SE363896BSE13277/72ASE1327772ASE363896BSE 363896 BSE363896 BSE 363896BSE 13277/72 ASE13277/72 ASE 13277/72ASE 1327772 ASE1327772 ASE 1327772ASE 363896 BSE363896 BSE 363896B
Authority
SE
Sweden
Application number
SE13277/72A
Inventor
J Blomquist
A Sjoebom
Original Assignee
Sca Project Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sca Project AbfiledCriticalSca Project Ab
Priority to SE13277/72ApriorityCriticalpatent/SE363896B/xx
Priority to FI3207/73Aprioritypatent/FI56450C/fi
Publication of SE363896BpublicationCriticalpatent/SE363896B/xx
G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B11/00—Measuring arrangements characterised by the use of optical techniques
G—PHYSICS
G01—MEASURING; TESTING
G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B11/00—Measuring arrangements characterised by the use of optical techniques
G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means