SE539001C2 - Optical measuring system based on Raman scattering - Google Patents

Optical measuring system based on Raman scattering Download PDF

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Publication number
SE539001C2
SE539001C2 SE1500317A SE1500317A SE539001C2 SE 539001 C2 SE539001 C2 SE 539001C2 SE 1500317 A SE1500317 A SE 1500317A SE 1500317 A SE1500317 A SE 1500317A SE 539001 C2 SE539001 C2 SE 539001C2
Authority
SE
Sweden
Prior art keywords
aperture
measuring
mode
slit
spectral
Prior art date
Application number
SE1500317A
Other languages
English (en)
Other versions
SE1500317A1 (en
Inventor
Nordberg Markus
Östmark Henric
Original Assignee
Totalförsvarets Forskningsinstitut
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Totalförsvarets Forskningsinstitut filed Critical Totalförsvarets Forskningsinstitut
Priority to SE1500317A priority Critical patent/SE539001C2/sv
Priority to PCT/SE2016/000038 priority patent/WO2017018916A1/en
Priority to US15/747,203 priority patent/US10156523B2/en
Priority to EP16830917.7A priority patent/EP3325948A4/en
Publication of SE1500317A1 publication Critical patent/SE1500317A1/sv
Publication of SE539001C2 publication Critical patent/SE539001C2/sv

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65Raman scattering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0229Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/44Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/44Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G01J3/4412Scattering spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/22Fuels; Explosives
    • G01N33/227Explosives, e.g. combustive properties thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/061Sources
    • G01N2201/06113Coherent sources; lasers

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Combustion & Propulsion (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Spectrometry And Color Measurement (AREA)
SE1500317A 2015-07-24 2015-07-24 Optical measuring system based on Raman scattering SE539001C2 (sv)

Priority Applications (4)

Application Number Priority Date Filing Date Title
SE1500317A SE539001C2 (sv) 2015-07-24 2015-07-24 Optical measuring system based on Raman scattering
PCT/SE2016/000038 WO2017018916A1 (en) 2015-07-24 2016-07-06 Optical measuring system based on raman scattering
US15/747,203 US10156523B2 (en) 2015-07-24 2016-07-06 Optical measuring system based on Raman scattering
EP16830917.7A EP3325948A4 (en) 2015-07-24 2016-07-06 OPTICAL MEASUREMENT SYSTEM BASED ON RAMAN DIFFUSION

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE1500317A SE539001C2 (sv) 2015-07-24 2015-07-24 Optical measuring system based on Raman scattering

Publications (2)

Publication Number Publication Date
SE1500317A1 SE1500317A1 (en) 2017-01-25
SE539001C2 true SE539001C2 (sv) 2017-03-14

Family

ID=57884936

Family Applications (1)

Application Number Title Priority Date Filing Date
SE1500317A SE539001C2 (sv) 2015-07-24 2015-07-24 Optical measuring system based on Raman scattering

Country Status (4)

Country Link
US (1) US10156523B2 (sv)
EP (1) EP3325948A4 (sv)
SE (1) SE539001C2 (sv)
WO (1) WO2017018916A1 (sv)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108827939B (zh) * 2018-08-15 2023-09-19 吉林大学 一种二维激光拉曼散射光谱测量系统
US11536605B2 (en) * 2020-09-18 2022-12-27 Apple Inc. Electronic devices with an alignment-free spectrometer

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005088264A1 (en) * 2004-03-06 2005-09-22 Plain Sight Systems, Inc. Hyper-spectral imaging methods and devices
CN101400974B (zh) * 2006-03-09 2014-04-16 泰萨莱有限责任公司 微阵列成像系统和相关的方法
US20080174777A1 (en) * 2006-04-11 2008-07-24 University Of Wyoming Spectrometers using 2-dimensional microelectromechanical digital micromirror devices
US20090040516A1 (en) * 2007-08-10 2009-02-12 Honeywell International Inc. Spectroscopic system
US20140052386A1 (en) * 2012-02-10 2014-02-20 Optopo Inc. D/B/A Centice Corporation Systems and Methods for Handheld Raman Spectroscopy

Also Published As

Publication number Publication date
EP3325948A1 (en) 2018-05-30
US20180217066A1 (en) 2018-08-02
WO2017018916A1 (en) 2017-02-02
SE1500317A1 (en) 2017-01-25
US10156523B2 (en) 2018-12-18
EP3325948A4 (en) 2019-03-20

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