SG10201900011WA - Neuromorphic circuit having 3d stacked structure and semiconductor device having the same - Google Patents
Neuromorphic circuit having 3d stacked structure and semiconductor device having the sameInfo
- Publication number
- SG10201900011WA SG10201900011WA SG10201900011WA SG10201900011WA SG 10201900011W A SG10201900011W A SG 10201900011WA SG 10201900011W A SG10201900011W A SG 10201900011WA SG 10201900011W A SG10201900011W A SG 10201900011WA
- Authority
- SG
- Singapore
- Prior art keywords
- semiconductor layer
- synaptic
- semiconductor device
- neuromorphic circuit
- same
- Prior art date
Links
Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F15/00—Digital computers in general; Data processing equipment in general
- G06F15/16—Combinations of two or more digital computers each having at least an arithmetic unit, a program unit and a register, e.g. for a simultaneous processing of several programs
- G06F15/163—Interprocessor communication
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/04—Architecture, e.g. interconnection topology
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N3/00—Computing arrangements based on biological models
- G06N3/02—Neural networks
- G06N3/06—Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons
- G06N3/063—Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons using electronic means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/481—Internal lead connections, e.g. via connections, feedthrough structures
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49822—Multilayer substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49827—Via connections through the substrates, e.g. pins going through the substrate, coaxial cables
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/535—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including internal interconnections, e.g. cross-under constructions
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L25/0657—Stacked arrangements of devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0688—Integrated circuits having a three-dimensional layout
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B63/00—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
- H10B63/80—Arrangements comprising multiple bistable or multi-stable switching components of the same type on a plane parallel to the substrate, e.g. cross-point arrays
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2225/00—Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
- H01L2225/03—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
- H01L2225/04—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers
- H01L2225/065—All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L2225/06503—Stacked arrangements of devices
- H01L2225/06541—Conductive via connections through the device, e.g. vertical interconnects, through silicon via [TSV]
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Biomedical Technology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biophysics (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Software Systems (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Artificial Intelligence (AREA)
- Evolutionary Computation (AREA)
- General Health & Medical Sciences (AREA)
- Molecular Biology (AREA)
- Computing Systems (AREA)
- Data Mining & Analysis (AREA)
- Mathematical Physics (AREA)
- Computational Linguistics (AREA)
- Neurology (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Provided are a neuromorphic circuit having a three-dimensional stack structure and a semiconductor device including the neuromorphic circuit. The semiconductor device includes a first semiconductor layer including one or more synaptic cores, each synaptic core including neural circuits arranged to perform neuromorphic computation. A second semiconductor layer is stacked on the first semiconductor layer and includes an interconnect forming a physical transfer path between synaptic cores. A third semiconductor layer is stacked on the second semiconductor layer and includes one or more synaptic cores. At least one through electrode is formed, through which information is transferred between the first through third semiconductor layers. Information from a first synaptic core in the first semiconductor layer is transferred to a second synaptic core in the third semiconductor layer via the one of more through electrodes and an interconnect of the second semiconductor layer. FIG. 1
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020180044534A KR102589968B1 (en) | 2018-04-17 | 2018-04-17 | Neuromorphic circuit having 3D stacked structure and Semiconductor device having the same |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201900011WA true SG10201900011WA (en) | 2019-11-28 |
Family
ID=64744475
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201900011W SG10201900011WA (en) | 2018-04-17 | 2019-01-02 | Neuromorphic circuit having 3d stacked structure and semiconductor device having the same |
