SE9202500D0 - Saett och anordning foer funktionskontroll av ljustaenda halvledarventilenheter i hvdc-ventilanlaeggningar - Google Patents

Saett och anordning foer funktionskontroll av ljustaenda halvledarventilenheter i hvdc-ventilanlaeggningar

Info

Publication number
SE9202500D0
SE9202500D0 SE9202500A SE9202500A SE9202500D0 SE 9202500 D0 SE9202500 D0 SE 9202500D0 SE 9202500 A SE9202500 A SE 9202500A SE 9202500 A SE9202500 A SE 9202500A SE 9202500 D0 SE9202500 D0 SE 9202500D0
Authority
SE
Sweden
Prior art keywords
semiconductor
valve
pct
setting
facilities
Prior art date
Application number
SE9202500A
Other languages
English (en)
Other versions
SE9202500L (sv
SE507139C2 (sv
Inventor
K Nyberg
Original Assignee
Asea Brown Boveri
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asea Brown Boveri filed Critical Asea Brown Boveri
Priority to SE9202500A priority Critical patent/SE507139C2/sv
Publication of SE9202500D0 publication Critical patent/SE9202500D0/sv
Priority to US08/379,595 priority patent/US5521526A/en
Priority to PCT/SE1993/000662 priority patent/WO1994006028A1/en
Priority to EP93919745A priority patent/EP0671012A1/en
Priority to AU49880/93A priority patent/AU4988093A/en
Priority to JP6507103A priority patent/JPH08500676A/ja
Publication of SE9202500L publication Critical patent/SE9202500L/sv
Publication of SE507139C2 publication Critical patent/SE507139C2/sv

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/263Circuits therefor for testing thyristors
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02MAPPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00Details of apparatus for conversion
    • H02M1/08Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters
    • H02M1/088Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters for the simultaneous control of series or parallel connected semiconductor devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3272Apparatus, systems or circuits therefor
    • G01R31/3274Details related to measuring, e.g. sensing, displaying or computing; Measuring of variables related to the contact pieces, e.g. wear, position or resistance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Power Conversion In General (AREA)
  • Circuit Arrangement For Electric Light Sources In General (AREA)
  • Rectifiers (AREA)
SE9202500A 1992-08-31 1992-08-31 Sätt och anordning för funktionskontroll av ljustända halvledarventilenheter i HVDC-ventilanläggningar SE507139C2 (sv)

Priority Applications (6)

Application Number Priority Date Filing Date Title
SE9202500A SE507139C2 (sv) 1992-08-31 1992-08-31 Sätt och anordning för funktionskontroll av ljustända halvledarventilenheter i HVDC-ventilanläggningar
US08/379,595 US5521526A (en) 1992-08-31 1993-08-11 Method and a device for checking the condition of semiconductor valves
PCT/SE1993/000662 WO1994006028A1 (en) 1992-08-31 1993-08-11 A method and a device for checking the condition of semiconductor valves
EP93919745A EP0671012A1 (en) 1992-08-31 1993-08-11 A method and a device for checking the condition of semiconductor valves
AU49880/93A AU4988093A (en) 1992-08-31 1993-08-11 A method and a device for checking the condition of semiconductor valves
JP6507103A JPH08500676A (ja) 1992-08-31 1993-08-11 半導体バルブの状態を点検するための方法と装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9202500A SE507139C2 (sv) 1992-08-31 1992-08-31 Sätt och anordning för funktionskontroll av ljustända halvledarventilenheter i HVDC-ventilanläggningar

Publications (3)

Publication Number Publication Date
SE9202500D0 true SE9202500D0 (sv) 1992-08-31
SE9202500L SE9202500L (sv) 1994-03-01
SE507139C2 SE507139C2 (sv) 1998-04-06

Family

ID=20387054

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9202500A SE507139C2 (sv) 1992-08-31 1992-08-31 Sätt och anordning för funktionskontroll av ljustända halvledarventilenheter i HVDC-ventilanläggningar

Country Status (6)

