SG10201600659UA - Barrier seal for electrostatic chuck - Google Patents

Barrier seal for electrostatic chuck

Info

Publication number
SG10201600659UA
SG10201600659UA SG10201600659UA SG10201600659UA SG10201600659UA SG 10201600659U A SG10201600659U A SG 10201600659UA SG 10201600659U A SG10201600659U A SG 10201600659UA SG 10201600659U A SG10201600659U A SG 10201600659UA SG 10201600659U A SG10201600659U A SG 10201600659UA
Authority
SG
Singapore
Prior art keywords
electrostatic chuck
barrier seal
barrier
seal
chuck
Prior art date
Application number
SG10201600659UA
Inventor
Chang Yo-Yu
Huang Chun-Yao
Original Assignee
Mfc Sealing Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mfc Sealing Technology Co Ltd filed Critical Mfc Sealing Technology Co Ltd
Publication of SG10201600659UA publication Critical patent/SG10201600659UA/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6831Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
    • H01L21/6833Details of electrostatic chucks
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16JPISTONS; CYLINDERS; SEALINGS
    • F16J15/00Sealings
    • F16J15/02Sealings between relatively-stationary surfaces
    • F16J15/06Sealings between relatively-stationary surfaces with solid packing compressed between sealing surfaces
    • F16J15/10Sealings between relatively-stationary surfaces with solid packing compressed between sealing surfaces with non-metallic packing
    • F16J15/104Sealings between relatively-stationary surfaces with solid packing compressed between sealing surfaces with non-metallic packing characterised by structure
    • F16J15/106Sealings between relatively-stationary surfaces with solid packing compressed between sealing surfaces with non-metallic packing characterised by structure homogeneous
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/20Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32458Vessel
    • H01J37/32513Sealing means, e.g. sealing between different parts of the vessel
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32697Electrostatic control
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32715Workpiece holder
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32798Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
    • H01J37/3288Maintenance
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Plasma & Fusion (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Mechanical Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Drying Of Semiconductors (AREA)
SG10201600659UA 2015-02-16 2016-01-27 Barrier seal for electrostatic chuck SG10201600659UA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW104105259A TWI613753B (en) 2015-02-16 2015-02-16 Improved seal for electrostatically adsorbing the side wall of the retainer

Publications (1)

Publication Number Publication Date
SG10201600659UA true SG10201600659UA (en) 2016-09-29

Family

ID=56551818

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201600659UA SG10201600659UA (en) 2015-02-16 2016-01-27 Barrier seal for electrostatic chuck

Country Status (8)

Country Link
US (1) US10529611B2 (en)
JP (1) JP6195636B2 (en)
KR (1) KR101854973B1 (en)
CN (1) CN105895570B (en)
DE (2) DE102016101751A1 (en)
FR (1) FR3032768B1 (en)
SG (1) SG10201600659UA (en)
TW (1) TWI613753B (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20170047238A1 (en) * 2015-08-10 2017-02-16 Lam Research Corporation Annular edge seal with convex inner surface for electrostatic chuck
JP6800689B2 (en) * 2016-10-07 2020-12-16 株式会社ディスコ Chuck table mechanism
US10943808B2 (en) * 2016-11-25 2021-03-09 Applied Materials, Inc. Ceramic electrostatic chuck having a V-shape seal band
CN107195578B (en) * 2017-07-17 2019-11-29 北京北方华创微电子装备有限公司 Electrostatic chuck
TWM566398U (en) * 2018-06-21 2018-09-01 麥豐密封科技股份有限公司 Semiconductor process equipment
JP2019140225A (en) 2018-02-09 2019-08-22 株式会社東芝 Etching method, method for manufacturing semiconductor chips, and method for manufacturing articles
CN109194001A (en) * 2018-09-30 2019-01-11 珠海凯邦电机制造有限公司 Sealing ring and motor and compressor
JP7445386B2 (en) * 2019-02-19 2024-03-07 日本特殊陶業株式会社 Substrate holding member and substrate holding mechanism
JP7332400B2 (en) * 2019-09-09 2023-08-23 日本特殊陶業株式会社 holding device
KR102344265B1 (en) * 2019-12-11 2021-12-27 세메스 주식회사 Component for protecting bonding layer and system for treating substrate with the component
JP7445420B2 (en) 2019-12-23 2024-03-07 日本特殊陶業株式会社 Parts for semiconductor manufacturing equipment
JP7308767B2 (en) * 2020-01-08 2023-07-14 東京エレクトロン株式会社 Mounting table and plasma processing device
WO2024097077A1 (en) * 2022-11-04 2024-05-10 Lam Research Corporation Electrostatic chuck e-seal with offset sealing surface
CN117108742B (en) * 2023-10-23 2024-01-26 东芯(苏州)科技有限公司 Disc ring set for electric sucking disc and installation device and method thereof

