SE320825B - - Google Patents

Info

Publication number
SE320825B
SE320825B SE1578/65A SE157865A SE320825B SE 320825 B SE320825 B SE 320825B SE 1578/65 A SE1578/65 A SE 1578/65A SE 157865 A SE157865 A SE 157865A SE 320825 B SE320825 B SE 320825B
Authority
SE
Sweden
Application number
SE1578/65A
Inventor
N Agdur
Original Assignee
N Agdur
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by N Agdur filed Critical N Agdur
Priority to SE1578/65A priority Critical patent/SE320825B/xx
Priority to GB22261/65A priority patent/GB1106185A/en
Priority to US458861A priority patent/US3458808A/en
Priority to FI651281A priority patent/FI45901C/en
Priority to DE1573968A priority patent/DE1573968C3/en
Priority to FR18766A priority patent/FR1434867A/en
Priority to CH748165A priority patent/CH430281A/en
Publication of SE320825B publication Critical patent/SE320825B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/04—Investigating moisture content
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/223—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance for determining moisture content, e.g. humidity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
SE1578/65A 1964-05-29 1965-02-08 SE320825B (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
SE1578/65A SE320825B (en) 1965-02-08 1965-02-08
GB22261/65A GB1106185A (en) 1964-05-29 1965-05-25 Device for measuring a property of a material
US458861A US3458808A (en) 1964-05-29 1965-05-26 Apparatus for measuring the properties of a material by resonance techniques
FI651281A FI45901C (en) 1964-05-29 1965-05-28 Device for measuring such property of a material, which can be caused to affect the resonant properties of a microwave circuit.
DE1573968A DE1573968C3 (en) 1964-05-29 1965-05-28 Device for measuring a material property
FR18766A FR1434867A (en) 1964-05-29 1965-05-28 Device for measuring the properties of a material
CH748165A CH430281A (en) 1964-05-29 1965-05-29 Device for measuring material properties

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE1578/65A SE320825B (en) 1965-02-08 1965-02-08

Publications (1)

Publication Number Publication Date
SE320825B true SE320825B (en) 1970-02-16

Family

ID=20258441

Family Applications (1)

Application Number Title Priority Date Filing Date
SE1578/65A SE320825B (en) 1964-05-29 1965-02-08

Country Status (1)

Country Link
SE (1) SE320825B (en)

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