SE386514B - Sett for oforstorande metning av den absoluta elektrontetheten hos en utvald volym av material - Google Patents

Sett for oforstorande metning av den absoluta elektrontetheten hos en utvald volym av material

Info

Publication number
SE386514B
SE386514B SE7214870A SE1487072A SE386514B SE 386514 B SE386514 B SE 386514B SE 7214870 A SE7214870 A SE 7214870A SE 1487072 A SE1487072 A SE 1487072A SE 386514 B SE386514 B SE 386514B
Authority
SE
Sweden
Prior art keywords
unmatching
saturation
selected volume
electronic density
absolute electronic
Prior art date
Application number
SE7214870A
Other languages
English (en)
Swedish (sv)
Inventor
R L Clarke
Dyk G G Van
Original Assignee
Ca Atomic Energy Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ca Atomic Energy Ltd filed Critical Ca Atomic Energy Ltd
Publication of SE386514B publication Critical patent/SE386514B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
SE7214870A 1971-11-24 1972-11-16 Sett for oforstorande metning av den absoluta elektrontetheten hos en utvald volym av material SE386514B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA128434A CA939078A (en) 1971-11-24 1971-11-24 Method for non-destructive densitometric measurement of small volumes inside irregularly shaped non-uniform objects

Publications (1)

Publication Number Publication Date
SE386514B true SE386514B (sv) 1976-08-09

Family

ID=4091600

Family Applications (2)

Application Number Title Priority Date Filing Date
SE7214870A SE386514B (sv) 1971-11-24 1972-11-16 Sett for oforstorande metning av den absoluta elektrontetheten hos en utvald volym av material
SE7512328A SE7512328L (sv) 1971-11-24 1975-11-04 Sett for oforstorande metning av absolut elektrontethet

Family Applications After (1)

Application Number Title Priority Date Filing Date
SE7512328A SE7512328L (sv) 1971-11-24 1975-11-04 Sett for oforstorande metning av absolut elektrontethet

Country Status (8)

Country Link
US (1) US3809904A (de)
JP (1) JPS4876589A (de)
CA (1) CA939078A (de)
DE (1) DE2256701A1 (de)
FR (1) FR2163076A5 (de)
GB (1) GB1414655A (de)
SE (2) SE386514B (de)
ZA (1) ZA726491B (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2222642B1 (de) * 1973-03-19 1976-05-21 Commissariat Energie Atomique
US3936638A (en) * 1973-07-06 1976-02-03 Emi Limited Radiology
DK131955C (da) * 1973-10-09 1976-02-23 I Leunbach Fremgangsmade og anleg til bestemmelse af elektrontetheden i et delvolumen af et legeme
GB1578442A (en) * 1976-07-01 1980-11-05 Emi Ltd Radiography
US4333145A (en) * 1979-11-29 1982-06-01 Technicare Corporation Method of high resolution partial area scan involving concentrated high density material outside the partial area
US4768214A (en) * 1985-01-16 1988-08-30 American Science And Engineering, Inc. Imaging
US5155136A (en) * 1990-11-23 1992-10-13 Eastman Kodak Company Fungicidal, 2-acylacetanilide derivatives
CA2355560C (en) 2000-08-28 2003-11-18 Balza Achmad X-ray compton scatter density measurement at a point within an object
US7203276B2 (en) * 2004-08-27 2007-04-10 University Of New Brunswick X-ray scatter image reconstruction by balancing of discrepancies between detector responses, and apparatus therefor
US8837677B2 (en) * 2007-04-11 2014-09-16 The Invention Science Fund I Llc Method and system for compton scattered X-ray depth visualization, imaging, or information provider
US20080253522A1 (en) * 2007-04-11 2008-10-16 Searete Llc, A Limited Liability Corporation Of The State Of Delaware Tool associated with compton scattered X-ray visualization, imaging, or information provider
US7711089B2 (en) * 2007-04-11 2010-05-04 The Invention Science Fund I, Llc Scintillator aspects of compton scattered X-ray visualization, imaging, or information providing
US7742567B2 (en) * 2007-04-11 2010-06-22 Searete Llc Compton scattered X-ray visualization, imaging, or information provider with time of flight computation
US8041006B2 (en) * 2007-04-11 2011-10-18 The Invention Science Fund I Llc Aspects of compton scattered X-ray visualization, imaging, or information providing
US20080253525A1 (en) * 2007-04-11 2008-10-16 Boyden Edward S Compton scattered x-ray visualizing, imaging, or information providing of at least some dissimilar matter
US20080253526A1 (en) * 2007-04-11 2008-10-16 Searete Llc, A Limited Liability Corporation Of The State Of Delaware Geometric compton scattered x-ray visualizing, imaging, or information providing
GB201220418D0 (en) * 2012-11-13 2012-12-26 Kromek Ltd Identification of materials
GB201503022D0 (en) * 2015-02-24 2015-04-08 Kromek Ltd Determination of density

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2521154A (en) * 1950-09-05 Method of and means for making
US2770719A (en) * 1954-04-02 1956-11-13 Reflectone Corp Photographic system

Also Published As

Publication number Publication date
CA939078A (en) 1973-12-25
FR2163076A5 (de) 1973-07-20
US3809904A (en) 1974-05-07
SE7512328L (sv) 1975-11-04
JPS4876589A (de) 1973-10-15
GB1414655A (en) 1975-11-19
DE2256701A1 (de) 1974-06-12
ZA726491B (en) 1974-04-24

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