SE379244B - DEVICE FOR INTERFEROMETERS WITH MULTIPREQUENCY LASER WITH EXTENDED METOM RANGE. - Google Patents

DEVICE FOR INTERFEROMETERS WITH MULTIPREQUENCY LASER WITH EXTENDED METOM RANGE.

Info

Publication number
SE379244B
SE379244B SE7107746*[A SE774671A SE379244B SE 379244 B SE379244 B SE 379244B SE 774671 A SE774671 A SE 774671A SE 379244 B SE379244 B SE 379244B
Authority
SE
Sweden
Prior art keywords
multiprequency
metom
interferometers
laser
extended
Prior art date
Application number
SE7107746*[A
Other languages
Swedish (sv)
Inventor
K A Bordalen
Original Assignee
Norges Teknisk Naturvitenskape
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Norges Teknisk Naturvitenskape filed Critical Norges Teknisk Naturvitenskape
Publication of SE379244B publication Critical patent/SE379244B/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
    • H01S3/08—Construction or shape of optical resonators or components thereof
    • H01S3/081—Construction or shape of optical resonators or components thereof comprising three or more reflectors
    • H01S3/083—Ring lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02007—Two or more frequencies or sources used for interferometric measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Transform (AREA)
SE7107746*[A 1970-06-16 1971-12-17 DEVICE FOR INTERFEROMETERS WITH MULTIPREQUENCY LASER WITH EXTENDED METOM RANGE. SE379244B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NO2327/70A NO125554B (en) 1970-06-16 1970-06-16

Publications (1)

Publication Number Publication Date
SE379244B true SE379244B (en) 1975-09-29

Family

ID=19878772

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7107746*[A SE379244B (en) 1970-06-16 1971-12-17 DEVICE FOR INTERFEROMETERS WITH MULTIPREQUENCY LASER WITH EXTENDED METOM RANGE.

Country Status (4)

Country Link
DE (1) DE2129899A1 (en)
GB (1) GB1309378A (en)
NO (1) NO125554B (en)
SE (1) SE379244B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4702603A (en) * 1985-07-23 1987-10-27 Cmx Systems, Inc. Optical phase decoder for interferometers
DE102005038362A1 (en) * 2005-08-11 2007-02-15 Prüftechnik Dieter Busch AG Beam splitter for optical measuring systems for determining parameters on machine tools
CN108089217B (en) * 2017-11-15 2023-06-13 中国工程物理研究院激光聚变研究中心 X-ray detector based on Michelson interferometer

Also Published As

Publication number Publication date
DE2129899A1 (en) 1971-12-23
GB1309378A (en) 1973-03-07
NO125554B (en) 1972-09-25

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