SE8700756D0 - PROCEDURE AND APPARATUS FOR DETERMINING THE DIAMETER WORLD - Google Patents

PROCEDURE AND APPARATUS FOR DETERMINING THE DIAMETER WORLD

Info

Publication number
SE8700756D0
SE8700756D0 SE8700756A SE8700756A SE8700756D0 SE 8700756 D0 SE8700756 D0 SE 8700756D0 SE 8700756 A SE8700756 A SE 8700756A SE 8700756 A SE8700756 A SE 8700756A SE 8700756 D0 SE8700756 D0 SE 8700756D0
Authority
SE
Sweden
Prior art keywords
determining
procedure
diameter
machine part
measure
Prior art date
Application number
SE8700756A
Other languages
Swedish (sv)
Other versions
SE8700756L (en
Inventor
R Diem
Original Assignee
Skf Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Skf Gmbh filed Critical Skf Gmbh
Publication of SE8700756D0 publication Critical patent/SE8700756D0/en
Publication of SE8700756L publication Critical patent/SE8700756L/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/30—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B7/31—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B7/312—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes for measuring eccentricity, i.e. lateral shift between two parallel axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/08—Measuring arrangements characterised by the use of mechanical techniques for measuring diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/12—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G01B7/282—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures for measuring roundness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)

Abstract

A measuring instrument for determining diametral values on a stationary machine part 10 is provided with at least three pairs of linear measuring sensors 11, 12 and 13 which measure the diameter at three angularly spaced locations on the circumference. A device connected thereto selects and calculates characteristic values, such as the maximum, mean, and minimum diameters and the out of roundness of the machine part. The instrument may be arranged to measure internal diameters. <IMAGE>
SE8700756A 1986-03-01 1987-02-24 PROCEDURE AND APPARATUS FOR DETERMINING THE DIAMETER WORLD SE8700756L (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19863606725 DE3606725A1 (en) 1986-03-01 1986-03-01 METHOD AND DEVICE OF DIAMETER VALUES

Publications (2)

Publication Number Publication Date
SE8700756D0 true SE8700756D0 (en) 1987-02-24
SE8700756L SE8700756L (en) 1987-09-02

Family

ID=6295276

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8700756A SE8700756L (en) 1986-03-01 1987-02-24 PROCEDURE AND APPARATUS FOR DETERMINING THE DIAMETER WORLD

Country Status (5)

Country Link
DE (1) DE3606725A1 (en)
FR (1) FR2595138A1 (en)
GB (1) GB2187289A (en)
IT (1) IT8719424A0 (en)
SE (1) SE8700756L (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4003291A1 (en) * 1990-02-03 1991-08-08 Gkn Automotive Ag CAM expansion measurement - using radial displacement at peripheral points as inserted tubular body is expanded for quality checking connection of CAM and shaft
AU630540B2 (en) * 1990-03-16 1992-10-29 Research Engineering & Manufacturing, Inc. Method and apparatus for gaging bodies such as threaded fasteners and blanks
US5168458A (en) * 1990-03-16 1992-12-01 Research Engineering & Manufacturing, Inc. Method and apparatus for gaging the degree of lobulation of bodies such as threaded fasteners
EP0643281A3 (en) * 1993-09-02 1995-11-08 Siemens Ag Device for capacitively examining a measuring object, in particular a cylinder of a ceramical combustion tube.
DE102007010223B4 (en) * 2007-02-28 2010-07-29 Vistec Semiconductor Systems Gmbh Method for determining geometric parameters of a wafer and use of the method in the optical inspection of wafers

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE902556C (en) * 1937-09-02 1954-03-01 Aeg Method and device for testing workpieces
DE1165288B (en) * 1960-11-10 1964-03-12 August Steinmeyer Fa Inside measuring device
US3104472A (en) * 1960-11-23 1963-09-24 Western Electric Co Diameter gages
GB1542101A (en) * 1977-01-28 1979-03-14 Bicc Ltd Monitoring diameters of an advancing core
DE2729575A1 (en) * 1977-06-28 1979-01-11 Siemens Ag Electrical cable extrusion monitor - surrounds cable with resistance probe whose length varies with cable diameter
IT1091911B (en) * 1977-12-07 1985-07-06 Finike Italiana Marposs EQUIPMENT FOR GEOMETRIC CONTROL OF PIECES WITH ROTATION SURFACES
DE3303637C2 (en) * 1983-02-03 1985-03-21 Wieland-Werke Ag, 7900 Ulm Device for measuring the cross-sectional dimensions on hollow cylindrical workpieces

Also Published As

Publication number Publication date
SE8700756L (en) 1987-09-02
IT8719424A0 (en) 1987-02-19
GB2187289A (en) 1987-09-03
FR2595138A1 (en) 1987-09-04
GB8704628D0 (en) 1987-04-01
DE3606725A1 (en) 1987-09-03

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Legal Events

Date Code Title Description
NAV Patent application has lapsed

Ref document number: 8700756-3

Effective date: 19871001