SG11201807873PA - Adapters for testing electrical equipment - Google Patents
Adapters for testing electrical equipmentInfo
- Publication number
- SG11201807873PA SG11201807873PA SG11201807873PA SG11201807873PA SG11201807873PA SG 11201807873P A SG11201807873P A SG 11201807873PA SG 11201807873P A SG11201807873P A SG 11201807873PA SG 11201807873P A SG11201807873P A SG 11201807873PA SG 11201807873P A SG11201807873P A SG 11201807873PA
- Authority
- SG
- Singapore
- Prior art keywords
- adapters
- electrical equipment
- testing electrical
- testing
- equipment
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/005—Testing of electric installations on transport means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Charge And Discharge Circuits For Batteries Or The Like (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Remote Monitoring And Control Of Power-Distribution Networks (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201662312050P | 2016-03-23 | 2016-03-23 | |
PCT/US2017/020472 WO2017165099A1 (en) | 2016-03-23 | 2017-03-02 | Adapters for testing electrical equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201807873PA true SG11201807873PA (en) | 2018-10-30 |
Family
ID=59898750
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201807873PA SG11201807873PA (en) | 2016-03-23 | 2017-03-02 | Adapters for testing electrical equipment |
Country Status (6)
Country | Link |
---|---|
US (1) | US10520529B2 (en) |
EP (1) | EP3433626B1 (en) |
CN (1) | CN108885234B (en) |
HK (1) | HK1257027A1 (en) |
SG (1) | SG11201807873PA (en) |
WO (1) | WO2017165099A1 (en) |
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US10701075B2 (en) * | 2017-08-14 | 2020-06-30 | Honeywell International Inc. | Method and system for securely connecting to field devices in an industrial plant using Li-Fi and augmented reality |
US20200116755A1 (en) * | 2018-10-15 | 2020-04-16 | AIS Technology, Inc. | Test interface system and method of manufacture thereof |
SG11202105198XA (en) | 2018-11-21 | 2021-06-29 | Lam Res Corp | Wireless electronic-control system |
EP3758157A1 (en) * | 2019-06-27 | 2020-12-30 | Erbe Elektromedizin GmbH | Device with a service interface and method for maintaining the device |
CN114089086B (en) * | 2021-10-29 | 2024-05-14 | 深圳市康必达控制技术有限公司 | Communication manager testing equipment and testing method thereof |
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-
2017
- 2017-03-02 CN CN201780019221.5A patent/CN108885234B/en active Active
- 2017-03-02 WO PCT/US2017/020472 patent/WO2017165099A1/en active Application Filing
- 2017-03-02 EP EP17770808.8A patent/EP3433626B1/en active Active
- 2017-03-02 US US15/448,261 patent/US10520529B2/en active Active
- 2017-03-02 SG SG11201807873PA patent/SG11201807873PA/en unknown
-
2018
- 2018-12-17 HK HK18116151.1A patent/HK1257027A1/en unknown
Also Published As
Publication number | Publication date |
---|---|
CN108885234B (en) | 2021-05-28 |
WO2017165099A1 (en) | 2017-09-28 |
US20170276702A1 (en) | 2017-09-28 |
US10520529B2 (en) | 2019-12-31 |
HK1257027A1 (en) | 2019-10-11 |
CN108885234A (en) | 2018-11-23 |
EP3433626A1 (en) | 2019-01-30 |
EP3433626A4 (en) | 2020-01-01 |
EP3433626B1 (en) | 2023-05-03 |
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