SG11202010328YA - Bus synchronization system - Google Patents

Bus synchronization system

Info

Publication number
SG11202010328YA
SG11202010328YA SG11202010328YA SG11202010328YA SG11202010328YA SG 11202010328Y A SG11202010328Y A SG 11202010328YA SG 11202010328Y A SG11202010328Y A SG 11202010328YA SG 11202010328Y A SG11202010328Y A SG 11202010328YA SG 11202010328Y A SG11202010328Y A SG 11202010328YA
Authority
SG
Singapore
Prior art keywords
synchronization system
bus synchronization
bus
synchronization
Prior art date
Application number
SG11202010328YA
Inventor
Michael C Panis
Jeffrey S Benagh
Richard Pye
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of SG11202010328YA publication Critical patent/SG11202010328YA/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G01R31/31726—Synchronization, e.g. of test, clock or strobe signals; Signals in different clock domains; Generation of Vernier signals; Comparison and adjustment of the signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318314—Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/42—Bus transfer protocol, e.g. handshake; Synchronisation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/42—Bus transfer protocol, e.g. handshake; Synchronisation
    • G06F13/4204—Bus transfer protocol, e.g. handshake; Synchronisation on a parallel bus
    • G06F13/4221—Bus transfer protocol, e.g. handshake; Synchronisation on a parallel bus being an input/output bus, e.g. ISA bus, EISA bus, PCI bus, SCSI bus
    • G06F13/423—Bus transfer protocol, e.g. handshake; Synchronisation on a parallel bus being an input/output bus, e.g. ISA bus, EISA bus, PCI bus, SCSI bus with synchronous protocol

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
SG11202010328YA 2018-05-10 2019-04-19 Bus synchronization system SG11202010328YA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/976,407 US10896106B2 (en) 2018-05-10 2018-05-10 Bus synchronization system that aggregates status
PCT/US2019/028247 WO2019217056A1 (en) 2018-05-10 2019-04-19 Bus synchronization system

Publications (1)

Publication Number Publication Date
SG11202010328YA true SG11202010328YA (en) 2020-11-27

Family

ID=68464711

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202010328YA SG11202010328YA (en) 2018-05-10 2019-04-19 Bus synchronization system

Country Status (7)

Country Link
US (1) US10896106B2 (en)
EP (1) EP3791197B1 (en)
JP (1) JP2021523438A (en)
KR (1) KR20200142090A (en)
CN (1) CN112074747A (en)
SG (1) SG11202010328YA (en)
WO (1) WO2019217056A1 (en)

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US11853179B1 (en) * 2018-12-28 2023-12-26 Teledyne Lecroy, Inc. Detection of a DMA (direct memory access) memory address violation when testing PCIE devices
US11904890B2 (en) * 2020-06-17 2024-02-20 Baidu Usa Llc Lane change system for lanes with different speed limits

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Also Published As

Publication number Publication date
US10896106B2 (en) 2021-01-19
US20190347175A1 (en) 2019-11-14
EP3791197A4 (en) 2021-06-30
WO2019217056A1 (en) 2019-11-14
KR20200142090A (en) 2020-12-21
EP3791197B1 (en) 2022-09-21
CN112074747A (en) 2020-12-11
EP3791197A1 (en) 2021-03-17
JP2021523438A (en) 2021-09-02
TW201947400A (en) 2019-12-16

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