SG11202004817QA - An ethynyl derived composite, a composition comprising thereof, a method for manufacturing a coating by it, and a method for manufacturing a device comprising the coating - Google Patents

An ethynyl derived composite, a composition comprising thereof, a method for manufacturing a coating by it, and a method for manufacturing a device comprising the coating

Info

Publication number
SG11202004817QA
SG11202004817QA SG11202004817QA SG11202004817QA SG11202004817QA SG 11202004817Q A SG11202004817Q A SG 11202004817QA SG 11202004817Q A SG11202004817Q A SG 11202004817QA SG 11202004817Q A SG11202004817Q A SG 11202004817QA SG 11202004817Q A SG11202004817Q A SG 11202004817QA
Authority
SG
Singapore
Prior art keywords
coating
manufacturing
ethynyl
composition
derived composite
Prior art date
Application number
SG11202004817QA
Inventor
Shigemasa Nakasugi
Yusuke Hama
Hiroshi Yanagita
Takashi Sekito
Yuriko Matsuura
Original Assignee
Merck Patent Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Merck Patent Gmbh filed Critical Merck Patent Gmbh
Publication of SG11202004817QA publication Critical patent/SG11202004817QA/en

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/09Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/094Multilayer resist systems, e.g. planarising layers
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G8/00Condensation polymers of aldehydes or ketones with phenols only
    • C08G8/02Condensation polymers of aldehydes or ketones with phenols only of ketones
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G8/00Condensation polymers of aldehydes or ketones with phenols only
    • C08G8/28Chemically modified polycondensates
    • C08G8/30Chemically modified polycondensates by unsaturated compounds, e.g. terpenes
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09DCOATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
    • C09D161/00Coating compositions based on condensation polymers of aldehydes or ketones; Coating compositions based on derivatives of such polymers
    • C09D161/04Condensation polymers of aldehydes or ketones with phenols only
    • C09D161/16Condensation polymers of aldehydes or ketones with phenols only of ketones with phenols
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/09Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/11Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Structural Engineering (AREA)
  • Architecture (AREA)
  • General Chemical & Material Sciences (AREA)
  • Wood Science & Technology (AREA)
  • Materials Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Materials For Photolithography (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Paints Or Removers (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Polyoxymethylene Polymers And Polymers With Carbon-To-Carbon Bonds (AREA)
  • Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
  • Macromonomer-Based Addition Polymer (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Phenolic Resins Or Amino Resins (AREA)
SG11202004817QA 2017-12-20 2018-12-17 An ethynyl derived composite, a composition comprising thereof, a method for manufacturing a coating by it, and a method for manufacturing a device comprising the coating SG11202004817QA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP17208939 2017-12-20
PCT/EP2018/085147 WO2019121480A1 (en) 2017-12-20 2018-12-17 An ethynyl derived composite, a composition comprising thereof, a method for manufacturing a coating by it, and a method for manufacturing a device comprising the coating

Publications (1)

Publication Number Publication Date
SG11202004817QA true SG11202004817QA (en) 2020-07-29

Family

ID=60953558

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202004817QA SG11202004817QA (en) 2017-12-20 2018-12-17 An ethynyl derived composite, a composition comprising thereof, a method for manufacturing a coating by it, and a method for manufacturing a device comprising the coating

Country Status (8)

Country Link
US (2) US11609498B2 (en)
EP (1) EP3729196A1 (en)
JP (2) JP7145217B2 (en)
KR (1) KR20200100750A (en)
CN (1) CN111492310A (en)
SG (1) SG11202004817QA (en)
TW (2) TWI802622B (en)
WO (1) WO2019121480A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7161451B2 (en) * 2019-07-05 2022-10-26 信越化学工業株式会社 Composition for forming organic film, substrate for manufacturing semiconductor device, method for forming organic film, and method for forming pattern
JP2023521230A (en) 2020-04-17 2023-05-23 メルク パテント ゲゼルシャフト ミット ベシュレンクテル ハフツング Spin-coating composition comprising carbon material, metal-organic compound and solvent, and method for producing metal oxide film over substrate
JP7445583B2 (en) * 2020-11-25 2024-03-07 信越化学工業株式会社 Resist underlayer film material, pattern forming method, and resist underlayer film forming method

