SG11202001895RA - Methods and apparatus for controlling contaminant deposition on a dynode electron-emmissive surface - Google Patents
Methods and apparatus for controlling contaminant deposition on a dynode electron-emmissive surfaceInfo
- Publication number
- SG11202001895RA SG11202001895RA SG11202001895RA SG11202001895RA SG11202001895RA SG 11202001895R A SG11202001895R A SG 11202001895RA SG 11202001895R A SG11202001895R A SG 11202001895RA SG 11202001895R A SG11202001895R A SG 11202001895RA SG 11202001895R A SG11202001895R A SG 11202001895RA
- Authority
- SG
- Singapore
- Prior art keywords
- emmissive
- methods
- dynode electron
- contaminant deposition
- controlling contaminant
- Prior art date
Links
- 239000000356 contaminant Substances 0.000 title 1
- 230000008021 deposition Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
- H01J43/04—Electron multipliers
- H01J43/06—Electrode arrangements
- H01J43/10—Dynodes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
- B08B7/0035—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2209/00—Apparatus and processes for manufacture of discharge tubes
- H01J2209/01—Generalised techniques
- H01J2209/017—Cleaning
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- High Energy & Nuclear Physics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2017904061A AU2017904061A0 (en) | 2017-10-09 | Methods and apparatus for controlling contaminant deposition on a dynode electron-emmissive surface | |
PCT/AU2018/050930 WO2019071294A1 (en) | 2017-10-09 | 2018-08-29 | Methods and apparatus for controlling contaminant deposition on a dynode electron-emmissive surface |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202001895RA true SG11202001895RA (en) | 2020-04-29 |
Family
ID=66100109
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202001895RA SG11202001895RA (en) | 2017-10-09 | 2018-08-29 | Methods and apparatus for controlling contaminant deposition on a dynode electron-emmissive surface |
Country Status (9)
Country | Link |
---|---|
US (1) | US20210175043A1 (en) |
EP (1) | EP3695436A4 (en) |
JP (1) | JP7181288B2 (en) |
KR (1) | KR20200094130A (en) |
CN (1) | CN111466010A (en) |
AU (1) | AU2018349073A1 (en) |
CA (1) | CA3078239A1 (en) |
SG (1) | SG11202001895RA (en) |
WO (1) | WO2019071294A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112420477B (en) * | 2020-10-30 | 2022-09-06 | 北方夜视技术股份有限公司 | High-gain and low-luminescence ALD-MCP and preparation method and application thereof |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4347458A (en) * | 1980-03-26 | 1982-08-31 | Rca Corporation | Photomultiplier tube having a gain modifying Nichrome dynode |
US4978885A (en) * | 1989-03-02 | 1990-12-18 | Galileo Electro-Optics Corporation | Electron multipliers with reduced ion feedback |
JPH02288140A (en) * | 1989-04-28 | 1990-11-28 | Hitachi Ltd | Charged particle sensor |
US5205902A (en) * | 1989-08-18 | 1993-04-27 | Galileo Electro-Optics Corporation | Method of manufacturing microchannel electron multipliers |
DE69030145T2 (en) * | 1989-08-18 | 1997-07-10 | Galileo Electro Optics Corp | Continuous thin film dynodes |
JP4627916B2 (en) * | 2001-03-29 | 2011-02-09 | キヤノンアネルバ株式会社 | Ionizer |
GB2412231B (en) * | 2004-02-26 | 2008-09-24 | Electron Tubes Ltd | Photomultiplier |
US20090014644A1 (en) * | 2007-07-13 | 2009-01-15 | Inficon, Inc. | In-situ ion source cleaning for partial pressure analyzers used in process monitoring |
EP2447979A1 (en) | 2009-06-22 | 2012-05-02 | Shimadzu Corporation | Mass spectrometer |
CN106575598B (en) * | 2014-08-01 | 2020-04-28 | 安捷伦科技有限公司 | Plasma cleaning of mass spectrometer |
US9799490B2 (en) * | 2015-03-31 | 2017-10-24 | Fei Company | Charged particle beam processing using process gas and cooled surface |
JP6889169B2 (en) * | 2016-02-03 | 2021-06-18 | アダプタス ソリューションズ プロプライエタリー リミテッド | Devices and methods for controlling charged particles in a magnetic field |
-
2018
- 2018-08-29 KR KR1020207009891A patent/KR20200094130A/en not_active Application Discontinuation
- 2018-08-29 WO PCT/AU2018/050930 patent/WO2019071294A1/en unknown
- 2018-08-29 CN CN201880065894.9A patent/CN111466010A/en active Pending
- 2018-08-29 JP JP2020515258A patent/JP7181288B2/en active Active
- 2018-08-29 US US16/754,802 patent/US20210175043A1/en not_active Abandoned
- 2018-08-29 AU AU2018349073A patent/AU2018349073A1/en not_active Abandoned
- 2018-08-29 CA CA3078239A patent/CA3078239A1/en active Pending
- 2018-08-29 SG SG11202001895RA patent/SG11202001895RA/en unknown
- 2018-08-29 EP EP18866671.3A patent/EP3695436A4/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
CN111466010A (en) | 2020-07-28 |
EP3695436A4 (en) | 2021-06-16 |
EP3695436A1 (en) | 2020-08-19 |
JP2020537283A (en) | 2020-12-17 |
CA3078239A1 (en) | 2019-04-18 |
KR20200094130A (en) | 2020-08-06 |
WO2019071294A1 (en) | 2019-04-18 |
JP7181288B2 (en) | 2022-11-30 |
US20210175043A1 (en) | 2021-06-10 |
AU2018349073A1 (en) | 2020-04-16 |
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