SG10201912731QA - Determining critical parameters using a high-dimensional variable selection model - Google Patents
Determining critical parameters using a high-dimensional variable selection modelInfo
- Publication number
- SG10201912731QA SG10201912731QA SG10201912731QA SG10201912731QA SG10201912731QA SG 10201912731Q A SG10201912731Q A SG 10201912731QA SG 10201912731Q A SG10201912731Q A SG 10201912731QA SG 10201912731Q A SG10201912731Q A SG 10201912731QA SG 10201912731Q A SG10201912731Q A SG 10201912731QA
- Authority
- SG
- Singapore
- Prior art keywords
- selection model
- critical parameters
- variable selection
- dimensional variable
- determining critical
- Prior art date
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
- G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM] characterised by quality surveillance of production
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N7/00—Computing arrangements based on specific mathematical models
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/80—Management or planning
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201462087187P | 2014-12-03 | 2014-12-03 | |
US201562183101P | 2015-06-22 | 2015-06-22 | |
US14/955,752 US10361105B2 (en) | 2014-12-03 | 2015-12-01 | Determining critical parameters using a high-dimensional variable selection model |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201912731QA true SG10201912731QA (en) | 2020-02-27 |
Family
ID=56092399
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201704383QA SG11201704383QA (en) | 2014-12-03 | 2015-12-02 | Determining critical parameters using a high-dimensional variable selection model |
SG10201912731QA SG10201912731QA (en) | 2014-12-03 | 2015-12-02 | Determining critical parameters using a high-dimensional variable selection model |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201704383QA SG11201704383QA (en) | 2014-12-03 | 2015-12-02 | Determining critical parameters using a high-dimensional variable selection model |
Country Status (7)
Country | Link |
---|---|
US (2) | US10361105B2 (en) |
JP (2) | JP6641372B2 (en) |
KR (1) | KR20170093878A (en) |
CN (1) | CN107408522B (en) |
IL (2) | IL280008B (en) |
SG (2) | SG11201704383QA (en) |
WO (1) | WO2016090013A1 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10438699B2 (en) * | 2016-05-10 | 2019-10-08 | Macau University Of Science And Technology | Method and system for determining an association of biological features with a medical condition |
TWI662424B (en) * | 2017-12-25 | 2019-06-11 | 帆宣系統科技股份有限公司 | Selection method of leading auxiliary parameters and method for pre-diagnosis of equipment maintenance by combining key parameters and leading auxiliary parameters |
CN109901058B (en) * | 2019-03-29 | 2021-04-02 | 上海华力集成电路制造有限公司 | Analysis method of semiconductor device |
JP2020181959A (en) * | 2019-04-26 | 2020-11-05 | 東京エレクトロン株式会社 | Learning method, management device and management program |
CN110377941B (en) * | 2019-06-10 | 2020-04-24 | 中国人民解放军军事科学院国防科技创新研究院 | Method for establishing penalty blind likelihood kriging proxy model of satellite temperature field |
KR102404982B1 (en) | 2020-04-28 | 2022-06-02 | 이진행 | Device and method for variable selection using elastic net regression |
KR20220039118A (en) | 2020-09-21 | 2022-03-29 | 이진행 | Device and method for variable selection using weighted information value |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06168863A (en) | 1991-03-01 | 1994-06-14 | Texas Instr Inc <Ti> | Apparatus and method for execution of monitoring and control of semiconductor manufacturing apparatus |
US6519498B1 (en) | 2000-03-10 | 2003-02-11 | Applied Materials, Inc. | Method and apparatus for managing scheduling in a multiple cluster tool |
