SE340126B - - Google Patents

Info

Publication number
SE340126B
SE340126B SE11495/66A SE1149566A SE340126B SE 340126 B SE340126 B SE 340126B SE 11495/66 A SE11495/66 A SE 11495/66A SE 1149566 A SE1149566 A SE 1149566A SE 340126 B SE340126 B SE 340126B
Authority
SE
Sweden
Prior art keywords
sampling system
heading
aug
dec
texas instruments
Prior art date
Application number
SE11495/66A
Other languages
English (en)
Inventor
L Jasper
H Phelps
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of SE340126B publication Critical patent/SE340126B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Measuring Fluid Pressure (AREA)
  • Medicines Containing Antibodies Or Antigens For Use As Internal Diagnostic Agents (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
SE11495/66A 1965-12-07 1966-08-25 SE340126B (en, 2012)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US51216865A 1965-12-07 1965-12-07

Publications (1)

Publication Number Publication Date
SE340126B true SE340126B (en, 2012) 1971-11-08

Family

ID=24037972

Family Applications (1)

Application Number Title Priority Date Filing Date
SE11495/66A SE340126B (en, 2012) 1965-12-07 1966-08-25

Country Status (5)

Country Link
US (1) US3529249A (en, 2012)
DE (1) DE1541869C3 (en, 2012)
FR (1) FR1508125A (en, 2012)
GB (1) GB1160970A (en, 2012)
SE (1) SE340126B (en, 2012)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3576494A (en) * 1967-07-13 1971-04-27 Rca Corp Digital computer controlled test system
US3667041A (en) * 1969-12-04 1972-05-30 Blh Electronics Automatic zero circuitry for indicating devices
US3665506A (en) * 1970-02-04 1972-05-23 Bendix Corp Electrical apparatus and gaging device using same
US3771056A (en) * 1971-07-30 1973-11-06 Tektronix Inc Display baseline stabilization circuit
KR102509819B1 (ko) * 2015-11-04 2023-03-14 삼성전자주식회사 신호 처리 장치 및 신호 처리 방법

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2468684A (en) * 1946-07-23 1949-04-26 John D Nagel Ball game device with annular pocketed trough
US2946013A (en) * 1956-07-13 1960-07-19 Atomic Energy Authority Uk Voltage measuring circuits
US3007112A (en) * 1958-10-24 1961-10-31 Electronic Instr Ltd Electrical indicating or measuring instruments
US3011129A (en) * 1959-08-10 1961-11-28 Hewlett Packard Co Plural series gate sampling circuit using positive feedback
US3010071A (en) * 1960-05-19 1961-11-21 Hewlett Packard Co Sweep circuit
US3119984A (en) * 1960-12-22 1964-01-28 Ibm Analog voltage memory
US3248655A (en) * 1962-05-07 1966-04-26 Tektronix Inc Ratchet memory circuit and sampling system employing such circuit
GB1051903A (en, 2012) * 1963-02-18
US3244989A (en) * 1963-08-13 1966-04-05 Hewlett Packard Co Oscilloscope sweep circuits

Also Published As

Publication number Publication date
DE1541869C3 (de) 1973-12-13
DE1541869B2 (de) 1973-05-24
FR1508125A (fr) 1968-01-05
US3529249A (en) 1970-09-15
DE1541869A1 (de) 1970-01-22
GB1160970A (en) 1969-08-13

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