SG11202001644RA - Apparatus for selecting products on the basis of their composition by x ray fluorescent spectroscopy and corresponding selection method - Google Patents

Apparatus for selecting products on the basis of their composition by x ray fluorescent spectroscopy and corresponding selection method

Info

Publication number
SG11202001644RA
SG11202001644RA SG11202001644RA SG11202001644RA SG11202001644RA SG 11202001644R A SG11202001644R A SG 11202001644RA SG 11202001644R A SG11202001644R A SG 11202001644RA SG 11202001644R A SG11202001644R A SG 11202001644RA SG 11202001644R A SG11202001644R A SG 11202001644RA
Authority
SG
Singapore
Prior art keywords
basis
composition
selection method
corresponding selection
ray fluorescent
Prior art date
Application number
SG11202001644RA
Inventor
Giuseppe Pitta'
Massimo Amenduni
Mauro Zona
Original Assignee
De Tec Tor S R L
Acciaierie Valbruna S P A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by De Tec Tor S R L, Acciaierie Valbruna S P A filed Critical De Tec Tor S R L
Publication of SG11202001644RA publication Critical patent/SG11202001644RA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608—Height gauges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/202—Constituents thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/308—Accessories, mechanical or electrical features support of radiation source
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/32—Accessories, mechanical or electrical features adjustments of elements during operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3308—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object translates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/507—Detectors secondary-emission detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/624—Specific applications or type of materials steel, castings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
SG11202001644RA 2017-09-06 2018-08-30 Apparatus for selecting products on the basis of their composition by x ray fluorescent spectroscopy and corresponding selection method SG11202001644RA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT102017000100060A IT201700100060A1 (en) 2017-09-06 2017-09-06 SELECTION SYSTEM OF PRODUCTS BASED ON THEIR COMPOSITION THROUGH X-RAY FLUORESCENCE SPECTROSCOPY AND ITS SELECTION PROCEDURE
PCT/IB2018/056637 WO2019049000A1 (en) 2017-09-06 2018-08-30 Apparatus for selecting products on the basis of their composition by x ray fluorescent spectroscopy and corresponding selection method

Publications (1)

Publication Number Publication Date
SG11202001644RA true SG11202001644RA (en) 2020-03-30

Family

ID=60991350

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202001644RA SG11202001644RA (en) 2017-09-06 2018-08-30 Apparatus for selecting products on the basis of their composition by x ray fluorescent spectroscopy and corresponding selection method

Country Status (5)

Country Link
US (1) US11442031B2 (en)
JP (1) JP7392252B2 (en)
IT (1) IT201700100060A1 (en)
SG (1) SG11202001644RA (en)
WO (1) WO2019049000A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20210076942A (en) * 2018-10-18 2021-06-24 시큐리티 매터스 엘티디. Systems and Methods for Detection and Identification of Foreign Objects in Substances
IT201900004671A1 (en) * 2019-03-28 2020-09-28 De Tec Tor S R L APPARATUS FOR QUALITY CONTROL IN PRODUCTION LINES, CORRESPONDING PROCEDURE AND IT PRODUCT

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8725741D0 (en) * 1987-11-03 1987-12-09 Secretary Trade Ind Brit Control of pyrometallurgical processes
FR2629914B1 (en) * 1988-04-06 1991-09-06 Aerospatiale METHOD AND DEVICE FOR DETERMINING THE DENSITY OF AN ELEMENTARY VOLUME OF MATERIAL
JP2551728Y2 (en) * 1991-06-24 1997-10-27 理学電機工業株式会社 Height adjustment dummy for total reflection X-ray fluorescence spectrometer
US6266390B1 (en) * 1998-09-21 2001-07-24 Spectramet, Llc High speed materials sorting using x-ray fluorescence
JP4694296B2 (en) 2005-07-26 2011-06-08 浜松ホトニクス株式会社 X-ray fluorescence three-dimensional analyzer
US7796726B1 (en) * 2006-02-14 2010-09-14 University Of Maryland, Baltimore County Instrument and method for X-ray diffraction, fluorescence, and crystal texture analysis without sample preparation
US8475042B1 (en) * 2009-10-21 2013-07-02 Ceres Technologies, Inc. Thermal shield system for high temperature environment XRF metrology tools
GB2476255B (en) * 2009-12-17 2012-03-07 Thermo Fisher Scient Ecublens Sarl Method and apparatus for performing x-ray analysis of a sample
JP6028655B2 (en) 2012-03-30 2016-11-16 新日鐵住金株式会社 Steel grade judgment method
CN108136445B (en) * 2015-07-16 2020-11-20 索特拉合金有限公司 Material sorting system

Also Published As

Publication number Publication date
US11442031B2 (en) 2022-09-13
IT201700100060A1 (en) 2019-03-06
US20210063328A1 (en) 2021-03-04
JP7392252B2 (en) 2023-12-06
WO2019049000A1 (en) 2019-03-14
JP2020532744A (en) 2020-11-12

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