアネルバ株式会社 | Plasma processing equipment |
US7972467B2 (en) * | 2003-04-17 | 2011-07-05 | Applied Materials Inc. | Apparatus and method to confine plasma and reduce flow resistance in a plasma reactor |
JP4773079B2 (en) * | 2004-11-26 | 2011-09-14 | 株式会社日立ハイテクノロジーズ | Control method of plasma processing apparatus |
US7988815B2 (en) * | 2007-07-26 | 2011-08-02 | Applied Materials, Inc. | Plasma reactor with reduced electrical skew using electrical bypass elements |
US20090236214A1 (en) * | 2008-03-20 | 2009-09-24 | Karthik Janakiraman | Tunable ground planes in plasma chambers |
JP5396256B2 (en) | 2009-12-10 | 2014-01-22 | 東京エレクトロン株式会社 | Plasma processing equipment |
KR101714607B1 (en) * | 2010-06-10 | 2017-03-09 | 어플라이드 머티어리얼스, 인코포레이티드 | Low resistivity tungsten pvd with enhanced ionization and rf power coupling |
TW202418889A (en) * | 2011-10-05 | 2024-05-01 | 美商應用材料股份有限公司 | Plasma processing apparatus comprising symmetric plasma process chamber and lid assembly for the same |
US10224182B2 (en) | 2011-10-17 | 2019-03-05 | Novellus Systems, Inc. | Mechanical suppression of parasitic plasma in substrate processing chamber |
US20130284369A1 (en) | 2012-04-26 | 2013-10-31 | Applied Materials, Inc. | Two-phase operation of plasma chamber by phase locked loop |
US9388494B2 (en) | 2012-06-25 | 2016-07-12 | Novellus Systems, Inc. | Suppression of parasitic deposition in a substrate processing system by suppressing precursor flow and plasma outside of substrate region |
US9312106B2 (en) * | 2013-03-13 | 2016-04-12 | Applied Materials, Inc. | Digital phase controller for two-phase operation of a plasma reactor |
US10125422B2 (en) * | 2013-03-27 | 2018-11-13 | Applied Materials, Inc. | High impedance RF filter for heater with impedance tuning device |
US9543158B2 (en) * | 2014-12-04 | 2017-01-10 | Lam Research Corporation | Technique to deposit sidewall passivation for high aspect ratio cylinder etch |
JP5800964B1 (en) * | 2014-07-22 | 2015-10-28 | 株式会社日立国際電気 | Substrate processing apparatus, semiconductor device manufacturing method, and recording medium |
US10395895B2 (en) | 2015-08-27 | 2019-08-27 | Mks Instruments, Inc. | Feedback control by RF waveform tailoring for ion energy distribution |
WO2017184223A1 (en) | 2016-04-22 | 2017-10-26 | Applied Materials, Inc. | Substrate support pedestal having plasma confinement features |
US10777386B2 (en) * | 2017-10-17 | 2020-09-15 | Lam Research Corporation | Methods for controlling plasma glow discharge in a plasma chamber |
-
2019
- 2019-10-24 KR KR1020217017429A patent/KR20210080555A/en unknown
- 2019-10-24 SG SG11202103597SA patent/SG11202103597SA/en unknown
- 2019-10-24 US US16/663,215 patent/US11908662B2/en active Active
- 2019-10-24 JP JP2021527838A patent/JP7465265B2/en active Active
- 2019-10-24 CN CN201980071231.2A patent/CN112955997B/en active Active
- 2019-10-24 WO PCT/US2019/057949 patent/WO2020106408A1/en active Application Filing
- 2019-10-25 TW TW108138595A patent/TWI835901B/en active
Also Published As
Publication number | Publication date |
---|---|
WO2020106408A1 (en) | 2020-05-28 |
CN112955997A (en) | 2021-06-11 |
CN112955997B (en) | 2024-04-05 |
KR20210080555A (en) | 2021-06-30 |
JP7465265B2 (en) | 2024-04-10 |
TWI835901B (en) | 2024-03-21 |
US20200161093A1 (en) | 2020-05-21 |
US11908662B2 (en) | 2024-02-20 |
TW202038292A (en) | 2020-10-16 |
JP2022507782A (en) | 2022-01-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP3704966A4 (en) | Aerosol generating device and method for controlling same | |
EP3818868A4 (en) | Aerosol generating device and method for controlling same | |
EP3268835A4 (en) | Method and apparatus for controlling temperature adjustment device | |
EP3641244A4 (en) | Method and apparatus for selecting path | |
EP3666095A4 (en) | Aerosol generation device and control method for aerosol generation device | |
EP3550752A4 (en) | Method device and system for feedback | |
ZA202005512B (en) | System and method for composite-key based blockchain device control | |
EP3818857A4 (en) | Aerosol generating device and method for controlling same | |
SG11202007848SA (en) | Access control methods and apparatus for radio systems | |
SG11202007028XA (en) | Methods and apparatus for controlled rf treatments and rf generator system | |
IL283109A (en) | Apparatus and methods for multi-chamber, multi-atomizer vaporization devices | |
EP3346653A4 (en) | Method and device for pilot frequency distribution | |
GB201809225D0 (en) | Method and apparatus for access control | |
EP3793091A4 (en) | Phase locking device and phase locking method | |
EP3785689A4 (en) | Control device for massager and method therefor | |
EP3796611A4 (en) | Phase calibration method and device | |
EP3722756A4 (en) | Phase deviation compensation method and device | |
EP3776973A4 (en) | Method and apparatus for phase tracking | |
EP3724977A4 (en) | Power factor adjustment method and apparatus through the phase control | |
EP3570405A4 (en) | Device and method for controlling discharge | |
EP3565345A4 (en) | Method and device for tuning | |
GB2579116B (en) | Electronic apparatus and control method for electronic apparatus | |
GB2546324B (en) | Method and device for correcting antenna phase | |
EP3609244A4 (en) | Method and device for configuring parameters | |
SG11202103597SA (en) | Device and method for tuning plasma distribution using phase control |