SG10201401046UA - Real-time multi-point diffraction-based imaging system for strain measurement - Google Patents

Real-time multi-point diffraction-based imaging system for strain measurement

Info

Publication number
SG10201401046UA
SG10201401046UA SG10201401046UA SG10201401046UA SG10201401046UA SG 10201401046U A SG10201401046U A SG 10201401046UA SG 10201401046U A SG10201401046U A SG 10201401046UA SG 10201401046U A SG10201401046U A SG 10201401046UA SG 10201401046U A SG10201401046U A SG 10201401046UA
Authority
SG
Singapore
Prior art keywords
real
imaging system
strain measurement
based imaging
time multi
Prior art date
Application number
SG10201401046UA
Inventor
Tiong Keng Oh
Wing Onn Koh
Hui Zhu
Original Assignee
Nanyang Polytechnic
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nanyang Polytechnic filed Critical Nanyang Polytechnic
Priority to SG10201401046UA priority Critical patent/SG10201401046UA/en
Priority to US14/670,602 priority patent/US9441955B2/en
Publication of SG10201401046UA publication Critical patent/SG10201401046UA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
SG10201401046UA 2014-03-27 2014-03-27 Real-time multi-point diffraction-based imaging system for strain measurement SG10201401046UA (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
SG10201401046UA SG10201401046UA (en) 2014-03-27 2014-03-27 Real-time multi-point diffraction-based imaging system for strain measurement
US14/670,602 US9441955B2 (en) 2014-03-27 2015-03-27 Real-time multi-point diffraction-based imaging system for strain measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG10201401046UA SG10201401046UA (en) 2014-03-27 2014-03-27 Real-time multi-point diffraction-based imaging system for strain measurement

Publications (1)

Publication Number Publication Date
SG10201401046UA true SG10201401046UA (en) 2015-10-29

Family

ID=54189848

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201401046UA SG10201401046UA (en) 2014-03-27 2014-03-27 Real-time multi-point diffraction-based imaging system for strain measurement

Country Status (2)

Country Link
US (1) US9441955B2 (en)
SG (1) SG10201401046UA (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10281378B2 (en) * 2016-05-05 2019-05-07 Honeywell Federal Manufacturing & Technologies, Llc System and method for testing true stress and true strain
CN108680288A (en) * 2018-03-27 2018-10-19 天津大学 A method of utilizing the mechanical response of organic mechanoluminescence material tests mechanical part
CN115096201B (en) * 2022-08-24 2022-11-22 中科航迈数控软件(深圳)有限公司 Non-contact deformation detection method and related equipment

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4969106A (en) 1989-02-27 1990-11-06 Camsys, Inc. Computerized method of determining surface strain distributions in a deformed body
US5233174A (en) 1992-03-11 1993-08-03 Hughes Danbury Optical Systems, Inc. Wavefront sensor having a lenslet array as a null corrector
US6097477A (en) 1994-05-27 2000-08-01 American Research Corporation Of Virginia Laser speckle strain and deformation sensor using linear array image cross-correlation method for specifically arranged triple-beam triple-camera configuration
US6943869B2 (en) 2002-10-04 2005-09-13 Resesarch Foundation, Inc. Method and apparatus for measuring strain using a luminescent photoelastic coating
US7477362B2 (en) * 2005-09-27 2009-01-13 Nanyang Technological University Moiré interferometric strain sensor
US7755752B1 (en) * 2008-04-07 2010-07-13 Kla-Tencor Corporation Combined modulated optical reflectance and photoreflectance system
US8191433B2 (en) 2008-05-19 2012-06-05 The Hong Kong Polytechnic University Method for manufacturing fabric strain sensors
KR101999988B1 (en) 2012-03-08 2019-07-15 앱파이브 엘엘씨 System and process for measuring strain in materials at high spatial resolution

Also Published As

Publication number Publication date
US9441955B2 (en) 2016-09-13
US20150276386A1 (en) 2015-10-01

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