SG11201501097SA - Eddy current flaw detection probe and eddy current flaw inspection apparatus - Google Patents

Eddy current flaw detection probe and eddy current flaw inspection apparatus

Info

Publication number
SG11201501097SA
SG11201501097SA SG11201501097SA SG11201501097SA SG11201501097SA SG 11201501097S A SG11201501097S A SG 11201501097SA SG 11201501097S A SG11201501097S A SG 11201501097SA SG 11201501097S A SG11201501097S A SG 11201501097SA SG 11201501097S A SG11201501097S A SG 11201501097SA
Authority
SG
Singapore
Prior art keywords
eddy current
current flaw
inspection apparatus
detection probe
flaw detection
Prior art date
Application number
SG11201501097SA
Inventor
Hidehiko Suetsugu
Toyokazu Tada
Daigo Kosaka
Original Assignee
Sumitomo Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co filed Critical Sumitomo Chemical Co
Publication of SG11201501097SA publication Critical patent/SG11201501097SA/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9006Details, e.g. in the structure or functioning of sensors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013Arrangements for scanning
    • G01N27/902Arrangements for scanning by moving the sensors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
SG11201501097SA 2012-09-06 2013-09-05 Eddy current flaw detection probe and eddy current flaw inspection apparatus SG11201501097SA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2012196468A JP6200638B2 (en) 2012-09-06 2012-09-06 Eddy current testing probe and eddy current testing equipment
PCT/JP2013/074601 WO2014038721A1 (en) 2012-09-06 2013-09-05 Eddy current flaw detection probe and eddy current flaw inspection apparatus

Publications (1)

Publication Number Publication Date
SG11201501097SA true SG11201501097SA (en) 2015-04-29

Family

ID=50237323

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201501097SA SG11201501097SA (en) 2012-09-06 2013-09-05 Eddy current flaw detection probe and eddy current flaw inspection apparatus

Country Status (7)

Country Link
US (1) US9453818B2 (en)
EP (1) EP2893337B1 (en)
JP (1) JP6200638B2 (en)
KR (1) KR102055034B1 (en)
CN (1) CN104603612B (en)
SG (1) SG11201501097SA (en)
WO (1) WO2014038721A1 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6579840B2 (en) * 2015-07-16 2019-09-25 住友化学株式会社 Defect measurement method, defect measurement apparatus, and inspection probe
FI127475B (en) * 2015-10-30 2018-06-29 Fiskars Home Oy Ab A cooking vessel and manufacturing method
CN105914693B (en) * 2016-04-06 2018-02-16 杭州富阳科威钢业有限公司 CPVC power cable protecting pipes
USD830863S1 (en) * 2017-05-11 2018-10-16 Jentek Sensors, Inc. Portable test instrument
USD842725S1 (en) * 2017-05-12 2019-03-12 Jentek Sensors, Inc. Portable test instrument attachment
JP7048028B2 (en) * 2017-09-27 2022-04-05 日立造船株式会社 Eddy current flaw detection system and eddy current flaw detection method
BE1025588A9 (en) * 2018-06-01 2019-04-29 Centre De Recherches Metallurgiques Asbl Centrum Voor Res In De Metallurgie Vzw DEVICE FOR ONLINE MEASUREMENT OF THE PERCENTAGE OF AUSTENITY IN STEELS
JP7301506B2 (en) * 2018-08-06 2023-07-03 東芝エネルギーシステムズ株式会社 Eddy current flaw detector and eddy current flaw detection method
US11674927B2 (en) * 2020-01-28 2023-06-13 Tex Riken Co., Ltd. Eddy current flaw detection apparatus
JP7147801B2 (en) * 2020-03-13 2022-10-05 横河電機株式会社 Magnetic flaw detection method, magnetic field measurement processing device, and magnetic flaw detection device

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA984909A (en) 1973-10-15 1976-03-02 Valentino S. Cecco Eddy current probe for inspecting weakly magnetic materials
US3952314A (en) * 1974-11-25 1976-04-20 Xerox Corporation Electrolytic pen
US4806863A (en) * 1986-10-17 1989-02-21 Westinghouse Electric Corp. Eddy current apparatus including cylindrical coil with flux concentrator for high resolution detection of flaws in conductive objects
JPH0827260B2 (en) * 1986-11-14 1996-03-21 川崎重工業株式会社 Eddy current flaw detection method and eddy current flaw detection probe
JPH02130462A (en) * 1988-11-11 1990-05-18 Hitachi Ltd Eddy current test probe
JPH04273055A (en) * 1991-02-28 1992-09-29 Asahi Chem Ind Co Ltd Insertion type eddy current detector for magnetic pipe
US5446382A (en) * 1993-06-23 1995-08-29 The Babcock & Wilcox Company Eddy current probe having one yoke within another yoke for increased inspection depth, sensitivity and discrimination
JPH0720093A (en) * 1993-06-30 1995-01-24 Sumitomo Metal Ind Ltd Detector of electromagnetic characteristics and its sensitivity adjusting method
JP2000088810A (en) * 1998-09-16 2000-03-31 Tdk Corp Inductance element with screw core
JP2009175027A (en) * 2008-01-25 2009-08-06 Jfe Engineering Corp Magnetizing device, and pipe inspection device
JP5259511B2 (en) * 2008-07-09 2013-08-07 株式会社東芝 Remote field eddy current testing probe
JP5169983B2 (en) * 2009-05-08 2013-03-27 住友化学株式会社 Defect inspection method for magnetic tube.
EP2406623B1 (en) * 2009-03-11 2014-08-13 Sumitomo Chemical Company, Limited Eddy current flaw detection probe
GB2470054B (en) * 2009-05-07 2013-08-07 Pii Ltd Magnetising assembly
US9349520B2 (en) * 2010-11-09 2016-05-24 California Institute Of Technology Ferromagnetic cores of amorphous ferromagnetic metal alloys and electronic devices having the same

Also Published As

Publication number Publication date
JP6200638B2 (en) 2017-09-20
EP2893337A4 (en) 2016-03-09
WO2014038721A1 (en) 2014-03-13
US9453818B2 (en) 2016-09-27
KR20150048141A (en) 2015-05-06
EP2893337A1 (en) 2015-07-15
EP2893337B1 (en) 2017-08-16
CN104603612A (en) 2015-05-06
US20150323502A1 (en) 2015-11-12
JP2014052265A (en) 2014-03-20
CN104603612B (en) 2017-05-03
KR102055034B1 (en) 2019-12-11

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