SG10201400672TA - Semiconductor devices having through-contacts and related fabrication methods - Google Patents

Semiconductor devices having through-contacts and related fabrication methods

Info

Publication number
SG10201400672TA
SG10201400672TA SG10201400672TA SG10201400672TA SG10201400672TA SG 10201400672T A SG10201400672T A SG 10201400672TA SG 10201400672T A SG10201400672T A SG 10201400672TA SG 10201400672T A SG10201400672T A SG 10201400672TA SG 10201400672T A SG10201400672T A SG 10201400672TA
Authority
SG
Singapore
Prior art keywords
contacts
semiconductor devices
fabrication methods
related fabrication
methods
Prior art date
Application number
SG10201400672TA
Inventor
Richter Ralf
Heinrich Jens
Schuehrer Holger
Original Assignee
Globalfoundries Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Globalfoundries Inc filed Critical Globalfoundries Inc
Publication of SG10201400672TA publication Critical patent/SG10201400672TA/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/285Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
    • H01L21/28506Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
    • H01L21/28512Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/482Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body
    • H01L23/485Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body consisting of layered constructions comprising conductive layers and insulating layers, e.g. planar contacts
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76801Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
    • H01L21/76802Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76801Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
    • H01L21/76802Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics
    • H01L21/76807Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics for dual damascene structures
    • H01L21/76808Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics for dual damascene structures involving intermediate temporary filling with material
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76897Formation of self-aligned vias or contact plugs, i.e. involving a lithographically uncritical step
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007Multistep manufacturing processes
    • H01L29/66075Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409Unipolar field-effect transistors
    • H01L29/66477Unipolar field-effect transistors with an insulated gate, i.e. MISFET
    • H01L29/66674DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
    • H01L29/66712Vertical DMOS transistors, i.e. VDMOS transistors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
SG10201400672TA 2010-12-14 2011-09-14 Semiconductor devices having through-contacts and related fabrication methods SG10201400672TA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/968,068 US8951907B2 (en) 2010-12-14 2010-12-14 Semiconductor devices having through-contacts and related fabrication methods

Publications (1)

Publication Number Publication Date
SG10201400672TA true SG10201400672TA (en) 2014-05-29

Family

ID=46144822

Family Applications (2)

Application Number Title Priority Date Filing Date
SG2011066073A SG182041A1 (en) 2010-12-14 2011-09-14 Semiconductor devices having through-contacts and related fabrication methods
SG10201400672TA SG10201400672TA (en) 2010-12-14 2011-09-14 Semiconductor devices having through-contacts and related fabrication methods

Family Applications Before (1)

Application Number Title Priority Date Filing Date
SG2011066073A SG182041A1 (en) 2010-12-14 2011-09-14 Semiconductor devices having through-contacts and related fabrication methods

Country Status (6)

Country Link
US (1) US8951907B2 (en)
KR (1) KR101331250B1 (en)
CN (2) CN102543848A (en)
DE (1) DE102011085203B4 (en)
SG (2) SG182041A1 (en)
TW (1) TWI462188B (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8507375B1 (en) * 2012-02-02 2013-08-13 GlobalFoundries, Inc. Alignment tolerant semiconductor contact and method
US9153483B2 (en) * 2013-10-30 2015-10-06 Taiwan Semiconductor Manufacturing Company, Ltd. Method of semiconductor integrated circuit fabrication
US9397004B2 (en) * 2014-01-27 2016-07-19 GlobalFoundries, Inc. Methods for fabricating FinFET integrated circuits with simultaneous formation of local contact openings
US9640444B2 (en) 2014-07-23 2017-05-02 Samsung Electronics Co., Ltd. Semiconductor device and method of fabricating the same
US9412659B1 (en) * 2015-01-29 2016-08-09 Globalfoundries Inc. Semiconductor structure having source/drain gouging immunity
US10153351B2 (en) 2016-01-29 2018-12-11 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor device and a method for fabricating the same
US10510851B2 (en) * 2016-11-29 2019-12-17 Taiwan Semiconductor Manufacturing Company, Ltd. Low resistance contact method and structure
US10867842B2 (en) * 2018-10-31 2020-12-15 Taiwan Semiconductor Manufacturing Company, Ltd. Method for shrinking openings in forming integrated circuits
US11482495B2 (en) * 2018-11-30 2022-10-25 Taiwan Semiconductor Manufacturing Company, Ltd. Semiconductor arrangement and method for making
KR20210111396A (en) 2020-03-02 2021-09-13 삼성전자주식회사 Semiconductor device and method for manufacturing the same
CN113555437A (en) * 2020-04-26 2021-10-26 中芯国际集成电路制造(上海)有限公司 Semiconductor structure and forming method thereof