Country Link
US (1) US5521526A (sv)
EP (1) EP0671012A1 (sv)
JP (1) JPH08500676A (sv)
AU (1) AU4988093A (sv)
SE (1) SE507139C2 (sv)
WO (1) WO1994006028A1 (sv)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE521212C2 (sv) * 1997-06-11 2003-10-14 Abb Ab Anordning för avkänning av läckage av kylvätska vid en högspänningsomriktarstation
SE510730C2 (sv) * 1997-06-11 1999-06-21 Asea Brown Boveri Anordning för övervakning vid en högspänningsomriktarstation
SE523420C2 (sv) * 1997-06-11 2004-04-20 Abb Ab Förfarande för kommunikation mellan låg potential och en på högspänningspotential liggande ventil hos en högspänningsomriktarstation samt en anordning för sådan kommunikation
SE511858C2 (sv) * 1998-04-28 1999-12-06 Abb Ab Förfarande och anordning för funktionskontroll av en fritt valbar halvledarposition i en elektrisk halvledarventil
WO2005062450A1 (en) * 2003-12-23 2005-07-07 Abb Technology Ltd A device in a semiconductor valve
JP4610380B2 (ja) * 2005-03-16 2011-01-12 三菱電機株式会社 電力変換装置
US20100265816A1 (en) * 2009-04-17 2010-10-21 American Superconductor Corporation Monitoring switching networks
CN101726697B (zh) * 2009-12-14 2013-05-08 中国电力科学研究院 高压晶闸管阀多注入试验方法
CN102486517B (zh) * 2010-12-01 2015-11-25 中国电力科学研究院 冲击电压复合的高压直流输电换流阀故障电流试验方法
CN102486527B (zh) * 2010-12-01 2015-09-23 中国电力科学研究院 一种高压直流输电换流阀合成试验方法
US9147620B2 (en) * 2012-03-28 2015-09-29 Teradyne, Inc. Edge triggered calibration
KR101326327B1 (ko) * 2012-05-22 2013-11-11 명지대학교 산학협력단 사이리스터 밸브의 합성 시험 장치
KR101442990B1 (ko) * 2013-10-16 2014-11-04 엘에스산전 주식회사 고전압직류송전 사이리스터 밸브를 위한 합성시험회로
DE102014105719B4 (de) * 2014-04-23 2015-11-26 Ge Energy Power Conversion Gmbh Schaltungsvorrichtung mit einer Thyristorschaltung sowie ein Verfahren zum Prüfen der Thyristorschaltung
CN104714074A (zh) * 2015-02-02 2015-06-17 华中科技大学 一种晶闸管导通压降测量系统及测量方法
CN105703481B (zh) * 2016-03-03 2018-03-30 南京南瑞继保电气有限公司 一种换流阀均压状态一致性统计方法
KR102505454B1 (ko) * 2016-04-28 2023-03-03 엘에스일렉트릭(주) 무효전력보상장치의 제어장치 및 그의 제어방법
CN109239564B (zh) * 2017-07-10 2021-02-26 南京南瑞继保电气有限公司 一种基于软件逻辑功能配合的晶闸管测试系统
EP4119957A1 (de) 2021-07-16 2023-01-18 Siemens Energy Global GmbH & Co. KG Verfahren zum überwachen einer schutzeinrichtung

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4471301A (en) * 1981-12-11 1984-09-11 Vsesojuzny Elektrotekhnichesky Institut Device for monitoring thyristors of high-voltage valve
JPS5983569A (ja) * 1982-10-30 1984-05-15 Toshiba Corp ゲ−トタ−ンオフサイリスタの故障検出回路
JPH0743413B2 (ja) * 1984-05-09 1995-05-15 三菱電機株式会社 半導体試験装置
US4884025A (en) * 1986-06-06 1989-11-28 Asea Brown Boveri Ag Process for the fault monitoring of an electric valve

Also Published As

Publication number Publication date
EP0671012A1 (en) 1995-09-13
AU4988093A (en) 1994-03-29
WO1994006028A1 (en) 1994-03-17
SE9202500L (sv) 1994-03-01
SE507139C2 (sv) 1998-04-06
JPH08500676A (ja) 1996-01-23
US5521526A (en) 1996-05-28

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