SE8605085L - CONTACTING DEVICE FOR CONNECTING ELECTRICAL CABLES TO ELECTRONIC COMPONENT CONTACTS - Google Patents

CONTACTING DEVICE FOR CONNECTING ELECTRICAL CABLES TO ELECTRONIC COMPONENT CONTACTS

Info

Publication number
SE8605085L
SE8605085L SE8605085A SE8605085A SE8605085L SE 8605085 L SE8605085 L SE 8605085L SE 8605085 A SE8605085 A SE 8605085A SE 8605085 A SE8605085 A SE 8605085A SE 8605085 L SE8605085 L SE 8605085L
Authority
SE
Sweden
Prior art keywords
component
contact
plate
electronic component
electrical cables
Prior art date
Application number
SE8605085A
Other languages
Swedish (sv)
Other versions
SE8605085D0 (en
SE458238B (en
Inventor
Gunnar A Detlof
Original Assignee
Gunnar A Detlof
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gunnar A Detlof filed Critical Gunnar A Detlof
Priority to SE8605085A priority Critical patent/SE458238B/en
Publication of SE8605085D0 publication Critical patent/SE8605085D0/en
Publication of SE8605085L publication Critical patent/SE8605085L/en
Publication of SE458238B publication Critical patent/SE458238B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G01R31/02—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Connections Arranged To Contact A Plurality Of Conductors (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

For temp. regulated testing of electronic components, a control plate (1) has holes (2), and the contact plate (4) has a number of sprung or sprung-fastened pointed contact pins (3) the number of which corresponds to the total quantity of connections on the component (100). The temp. regulated counter plate (6) has good thermic location against the component, and the three plates (1, 4, 6) are connected laterally by a guide column. The parts of the contactor may execute a movement where the component contact underside is freed from mechanical contact with the adjacent and thermally conductive control plate. At the same time, the component is retained between the counter plate and the pointed contact pins, thus ensuring good electrical contact with the component connecting surfaces.
SE8605085A 1986-11-27 1986-11-27 Contactor for connecting electrical leads to electronic components SE458238B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SE8605085A SE458238B (en) 1986-11-27 1986-11-27 Contactor for connecting electrical leads to electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE8605085A SE458238B (en) 1986-11-27 1986-11-27 Contactor for connecting electrical leads to electronic components

Publications (3)

Publication Number Publication Date
SE8605085D0 SE8605085D0 (en) 1986-11-27
SE8605085L true SE8605085L (en) 1988-05-28
SE458238B SE458238B (en) 1989-03-06

Family

ID=20366425

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8605085A SE458238B (en) 1986-11-27 1986-11-27 Contactor for connecting electrical leads to electronic components

Country Status (1)

Country Link
SE (1) SE458238B (en)

Also Published As

Publication number Publication date
SE8605085D0 (en) 1986-11-27
SE458238B (en) 1989-03-06

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