SE340126B - - Google Patents
Info
- Publication number
- SE340126B SE340126B SE11495/66A SE1149566A SE340126B SE 340126 B SE340126 B SE 340126B SE 11495/66 A SE11495/66 A SE 11495/66A SE 1149566 A SE1149566 A SE 1149566A SE 340126 B SE340126 B SE 340126B
- Authority
- SE
- Sweden
- Prior art keywords
- sampling system
- heading
- aug
- dec
- texas instruments
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Medicines Containing Antibodies Or Antigens For Use As Internal Diagnostic Agents (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
- Measuring Fluid Pressure (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US51216865A | 1965-12-07 | 1965-12-07 |
Publications (1)
Publication Number | Publication Date |
---|---|
SE340126B true SE340126B (it) | 1971-11-08 |
Family
ID=24037972
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SE11495/66A SE340126B (it) | 1965-12-07 | 1966-08-25 |
Country Status (5)
Country | Link |
---|---|
US (1) | US3529249A (it) |
DE (1) | DE1541869C3 (it) |
FR (1) | FR1508125A (it) |
GB (1) | GB1160970A (it) |
SE (1) | SE340126B (it) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3576494A (en) * | 1967-07-13 | 1971-04-27 | Rca Corp | Digital computer controlled test system |
US3667041A (en) * | 1969-12-04 | 1972-05-30 | Blh Electronics | Automatic zero circuitry for indicating devices |
US3665506A (en) * | 1970-02-04 | 1972-05-23 | Bendix Corp | Electrical apparatus and gaging device using same |
US3771056A (en) * | 1971-07-30 | 1973-11-06 | Tektronix Inc | Display baseline stabilization circuit |
KR102509819B1 (ko) * | 2015-11-04 | 2023-03-14 | 삼성전자주식회사 | 신호 처리 장치 및 신호 처리 방법 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2468684A (en) * | 1946-07-23 | 1949-04-26 | John D Nagel | Ball game device with annular pocketed trough |
US2946013A (en) * | 1956-07-13 | 1960-07-19 | Atomic Energy Authority Uk | Voltage measuring circuits |
US3007112A (en) * | 1958-10-24 | 1961-10-31 | Electronic Instr Ltd | Electrical indicating or measuring instruments |
US3011129A (en) * | 1959-08-10 | 1961-11-28 | Hewlett Packard Co | Plural series gate sampling circuit using positive feedback |
US3010071A (en) * | 1960-05-19 | 1961-11-21 | Hewlett Packard Co | Sweep circuit |
US3119984A (en) * | 1960-12-22 | 1964-01-28 | Ibm | Analog voltage memory |
US3248655A (en) * | 1962-05-07 | 1966-04-26 | Tektronix Inc | Ratchet memory circuit and sampling system employing such circuit |
GB1051903A (it) * | 1963-02-18 | |||
US3244989A (en) * | 1963-08-13 | 1966-04-05 | Hewlett Packard Co | Oscilloscope sweep circuits |
-
1965
- 1965-12-07 US US512168A patent/US3529249A/en not_active Expired - Lifetime
-
1966
- 1966-08-24 DE DE1541869A patent/DE1541869C3/de not_active Expired
- 1966-08-24 GB GB37971/66A patent/GB1160970A/en not_active Expired
- 1966-08-25 SE SE11495/66A patent/SE340126B/xx unknown
- 1966-08-25 FR FR74089A patent/FR1508125A/fr not_active Expired
Also Published As
Publication number | Publication date |
---|---|
GB1160970A (en) | 1969-08-13 |
DE1541869A1 (de) | 1970-01-22 |
DE1541869C3 (de) | 1973-12-13 |
FR1508125A (fr) | 1968-01-05 |
US3529249A (en) | 1970-09-15 |
DE1541869B2 (de) | 1973-05-24 |
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