SG10202001631YA - Sub-surface patterning for diffraction-based strain measurement and damage detection in structures - Google Patents

Sub-surface patterning for diffraction-based strain measurement and damage detection in structures

Info

Publication number
SG10202001631YA
SG10202001631YA SG10202001631YA SG10202001631YA SG10202001631YA SG 10202001631Y A SG10202001631Y A SG 10202001631YA SG 10202001631Y A SG10202001631Y A SG 10202001631YA SG 10202001631Y A SG10202001631Y A SG 10202001631YA SG 10202001631Y A SG10202001631Y A SG 10202001631YA
Authority
SG
Singapore
Prior art keywords
diffraction
sub
structures
strain measurement
damage detection
Prior art date
Application number
SG10202001631YA
Inventor
Gary E Georgeson
Kenneth H Griess
Russell L Keller
Original Assignee
Boeing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Boeing Co filed Critical Boeing Co
Publication of SG10202001631YA publication Critical patent/SG10202001631YA/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/16Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/167Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by projecting a pattern on the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/16Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/16Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/165Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by means of a grating deformed by the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M15/00Testing of engines
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
SG10202001631YA 2019-03-14 2020-02-25 Sub-surface patterning for diffraction-based strain measurement and damage detection in structures SG10202001631YA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US16/353,377 US10989523B2 (en) 2019-03-14 2019-03-14 Sub-surface patterning for diffraction-based strain measurement and damage detection in structures

Publications (1)

Publication Number Publication Date
SG10202001631YA true SG10202001631YA (en) 2020-10-29

Family

ID=69742982

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10202001631YA SG10202001631YA (en) 2019-03-14 2020-02-25 Sub-surface patterning for diffraction-based strain measurement and damage detection in structures

Country Status (8)

Country Link
US (1) US10989523B2 (en)
EP (1) EP3708946A1 (en)
JP (1) JP2020180964A (en)
KR (1) KR20200110617A (en)
AU (1) AU2020201053A1 (en)
BR (1) BR102020004833A2 (en)
CA (1) CA3072799A1 (en)
SG (1) SG10202001631YA (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102578830B1 (en) * 2019-06-26 2023-09-15 재팬 사이언스 앤드 테크놀로지 에이전시 Methods, devices and programs for displaying stress and strain distributions
US11243071B2 (en) 2020-02-03 2022-02-08 The Boeing Company Sub-surface patterning for diffraction-based strain measurement and damage detection in structures
US11709139B2 (en) * 2020-07-24 2023-07-25 New Jersey Institute Of Technology Systems and methods of detecting pipe defects
US11487011B1 (en) * 2020-10-07 2022-11-01 Lockheed Martin Corporation N-arm interferometric photonic integrated circuit based software defined optical aperture system
CN113466342B (en) * 2021-07-13 2022-05-06 西安交通大学 Interlayer damage imaging method for multilayer metal composite plate

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GB1536340A (en) * 1976-06-15 1978-12-20 Standard Telephones Cables Ltd Transducer
US5012090A (en) 1989-02-09 1991-04-30 Simmonds Precision Products, Inc. Optical grating sensor and method of monitoring having a multi-period grating
US5399854A (en) 1994-03-08 1995-03-21 United Technologies Corporation Embedded optical sensor capable of strain and temperature measurement using a single diffraction grating
US5430817A (en) 1994-03-31 1995-07-04 At&T Corp. Optical systems and devices using long period spectral shaping devices
US6321601B1 (en) 1996-08-06 2001-11-27 Brown University Research Foundation Optical method for the characterization of laterally-patterned samples in integrated circuits
US5760391A (en) 1996-07-17 1998-06-02 Mechanical Technology, Inc. Passive optical wavelength analyzer with a passive nonuniform optical grating
JP2003518703A (en) 1999-12-24 2003-06-10 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Optical scanning head
CA2322552A1 (en) 2000-09-26 2002-03-26 Jds Uniphase Inc. Scheme for measuring dispersion of chirped fbg and generating tunable narrow-band bandpass and notch filters using chirped fbg
GB0030289D0 (en) 2000-12-12 2001-01-24 Optoplan As Fibre optic sensor systems
AU2004219914B2 (en) 2003-03-05 2007-02-22 Shell Internationale Research Maatschappij B.V. Coiled optical fiber assembly for measuring pressure and/or other physical data
JP2012503207A (en) 2008-09-23 2012-02-02 フォイト パテント ゲゼルシャフト ミット ベシュレンクテル ハフツング Industrial roll with optical roll cover sensor system
US8581736B2 (en) 2010-06-24 2013-11-12 The Boeing Company Assessing structural repair integrity
US8853805B2 (en) 2011-06-27 2014-10-07 Texas Instruments Incorporated Strain measurement test module
US10390705B2 (en) 2013-10-30 2019-08-27 National Chiao Tung University Portable noninvasive inspection device
US9970833B2 (en) 2014-04-23 2018-05-15 The Boeing Company Witness material and method for monitoring the environmental history of an object
US10502719B2 (en) 2015-08-21 2019-12-10 The Boeing Company Analysis of a structure modeled with inconsistencies mapped thereon
US9816941B2 (en) 2016-03-28 2017-11-14 Saudi Arabian Oil Company Systems and methods for constructing and testing composite photonic structures
US10539473B2 (en) 2016-08-08 2020-01-21 The Boeing Company Systems for monitoring the environmental history of a component

Also Published As

Publication number Publication date
US20200292302A1 (en) 2020-09-17
CN111692983A (en) 2020-09-22
BR102020004833A2 (en) 2020-11-03
US10989523B2 (en) 2021-04-27
KR20200110617A (en) 2020-09-24
JP2020180964A (en) 2020-11-05
AU2020201053A1 (en) 2020-10-01
CA3072799A1 (en) 2020-09-14
EP3708946A1 (en) 2020-09-16

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