SG10201500144PA - Contact tip and contact element and method of producing the same - Google Patents
Contact tip and contact element and method of producing the sameInfo
- Publication number
- SG10201500144PA SG10201500144PA SG10201500144PA SG10201500144PA SG10201500144PA SG 10201500144P A SG10201500144P A SG 10201500144PA SG 10201500144P A SG10201500144P A SG 10201500144PA SG 10201500144P A SG10201500144P A SG 10201500144PA SG 10201500144P A SG10201500144P A SG 10201500144PA
- Authority
- SG
- Singapore
- Prior art keywords
- contact
- producing
- same
- contact element
- tip
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06755—Material aspects
- G01R1/06761—Material aspects related to layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
- H01R43/16—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for manufacturing contact members, e.g. by punching and by bending
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T83/00—Cutting
- Y10T83/04—Processes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Measuring Leads Or Probes (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP14150596.6A EP2894483B1 (en) | 2014-01-09 | 2014-01-09 | Contact tip and contact element and method of producing the same |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201500144PA true SG10201500144PA (en) | 2015-08-28 |
Family
ID=49958254
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201500144PA SG10201500144PA (en) | 2014-01-09 | 2015-01-08 | Contact tip and contact element and method of producing the same |
Country Status (4)
Country | Link |
---|---|
US (1) | US10156588B2 (en) |
EP (1) | EP2894483B1 (en) |
MY (1) | MY180230A (en) |
SG (1) | SG10201500144PA (en) |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3882597A (en) * | 1971-12-17 | 1975-05-13 | Western Electric Co | Method for making a test probe for semiconductor devices |
JP2002131334A (en) * | 2000-10-24 | 2002-05-09 | Nec Yamaguchi Ltd | Probe needle, probe card, and manufacturing method of probe card |
US6998857B2 (en) * | 2001-09-20 | 2006-02-14 | Yamaha Corporation | Probe unit and its manufacture |
JP4723195B2 (en) * | 2004-03-05 | 2011-07-13 | 株式会社オクテック | Probe manufacturing method |
US7759949B2 (en) * | 2004-05-21 | 2010-07-20 | Microprobe, Inc. | Probes with self-cleaning blunt skates for contacting conductive pads |
TW200815763A (en) | 2006-09-26 | 2008-04-01 | Nihon Micronics Kabushiki Kaisha | Electrical test probe and electrical test probe assembly |
JP5798315B2 (en) * | 2010-11-19 | 2015-10-21 | 株式会社神戸製鋼所 | Contact probe pin |
-
2014
- 2014-01-09 EP EP14150596.6A patent/EP2894483B1/en active Active
- 2014-12-30 MY MYPI2014003639A patent/MY180230A/en unknown
-
2015
- 2015-01-08 SG SG10201500144PA patent/SG10201500144PA/en unknown
- 2015-01-09 US US14/593,958 patent/US10156588B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US10156588B2 (en) | 2018-12-18 |
EP2894483B1 (en) | 2018-06-27 |
US20150192612A1 (en) | 2015-07-09 |
EP2894483A1 (en) | 2015-07-15 |
MY180230A (en) | 2020-11-25 |
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