SE310727B - - Google Patents
Info
- Publication number
- SE310727B SE310727B SE7506/61A SE750661A SE310727B SE 310727 B SE310727 B SE 310727B SE 7506/61 A SE7506/61 A SE 7506/61A SE 750661 A SE750661 A SE 750661A SE 310727 B SE310727 B SE 310727B
- Authority
- SE
- Sweden
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
- G01R23/10—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into a train of pulses, which are then counted, i.e. converting the signal into a square wave
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/542—Controlling the film thickness or evaporation rate
- C23C14/545—Controlling the film thickness or evaporation rate using measurement on deposited material
- C23C14/546—Controlling the film thickness or evaporation rate using measurement on deposited material using crystal oscillators
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B1/00—Comparing elements, i.e. elements for effecting comparison directly or indirectly between a desired value and existing or anticipated values
- G05B1/01—Comparing elements, i.e. elements for effecting comparison directly or indirectly between a desired value and existing or anticipated values electric
- G05B1/04—Comparing elements, i.e. elements for effecting comparison directly or indirectly between a desired value and existing or anticipated values electric with sensing of the position of the pointer of a measuring instrument
- G05B1/08—Comparing elements, i.e. elements for effecting comparison directly or indirectly between a desired value and existing or anticipated values electric with sensing of the position of the pointer of a measuring instrument stepwise sensing
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D5/00—Control of dimensions of material
- G05D5/02—Control of dimensions of material of thickness, e.g. of rolled material
- G05D5/03—Control of dimensions of material of thickness, e.g. of rolled material characterised by the use of electric means
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Feedback Control In General (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CH837060A CH387752A (de) | 1960-07-21 | 1960-07-21 | Verfahren und Einrichtung zur Regelung einer durch elektrische Schwingungen veränderliche Frequenz dargestellten Grösse eines Vorganges |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SE310727B true SE310727B (forum.php) | 1969-05-12 |
Family
ID=4339264
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SE7506/61A SE310727B (forum.php) | 1960-07-21 | 1961-07-20 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3227952A (forum.php) |
| CH (1) | CH387752A (forum.php) |
| GB (1) | GB964343A (forum.php) |
| SE (1) | SE310727B (forum.php) |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1020756A (en) * | 1961-11-07 | 1966-02-23 | Nihon Genshiryoku Kenkyu Sho | System for measuring the period of a nuclear reactor using frequency conversion or period conversion |
| GB1073293A (en) * | 1963-10-16 | 1967-06-21 | Edwards High Vacuum Int Ltd | Apparatus for controlling vapour deposition in a vacuum |
| US3400331A (en) * | 1965-01-18 | 1968-09-03 | Pratt & Whitney Inc | Gaging device including a probe having a plurality of concentric and coextensive electrodes |
| US3383604A (en) * | 1966-05-09 | 1968-05-14 | Navy Usa | Double threshold detection system |
| US3488758A (en) * | 1966-09-14 | 1970-01-06 | Kingsbury Technology Inc | Apparatus for measuring a property of a material while processing it between movable members containing electrodes coupled to an oscillatory circuit |