Family Cites Families (19)

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US3474054A (en) 1966-09-13 1969-10-21 Permalac Corp The Surface coating compositions containing pyridine salts or aromatic sulfonic acids
US4200729A (en) 1978-05-22 1980-04-29 King Industries, Inc Curing amino resins with aromatic sulfonic acid oxa-azacyclopentane adducts
US4251665A (en) 1978-05-22 1981-02-17 King Industries, Inc. Aromatic sulfonic acid oxa-azacyclopentane adducts
US5187019A (en) 1991-09-06 1993-02-16 King Industries, Inc. Latent catalysts
KR100816735B1 (en) * 2006-12-20 2008-03-25 제일모직주식회사 Hardmask composition having antireflective property, process of producing patterned materials by using the same and integrated circuit devices
US20090035704A1 (en) * 2007-08-03 2009-02-05 Hong Zhuang Underlayer Coating Composition Based on a Crosslinkable Polymer
JP2011026375A (en) * 2009-07-21 2011-02-10 Sumitomo Bakelite Co Ltd Film-forming composition, insulating film, and semiconductor device
KR101866828B1 (en) * 2010-10-14 2018-06-14 닛산 가가쿠 고교 가부시키 가이샤 Lithographic resist underlayer film-forming compound that comprises resin including polyether structure
FI20115628L (en) 2011-06-20 2012-12-21 Silecs Oy New polymer composition and method for its preparation
JP6137486B2 (en) * 2012-02-01 2017-05-31 日産化学工業株式会社 Resist underlayer film forming composition containing copolymer resin containing heterocycle
KR102066229B1 (en) 2013-03-26 2020-01-15 주식회사 동진쎄미켐 Under-layer composition of resist and method for forming pattern using the the same
KR102134674B1 (en) * 2014-06-16 2020-07-16 닛산 가가쿠 가부시키가이샤 Resist underlayer film-forming composition
JP6641879B2 (en) * 2015-03-03 2020-02-05 Jsr株式会社 Composition for forming resist underlayer film, method for producing resist underlayer film and patterned substrate
US20170137663A9 (en) 2015-03-03 2017-05-18 Jsr Corporation Composition for resist underlayer film formation, resist underlayer film, and production method of patterned substrate
JP6711104B2 (en) * 2015-04-24 2020-06-17 Jsr株式会社 Resist underlayer film forming method and pattern forming method
KR102421597B1 (en) * 2015-07-14 2022-07-18 에스케이이노베이션 주식회사 Novel polymer for preparing resist underlayer film, resist underlayer film composition containing the polymer and process for forming resist pattern using the composition
JP6625934B2 (en) * 2015-07-14 2019-12-25 信越化学工業株式会社 Resist underlayer film material, pattern forming method, and compound
JP6714493B2 (en) * 2015-12-24 2020-06-24 信越化学工業株式会社 Organic film forming compound, organic film forming composition, organic film forming method, and pattern forming method
JP6462602B2 (en) * 2016-01-12 2019-01-30 信越化学工業株式会社 Multilayer film forming method and pattern forming method

Also Published As

Publication number Publication date
EP3729196A1 (en) 2020-10-28
JP2021506996A (en) 2021-02-22
KR20200100750A (en) 2020-08-26
JP2022179491A (en) 2022-12-02
TW202332709A (en) 2023-08-16
WO2019121480A1 (en) 2019-06-27
US20200401046A1 (en) 2020-12-24
US20230194989A1 (en) 2023-06-22
CN111492310A (en) 2020-08-04
TW201930379A (en) 2019-08-01
TWI802622B (en) 2023-05-21
JP7145217B2 (en) 2022-09-30
US11609498B2 (en) 2023-03-21
US11914296B2 (en) 2024-02-27

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