SE7603066L - Strukturuppmetningsanalysator - Google Patents

Strukturuppmetningsanalysator

Info

Publication number
SE7603066L
SE7603066L SE7603066A SE7603066A SE7603066L SE 7603066 L SE7603066 L SE 7603066L SE 7603066 A SE7603066 A SE 7603066A SE 7603066 A SE7603066 A SE 7603066A SE 7603066 L SE7603066 L SE 7603066L
Authority
SE
Sweden
Prior art keywords
saturation analyzer
structure saturation
analyzer
saturation
Prior art date
Application number
SE7603066A
Other languages
English (en)
Inventor
R G Robinson
Original Assignee
Aga Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aga Ag filed Critical Aga Ag
Publication of SE7603066L publication Critical patent/SE7603066L/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
SE7603066A 1975-03-13 1976-03-08 Strukturuppmetningsanalysator SE7603066L (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB10604/75A GB1546781A (en) 1975-03-13 1975-03-13 Structure survey analyser

Publications (1)

Publication Number Publication Date
SE7603066L true SE7603066L (sv) 1976-09-14

Family

ID=9970914

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7603066A SE7603066L (sv) 1975-03-13 1976-03-08 Strukturuppmetningsanalysator

Country Status (3)

Country Link
FI (1) FI760657A (sv)
GB (1) GB1546781A (sv)
SE (1) SE7603066L (sv)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE448785B (sv) * 1980-04-23 1987-03-16 Pharos Ab Anordning for att kontrollera mattriktigheten och/eller meta dimensionen hos stora foremal

Also Published As

Publication number Publication date
GB1546781A (en) 1979-05-31
FI760657A (sv) 1976-09-14

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