Family Cites Families (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3500308B2 (en) 1997-08-13 2004-02-23 インターナショナル・ビジネス・マシーンズ・コーポレーション Integrated circuit
TW374946B (en) * 1997-12-03 1999-11-21 United Microelectronics Corp Definition of structure of dielectric layer patterns and the manufacturing method
US6080661A (en) * 1998-05-29 2000-06-27 Philips Electronics North America Corp. Methods for fabricating gate and diffusion contacts in self-aligned contact processes
US6287961B1 (en) * 1999-01-04 2001-09-11 Taiwan Semiconductor Manufacturing Company Dual damascene patterned conductor layer formation method without etch stop layer
JP2000286254A (en) * 1999-03-31 2000-10-13 Hitachi Ltd Semiconductor integrated circuit device and manufacture thereof
JP2001077212A (en) * 1999-08-31 2001-03-23 Toshiba Corp Semiconductor device and its manufacture
KR100341663B1 (en) * 1999-09-27 2002-06-24 윤종용 Method of forming bit line contact holes in a semiconductor device with reduced photolithography process
US6300201B1 (en) * 2000-03-13 2001-10-09 Chartered Semiconductor Manufacturing Ltd. Method to form a high K dielectric gate insulator layer, a metal gate structure, and self-aligned channel regions, post source/drain formation
JP2001338978A (en) * 2000-05-25 2001-12-07 Hitachi Ltd Semiconductor device and its manufacturing method
US6465294B1 (en) * 2001-03-16 2002-10-15 Taiwan Semiconductor Manufacturing Company Self-aligned process for a stacked gate RF MOSFET device
US20030060037A1 (en) * 2001-09-27 2003-03-27 Joseph Wu Method of manufacturing trench conductor line
KR100444306B1 (en) * 2001-12-31 2004-08-16 주식회사 하이닉스반도체 Manufacturing method for semiconductor device
US6743712B2 (en) * 2002-07-12 2004-06-01 Intel Corporation Method of making a semiconductor device by forming a masking layer with a tapered etch profile
JP2004095611A (en) * 2002-08-29 2004-03-25 Fujitsu Ltd Semiconductor device and its manufacturing method
US6673718B1 (en) 2002-11-27 2004-01-06 Samsung Electronics Co., Ltd. Methods for forming aluminum metal wirings
TWI250558B (en) * 2003-10-23 2006-03-01 Hynix Semiconductor Inc Method for fabricating semiconductor device with fine patterns
KR100562675B1 (en) * 2003-11-04 2006-03-20 주식회사 하이닉스반도체 Method of manufacturing in semiconductor devices
TWI242797B (en) * 2004-06-01 2005-11-01 Nanya Technology Corp Method for forming self-aligned contact of semiconductor device
JP2006019480A (en) * 2004-07-01 2006-01-19 Nec Electronics Corp Method for manufacturing semiconductor apparatus
KR100621630B1 (en) * 2004-08-25 2006-09-19 삼성전자주식회사 Damascene processs using metals of two kinds
KR100630749B1 (en) * 2005-05-20 2006-10-02 삼성전자주식회사 Method of fabricating semiconductor device
DE102005052000B3 (en) * 2005-10-31 2007-07-05 Advanced Micro Devices, Inc., Sunnyvale Semiconductor device having a contact structure based on copper and tungsten
US20070099360A1 (en) * 2005-11-03 2007-05-03 International Business Machines Corporation Integrated circuits having strained channel field effect transistors and methods of making
US7960838B2 (en) * 2005-11-18 2011-06-14 United Microelectronics Corp. Interconnect structure
KR100741882B1 (en) * 2005-12-29 2007-07-23 동부일렉트로닉스 주식회사 Highvoltage device and Method for fabricating of the same
US7365009B2 (en) * 2006-01-04 2008-04-29 United Microelectronics Corp. Structure of metal interconnect and fabrication method thereof
US20070257323A1 (en) * 2006-05-05 2007-11-08 Taiwan Semiconductor Manufacturing Co., Ltd. Stacked contact structure and method of fabricating the same
KR100763514B1 (en) 2006-06-30 2007-10-04 삼성전자주식회사 Method of manufacturing an opening of a semiconductor device and method of manufacturing a semiconductor device using the same method
JP4575400B2 (en) * 2007-05-08 2010-11-04 株式会社東芝 Manufacturing method of semiconductor device
KR100830591B1 (en) * 2007-06-07 2008-05-22 삼성전자주식회사 Methods of forming a semiconductor device including openings
DE102007057682A1 (en) 2007-11-30 2009-06-04 Advanced Micro Devices, Inc., Sunnyvale A hybrid contact structure with a small aspect ratio contact in a semiconductor device
JP2009158591A (en) * 2007-12-25 2009-07-16 Nec Electronics Corp Semiconductor device and process for manufacturing same
JP2010021295A (en) 2008-07-09 2010-01-28 Nec Electronics Corp Semiconductor device and its manufacturing method
US8058137B1 (en) * 2009-04-14 2011-11-15 Monolithic 3D Inc. Method for fabrication of a semiconductor device and structure
US20100308380A1 (en) * 2009-06-05 2010-12-09 International Business Machines Corporation Dual damascene processing for gate conductor and active area to first metal level interconnect structures
JP5671220B2 (en) * 2009-08-25 2015-02-18 ルネサスエレクトロニクス株式会社 Manufacturing method of semiconductor device
US8277674B2 (en) * 2009-12-15 2012-10-02 United Microelectronics Corp. Method of removing post-etch residues

Also Published As

Publication number Publication date
CN102543848A (en) 2012-07-04
KR101331250B1 (en) 2013-11-20
KR20120066584A (en) 2012-06-22
DE102011085203A1 (en) 2012-06-14
DE102011085203B4 (en) 2018-08-23
TWI462188B (en) 2014-11-21
TW201225183A (en) 2012-06-16
US20120146106A1 (en) 2012-06-14
SG182041A1 (en) 2012-07-30
CN105374672A (en) 2016-03-02
US8951907B2 (en) 2015-02-10

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