SG101510A1 - Reflecting sheet for use in integrated circuit test machine - Google Patents

Reflecting sheet for use in integrated circuit test machine

Info

Publication number
SG101510A1
SG101510A1 SG200106879A SG200106879A SG101510A1 SG 101510 A1 SG101510 A1 SG 101510A1 SG 200106879 A SG200106879 A SG 200106879A SG 200106879 A SG200106879 A SG 200106879A SG 101510 A1 SG101510 A1 SG 101510A1
Authority
SG
Singapore
Prior art keywords
integrated circuit
test machine
circuit test
reflecting sheet
reflecting
Prior art date
Application number
SG200106879A
Inventor
Kun-Nan Chiang
Yon-Tze Lin
Original Assignee
Ultratera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ultratera Corp filed Critical Ultratera Corp
Priority to SG200106879A priority Critical patent/SG101510A1/en
Publication of SG101510A1 publication Critical patent/SG101510A1/en

Links

SG200106879A 2001-11-08 2001-11-08 Reflecting sheet for use in integrated circuit test machine SG101510A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SG200106879A SG101510A1 (en) 2001-11-08 2001-11-08 Reflecting sheet for use in integrated circuit test machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SG200106879A SG101510A1 (en) 2001-11-08 2001-11-08 Reflecting sheet for use in integrated circuit test machine

Publications (1)

Publication Number Publication Date
SG101510A1 true SG101510A1 (en) 2004-01-30

Family

ID=32590091

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200106879A SG101510A1 (en) 2001-11-08 2001-11-08 Reflecting sheet for use in integrated circuit test machine

Country Status (1)

Country Link
SG (1) SG101510A1 (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3648835A (en) * 1969-11-12 1972-03-14 Minnesota Mining & Mfg Marking tape
US5667073A (en) * 1994-06-23 1997-09-16 Okui; Tokujiro Carrier tape for storage use of electronic components
US6111246A (en) * 1996-04-05 2000-08-29 Advantest Corporation Semiconductor device testing apparatus having presence or absence detectors issuing an alarm when an error occurs
JP2001330626A (en) * 2000-05-22 2001-11-30 Micronics Japan Co Ltd Probe card and method for forming alignment mark thereto

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3648835A (en) * 1969-11-12 1972-03-14 Minnesota Mining & Mfg Marking tape
US5667073A (en) * 1994-06-23 1997-09-16 Okui; Tokujiro Carrier tape for storage use of electronic components
US6111246A (en) * 1996-04-05 2000-08-29 Advantest Corporation Semiconductor device testing apparatus having presence or absence detectors issuing an alarm when an error occurs
JP2001330626A (en) * 2000-05-22 2001-11-30 Micronics Japan Co Ltd Probe card and method for forming alignment mark thereto

Similar Documents

Publication Publication Date Title
GB0103772D0 (en) Interdigitated capacitor structure for use in an integrated circuit
EP1391991A4 (en) Integrated circuit device
GB0127322D0 (en) Test device
AU2002339624A1 (en) Preconditioning integrated circuit for integrated circuit testing
GB2370364B (en) Testing integrated circuits
TW578910U (en) Integrated circuit probe card
GB0029162D0 (en) Integrated circuit device
EP1271147A4 (en) Test paper
TW511811U (en) Removable integrated circuit device
GB2371737B (en) Improvements in slicing machines
GB2374408B (en) Inspection machine
GB2371738B (en) Improvements in slicing machines
SG101510A1 (en) Reflecting sheet for use in integrated circuit test machine
GB2381389B (en) A fixing arrangement for use in an electrical machine
GB2371532B (en) Inspection machine
TW505234U (en) Reflective sheet for integrated circuit tester
GB0126406D0 (en) Integrated circuit
GB2368475B (en) Integrated circuit
GB0109283D0 (en) Testing for compliance
GB0030346D0 (en) Integrated circuit test structure
GB0103591D0 (en) Improvements in pinless notice boards
TW476416U (en) IC testing tool structure
GB0102301D0 (en) Improvemnts in slicing machines
GB0102296D0 (en) Improvements in slicing machines
GB0102300D0 (en) Improvements in slicing machines