| DE2112063A1 (de) * | 1970-03-13 | 1971-11-11 | Gen Eng Radcliffe | Verfahren und Vorrichtung zur digitalen Messung und Darstellung eine AEnderung oder AEnderungsgeschwindigkeit der Frequenz eines Impulszuges |
| US3689747A (en) * | 1970-12-09 | 1972-09-05 | Ibm | Digital evaporation monitor system |
| US3704414A (en) * | 1971-01-18 | 1972-11-28 | Bogue Elec Mfg Co | Frequency meter |
| DE2158320B2 (de) * | 1971-11-24 | 1980-04-10 | Ferdy Dr. Grenoble Mayer (Frankreich) | Vorrichtung zur berührungsfreien relativen Abstandsmessung |
| US3939413A (en) * | 1974-09-13 | 1976-02-17 | General Electric Company | Low cutoff digital pulse filter especially useful in electronic energy consumption meters |
| JPS5233558A (en) * | 1975-09-10 | 1977-03-14 | Hiromi Ogasawara | Detector for minute variations |
| JPS54141657A (en) * | 1978-04-26 | 1979-11-05 | Hiromi Ogasawara | Device for measuring displacement of moving body |
| JPS5575614A (en) * | 1978-12-04 | 1980-06-07 | Hiromi Ogasawara | Amount of movement measuring unit for straight movement mobile body |
| JPS5537958A (en) * | 1978-09-11 | 1980-03-17 | Hiromi Ogasawara | Rotation angle detector |
| JPS5562310A (en) * | 1978-10-20 | 1980-05-10 | Hiromi Ogasawara | Direct-acting type displacement detector |
| US4287470A (en) * | 1979-02-12 | 1981-09-01 | Mem Muszaki Intezet | Digital humidimeter |
| US4300093A (en) * | 1979-12-03 | 1981-11-10 | Ogasawara Hiromi | Device for measuring the amount of rotation of a rotating object |
| US6161420A (en) * | 1997-11-12 | 2000-12-19 | Fisher Controls International, Inc. | High frequency measuring circuit |
| JP2009250807A (ja) * | 2008-04-07 | 2009-10-29 | Seiko Epson Corp | 周波数測定装置及び測定方法 |
| JP2010271091A (ja) * | 2009-05-20 | 2010-12-02 | Seiko Epson Corp | 周波数測定装置 |
| JP5440999B2 (ja) * | 2009-05-22 | 2014-03-12 | セイコーエプソン株式会社 | 周波数測定装置 |
| JP5517033B2 (ja) * | 2009-05-22 | 2014-06-11 | セイコーエプソン株式会社 | 周波数測定装置 |
| JP5582447B2 (ja) * | 2009-08-27 | 2014-09-03 | セイコーエプソン株式会社 | 電気回路、同電気回路を備えたセンサーシステム、及び同電気回路を備えたセンサーデバイス |
| JP5815918B2 (ja) * | 2009-10-06 | 2015-11-17 | セイコーエプソン株式会社 | 周波数測定方法、周波数測定装置及び周波数測定装置を備えた装置 |
| JP5876975B2 (ja) * | 2009-10-08 | 2016-03-02 | セイコーエプソン株式会社 | 周波数測定装置及び周波数測定装置における変速分周信号の生成方法 |
| JP5883558B2 (ja) | 2010-08-31 | 2016-03-15 | セイコーエプソン株式会社 | 周波数測定装置及び電子機器 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2414479A (en) * | 1942-11-05 | 1947-01-21 | Bell Telephone Labor Inc | Impulse generator |
| US2411298A (en) * | 1945-02-12 | 1946-11-19 | Philips Corp | Piezoelectric crystal |
| US2768629A (en) * | 1953-09-24 | 1956-10-30 | American Mach & Foundry | Moisture measuring method and apparatus |
| US2880612A (en) * | 1955-04-21 | 1959-04-07 | Coyne Andre | Measurement of physical quantities with the aid of apparatus which converts the saidquantities into variations of oscillation frequency |
| US2902765A (en) * | 1956-07-02 | 1959-09-08 | Hughes Aircraft Co | Bridge circuit for position measuring device |
| US3006547A (en) * | 1957-02-27 | 1961-10-31 | Jean Faure Herman | Frequency dividing circuits |
| US2991416A (en) * | 1958-05-06 | 1961-07-04 | Herbert O Ramp | Frequency shift measuring device |
-
1960
- 1960-07-21 CH CH837060A patent/CH387752A/de unknown
- 1960-12-22 US US77611A patent/US3227952A/en not_active Expired - Lifetime
-
1961
- 1961-07-03 GB GB23878/61A patent/GB964343A/en not_active Expired
- 1961-07-20 SE SE7506/61A patent/SE310727B/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| CH387752A (de) | 1965-02-15 |
| US3227952A (en) | 1966-01-04 |
| GB964343A (en) | 1964-07-22 |