Country Status (5)
Country | Link |
---|---|
US (1) | US11410026B2 (en) |
EP (1) | EP3557488A1 (en) |
KR (1) | KR102589968B1 (en) |
CN (1) | CN110390388A (en) |
SG (1) | SG10201900011WA (en) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102607860B1 (en) * | 2018-05-16 | 2023-11-29 | 삼성전자주식회사 | Neuromorphic apparatus having 3d stacked synaptic structure and memory apparatus having the same |
US11604971B2 (en) * | 2018-05-16 | 2023-03-14 | Samsung Electronics Co., Ltd. | Neuromorphic apparatus having 3D stacked synaptic structure and memory device having the same |
EP3928319A4 (en) | 2019-02-22 | 2022-11-30 | Micron Technology, Inc. | Memory device interface and method |
WO2021133826A1 (en) * | 2019-12-27 | 2021-07-01 | Micron Technology, Inc. | Neuromorphic memory device and method |
US11635910B2 (en) | 2019-12-30 | 2023-04-25 | Micron Technology, Inc. | Memory device interface and method |
CN114902332A (en) | 2019-12-31 | 2022-08-12 | 美光科技公司 | Memory module multiport buffering technique |
US11887647B2 (en) | 2020-04-09 | 2024-01-30 | Micron Technology, Inc. | Deep learning accelerator and random access memory with separate memory access connections |
US11874897B2 (en) | 2020-04-09 | 2024-01-16 | Micron Technology, Inc. | Integrated circuit device with deep learning accelerator and random access memory |
US11355175B2 (en) | 2020-04-09 | 2022-06-07 | Micron Technology, Inc. | Deep learning accelerator and random access memory with a camera interface |
WO2021205941A1 (en) * | 2020-04-09 | 2021-10-14 | 国立研究開発法人科学技術振興機構 | Three-dimensional array device |
US11461651B2 (en) * | 2020-04-09 | 2022-10-04 | Micron Technology, Inc. | System on a chip with deep learning accelerator and random access memory |
US11397885B2 (en) | 2020-04-29 | 2022-07-26 | Sandisk Technologies Llc | Vertical mapping and computing for deep neural networks in non-volatile memory |
US20240038726A1 (en) * | 2021-02-10 | 2024-02-01 | Panasonic Intellectual Property Management Co., Ltd. | Ai module |
KR102507461B1 (en) * | 2021-02-16 | 2023-03-07 | 고려대학교 산학협력단 | In-memory accelerator for layer-wise quantized neural networks and operation method thereof |
KR102554519B1 (en) * | 2021-06-24 | 2023-07-12 | 한양대학교 산학협력단 | 3d neuromorphic system and operating method thereof |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2009075694A1 (en) * | 2007-12-05 | 2009-06-18 | Hewlett-Packard Development Company, L.P. | Hybrid microscale-nanoscale neuromorphic integrated circuit |
US8510244B2 (en) | 2009-03-20 | 2013-08-13 | ISC8 Inc. | Apparatus comprising artificial neuronal assembly |
FR2968808A1 (en) | 2010-12-08 | 2012-06-15 | Commissariat Energie Atomique | ELECTRONIC CIRCUIT WITH NEUROMORPHIC ARCHITECTURE |
FR2978271B1 (en) | 2011-07-21 | 2014-03-14 | Commissariat Energie Atomique | DEVICE AND METHOD FOR PROCESSING DATA |
US9000577B2 (en) | 2011-09-30 | 2015-04-07 | Intel Corporation | Interlayer communications for 3D integrated circuit stack |
CN103946981B (en) | 2011-12-02 | 2016-11-09 | 英特尔公司 | There is the stacked storage of the interface providing skew interconnection |
US8996430B2 (en) | 2012-01-27 | 2015-03-31 | International Business Machines Corporation | Hierarchical scalable neuromorphic synaptronic system for synaptic and structural plasticity |
US8977578B1 (en) | 2012-06-27 | 2015-03-10 | Hrl Laboratories, Llc | Synaptic time multiplexing neuromorphic network that forms subsets of connections during different time slots |
US9501739B2 (en) | 2013-10-31 | 2016-11-22 | Kabushiki Kaisha Toshiba | Neuron learning type integrated circuit device using a plurality of synapses, a soma, transistors, a zener diode, and condensers |
US10832127B2 (en) * | 2015-11-30 | 2020-11-10 | Samsung Electronics Co., Ltd. | Three-dimensional integration of neurosynaptic chips |
US10482372B2 (en) | 2015-12-23 | 2019-11-19 | Intel Corporation | Interconnection scheme for reconfigurable neuromorphic hardware |
US10199472B2 (en) * | 2015-12-30 | 2019-02-05 | SK Hynix Inc. | Neuromorphic device including gating lines with different widths |
CN105789139B (en) | 2016-03-31 | 2018-08-28 | 上海新储集成电路有限公司 | A kind of preparation method of neural network chip |
US10423877B2 (en) * | 2016-08-15 | 2019-09-24 | International Business Machines Corporation | High memory bandwidth neuromorphic computing system |
-
2018
- 2018-04-17 KR KR1020180044534A patent/KR102589968B1/en active IP Right Grant
- 2018-11-15 US US16/191,906 patent/US11410026B2/en active Active
- 2018-11-23 CN CN201811405971.9A patent/CN110390388A/en active Pending
- 2018-12-17 EP EP18213128.4A patent/EP3557488A1/en active Pending
-
2019
- 2019-01-02 SG SG10201900011W patent/SG10201900011WA/en unknown
Also Published As
Publication number | Publication date |
---|---|
CN110390388A (en) | 2019-10-29 |
US11410026B2 (en) | 2022-08-09 |
KR102589968B1 (en) | 2023-10-16 |
KR20190121048A (en) | 2019-10-25 |
EP3557488A1 (en) | 2019-10-23 |
US20190318230A1 (en) | 2019-10-17 |
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