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2984164B2 (en) * 1993-03-26 1999-11-29 日本碍子株式会社 Susceptor for semiconductor manufacturing
US5636098A (en) 1994-01-06 1997-06-03 Applied Materials, Inc. Barrier seal for electrostatic chuck
US5524905A (en) * 1994-09-28 1996-06-11 Greene, Tweed Of Delaware, Inc. Sealing assembly with T-shaped seal ring and anti-extrusion rings
US5805408A (en) * 1995-12-22 1998-09-08 Lam Research Corporation Electrostatic clamp with lip seal for clamping substrates
JP4451098B2 (en) 2002-08-22 2010-04-14 住友大阪セメント株式会社 Susceptor device
US20050042881A1 (en) 2003-05-12 2005-02-24 Tokyo Electron Limited Processing apparatus
JP4458995B2 (en) * 2004-09-10 2010-04-28 京セラ株式会社 Wafer support member
US8440049B2 (en) * 2006-05-03 2013-05-14 Applied Materials, Inc. Apparatus for etching high aspect ratio features
US20070283884A1 (en) * 2006-05-30 2007-12-13 Applied Materials, Inc. Ring assembly for substrate processing chamber
US7589950B2 (en) * 2006-10-13 2009-09-15 Applied Materials, Inc. Detachable electrostatic chuck having sealing assembly
JP5201527B2 (en) * 2008-03-28 2013-06-05 東京エレクトロン株式会社 Electrostatic chuck and manufacturing method thereof
US9543181B2 (en) * 2008-07-30 2017-01-10 Taiwan Semiconductor Manufacturing Company, Ltd. Replaceable electrostatic chuck sidewall shield
JP5743895B2 (en) * 2008-10-31 2015-07-01 ラム リサーチ コーポレーションLam Research Corporation Lower electrode assembly in plasma processing chamber
TWI503920B (en) * 2009-03-19 2015-10-11 Taiwan Semiconductor Mfg Co Ltd Process equipment and o-ring thereof
CN201802870U (en) * 2010-06-03 2011-04-20 厦门麦丰密封件有限公司 Novel flashless Y-shaped/U-shaped seal ring
WO2011155479A1 (en) * 2010-06-11 2011-12-15 株式会社 アルバック Etching apparatus
US9869392B2 (en) 2011-10-20 2018-01-16 Lam Research Corporation Edge seal for lower electrode assembly
US9859142B2 (en) * 2011-10-20 2018-01-02 Lam Research Corporation Edge seal for lower electrode assembly
CN202402695U (en) * 2011-12-31 2012-08-29 厦门麦丰密封件有限公司 Sealing ring
US8677586B2 (en) * 2012-04-04 2014-03-25 Lam Research Corporation Installation fixture for elastomer bands and methods of using the same
JP2013258270A (en) * 2012-06-12 2013-12-26 Tokyo Electron Ltd Substrate mounting table and substrate processing apparatus
CN202851965U (en) * 2012-09-14 2013-04-03 上海麦特密封件有限公司 Novel sealing ring
JP6017328B2 (en) * 2013-01-22 2016-10-26 東京エレクトロン株式会社 Mounting table and plasma processing apparatus
JP5798140B2 (en) * 2013-02-15 2015-10-21 株式会社東芝 Plasma processing equipment
US10804081B2 (en) * 2013-12-20 2020-10-13 Lam Research Corporation Edge ring dimensioned to extend lifetime of elastomer seal in a plasma processing chamber
US10515786B2 (en) * 2015-09-25 2019-12-24 Tokyo Electron Limited Mounting table and plasma processing apparatus

Also Published As

Publication number Publication date
JP2016152414A (en) 2016-08-22
FR3032768B1 (en) 2018-09-07
CN105895570B (en) 2018-11-02
KR101854973B1 (en) 2018-05-04
DE202016008428U1 (en) 2017-12-04
JP6195636B2 (en) 2017-09-13
US20160240421A1 (en) 2016-08-18
CN105895570A (en) 2016-08-24
US10529611B2 (en) 2020-01-07
TWI613753B (en) 2018-02-01
TW201631695A (en) 2016-09-01
KR20160100841A (en) 2016-08-24
FR3032768A1 (en) 2016-08-19
DE102016101751A1 (en) 2016-08-18

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