SG11201501341WA - Testing of optical devices - Google Patents

Testing of optical devices

Info

Publication number
SG11201501341WA
SG11201501341WA SG11201501341WA SG11201501341WA SG11201501341WA SG 11201501341W A SG11201501341W A SG 11201501341WA SG 11201501341W A SG11201501341W A SG 11201501341WA SG 11201501341W A SG11201501341W A SG 11201501341WA SG 11201501341W A SG11201501341W A SG 11201501341WA
Authority
SG
Singapore
Prior art keywords
testing
optical devices
optical
devices
Prior art date
Application number
SG11201501341WA
Inventor
Hartmut Rudmann
Matthias Gloor
Original Assignee
Heptagon Micro Optics Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Heptagon Micro Optics Pte Ltd filed Critical Heptagon Micro Optics Pte Ltd
Publication of SG11201501341WA publication Critical patent/SG11201501341WA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/04—Systems determining the presence of a target
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/497—Means for monitoring or calibrating

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Electromagnetism (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
SG11201501341WA 2012-09-12 2013-08-26 Testing of optical devices SG11201501341WA (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261700189P 2012-09-12 2012-09-12
US201361768775P 2013-02-25 2013-02-25
PCT/SG2013/000371 WO2014042590A1 (en) 2012-09-12 2013-08-26 Testing of optical devices

Publications (1)

Publication Number Publication Date
SG11201501341WA true SG11201501341WA (en) 2015-04-29

Family

ID=50278537

Family Applications (2)

Application Number Title Priority Date Filing Date
SG11201501341WA SG11201501341WA (en) 2012-09-12 2013-08-26 Testing of optical devices
SG10201509875XA SG10201509875XA (en) 2012-09-12 2013-08-26 Testing of optical devices

Family Applications After (1)

Application Number Title Priority Date Filing Date
SG10201509875XA SG10201509875XA (en) 2012-09-12 2013-08-26 Testing of optical devices

Country Status (6)

Country Link
US (2) US8730480B2 (en)
EP (1) EP2729782B1 (en)
CN (1) CN103842790B (en)
SG (2) SG11201501341WA (en)
TW (1) TWI561801B (en)
WO (1) WO2014042590A1 (en)

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TWI708070B (en) * 2015-10-22 2020-10-21 新加坡商海特根微光學公司 Optical crosstalk calibration for ranging systems
WO2018133012A1 (en) * 2017-01-19 2018-07-26 深圳市汇顶科技股份有限公司 Test apparatus for biometric data detection module
CN106841118A (en) * 2017-01-24 2017-06-13 清华大学 Spectral measurement system and measuring method
US10236975B2 (en) 2017-02-10 2019-03-19 Intel Corporation Programmable photonic-electronic integrated circuit for optical testing
DE102017208709B3 (en) 2017-05-23 2018-10-25 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. A multi-aperture imaging apparatus and method for providing a multi-aperture imaging apparatus
CN107300458B (en) * 2017-07-18 2019-07-02 深圳市杰普特光电股份有限公司 Response characteristics to light rapid measurement device and method

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US6243508B1 (en) 1999-06-01 2001-06-05 Picolight Incorporated Electro-opto-mechanical assembly for coupling a light source or receiver to an optical waveguide
US6337871B1 (en) 1999-07-15 2002-01-08 University Of Maryland Baltimore County (Umbc) Multiple edge-emitting laser components located on a single wafer and the on-wafer testing of the same
US6608293B2 (en) 1999-12-17 2003-08-19 Agilent Technologies Inc. Method of and apparatus for testing a photosensor
US7078671B1 (en) 2001-08-06 2006-07-18 Shipley Company, L.L.C. Silicon optical microbench devices and wafer-level testing thereof
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EP1354664B1 (en) * 2002-04-20 2010-11-17 Haas Laser GmbH & Co. KG Installation for monitoring an optical element of a working head of a machine for thermal processing of a workpiece
US20040169520A1 (en) 2002-12-16 2004-09-02 Larikova Julia Y. Methods and apparatus for testing optical and electrical components
US20040150688A1 (en) * 2003-01-30 2004-08-05 Kin-Ming Kwan Measuring laser light transmissivity in a to-be-welded region of a work piece
EP1408343A1 (en) * 2003-02-14 2004-04-14 Siemens Aktiengesellschaft Window for a proximity detector, proximity detector, mobile terminal, and a method for detecting the presence of an object
US7184626B1 (en) 2003-04-07 2007-02-27 Luxtera, Inc Wafer-level testing of optical and optoelectronic chips
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Also Published As

Publication number Publication date
US20140204370A1 (en) 2014-07-24
CN103842790A (en) 2014-06-04
TWI561801B (en) 2016-12-11
EP2729782A1 (en) 2014-05-14
EP2729782B1 (en) 2019-07-10
WO2014042590A1 (en) 2014-03-20
EP2729782A4 (en) 2015-09-09
US20140070817A1 (en) 2014-03-13
TW201418689A (en) 2014-05-16
CN103842790B (en) 2016-12-07
US8730480B2 (en) 2014-05-20
SG10201509875XA (en) 2016-01-28
US9013687B2 (en) 2015-04-21

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