SE399323B - Sett och apparat for lokalisering av kortslutningsfel i tryckta kretskort - Google Patents

Sett och apparat for lokalisering av kortslutningsfel i tryckta kretskort

Info

Publication number
SE399323B
SE399323B SE7512150A SE7512150A SE399323B SE 399323 B SE399323 B SE 399323B SE 7512150 A SE7512150 A SE 7512150A SE 7512150 A SE7512150 A SE 7512150A SE 399323 B SE399323 B SE 399323B
Authority
SE
Sweden
Prior art keywords
location
errors
circuit
printed circuit
cards
Prior art date
Application number
SE7512150A
Other languages
English (en)
Swedish (sv)
Other versions
SE7512150L (th
Inventor
J H Thomas
Original Assignee
Ericsson L M Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson L M Pty Ltd filed Critical Ericsson L M Pty Ltd
Priority to SE7512150A priority Critical patent/SE399323B/xx
Publication of SE7512150L publication Critical patent/SE7512150L/sv
Publication of SE399323B publication Critical patent/SE399323B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G01R31/025—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
SE7512150A 1975-10-30 1975-10-30 Sett och apparat for lokalisering av kortslutningsfel i tryckta kretskort SE399323B (sv)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SE7512150A SE399323B (sv) 1975-10-30 1975-10-30 Sett och apparat for lokalisering av kortslutningsfel i tryckta kretskort

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE7512150A SE399323B (sv) 1975-10-30 1975-10-30 Sett och apparat for lokalisering av kortslutningsfel i tryckta kretskort

Publications (2)

Publication Number Publication Date
SE7512150L SE7512150L (th) 1977-05-01
SE399323B true SE399323B (sv) 1978-02-06

Family

ID=20325936

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7512150A SE399323B (sv) 1975-10-30 1975-10-30 Sett och apparat for lokalisering av kortslutningsfel i tryckta kretskort

Country Status (1)

Country Link
SE (1) SE399323B (th)

Also Published As

Publication number Publication date
SE7512150L (th) 1977-05-01

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