WO2006046650A1 (en) | 2004-10-29 | 2006-05-04 | Jsr Corporation | Probe member for wafer inspection, probe card for wafer inspection and wafer inspection equipment |
JP4741936B2 (en) * | 2004-11-19 | 2011-08-10 | 株式会社日立ハイテクノロジーズ | Data processing apparatus, inspection work support system, and data processing method |
US7454312B2 (en) | 2006-03-15 | 2008-11-18 | Applied Materials, Inc. | Tool health information monitoring and tool performance analysis in semiconductor processing |
US7716023B2 (en) | 2007-02-13 | 2010-05-11 | Oracle America, Inc. | Multidimensional process corner derivation using surrogate based simultaneous yield analysis |
US7372583B1 (en) | 2007-04-12 | 2008-05-13 | Tokyo Electron Limited | Controlling a fabrication tool using support vector machine |
US8285414B2 (en) | 2009-03-31 | 2012-10-09 | International Business Machines Corporation | Method and system for evaluating a machine tool operating characteristics |
US8255346B2 (en) | 2009-11-11 | 2012-08-28 | International Business Machines Corporation | Methods and systems for variable group selection and temporal causal modeling |
US8346688B2 (en) | 2009-11-25 | 2013-01-01 | International Business Machines Corporation | Predicting states of subjects |
US8723869B2 (en) * | 2011-03-21 | 2014-05-13 | Tokyo Electron Limited | Biologically based chamber matching |
US8868371B2 (en) * | 2011-09-09 | 2014-10-21 | Infineon Technologies Ag | Method and device for determining test sets of operating parameter values for an electronic component |
US10096478B2 (en) * | 2012-04-12 | 2018-10-09 | Kla-Tencor Corporation | System and method for rejuvenating an imaging sensor degraded by exposure to extreme ultraviolet or deep ultraviolet light |
US9746849B2 (en) | 2012-11-09 | 2017-08-29 | Tokyo Electron Limited | Method and apparatus for autonomous tool parameter impact identification system for semiconductor manufacturing |
TWI549007B (en) * | 2013-02-07 | 2016-09-11 | 先知科技股份有限公司 | Method for searching and analyzing process parameters and computer program product thereof |
WO2014172750A1 (en) * | 2013-04-26 | 2014-10-30 | Minelab Electronics Pty Limited | Discrimination method of a metal detector |
CN103488135B (en) | 2013-08-14 | 2015-11-04 | 沈阳中科博微自动化技术有限公司 | A kind of statistical process control method for semiconductor production machining process monitoring |
-
2015
- 2015-12-01 US US14/955,752 patent/US10361105B2/en active Active
- 2015-12-02 WO PCT/US2015/063463 patent/WO2016090013A1/en active Application Filing
- 2015-12-02 IL IL280008A patent/IL280008B/en unknown
- 2015-12-02 JP JP2017529680A patent/JP6641372B2/en active Active
- 2015-12-02 SG SG11201704383QA patent/SG11201704383QA/en unknown
- 2015-12-02 CN CN201580065268.6A patent/CN107408522B/en active Active
- 2015-12-02 SG SG10201912731QA patent/SG10201912731QA/en unknown
- 2015-12-02 KR KR1020177018327A patent/KR20170093878A/en unknown
-
2017
- 2017-05-07 IL IL252146A patent/IL252146B/en active IP Right Grant
-
2019
- 2019-06-23 US US16/449,400 patent/US11456194B2/en active Active
- 2019-12-27 JP JP2019237842A patent/JP6893549B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
KR20170093878A (en) | 2017-08-16 |
CN107408522B (en) | 2020-12-29 |
IL280008B (en) | 2022-09-01 |
JP6641372B2 (en) | 2020-02-05 |
IL252146B (en) | 2021-01-31 |
IL280008A (en) | 2021-03-01 |
WO2016090013A1 (en) | 2016-06-09 |
JP2020061575A (en) | 2020-04-16 |
JP2018504772A (en) | 2018-02-15 |
US20160163574A1 (en) | 2016-06-09 |
CN107408522A (en) | 2017-11-28 |
US10361105B2 (en) | 2019-07-23 |
IL252146A0 (en) | 2017-07-31 |
US20190311928A1 (en) | 2019-10-10 |
JP6893549B2 (en) | 2021-06-23 |
US11456194B2 (en) | 2022-09-27 |
SG11201704383QA (en) | 2017-06-29 |
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