SE1830093A1 - High Spectral Resolution Scheimpflug Lidar - Google Patents

High Spectral Resolution Scheimpflug Lidar

Info

Publication number
SE1830093A1
SE1830093A1 SE1830093A SE1830093A SE1830093A1 SE 1830093 A1 SE1830093 A1 SE 1830093A1 SE 1830093 A SE1830093 A SE 1830093A SE 1830093 A SE1830093 A SE 1830093A SE 1830093 A1 SE1830093 A1 SE 1830093A1
Authority
SE
Sweden
Prior art keywords
light
gas
sensor
image
axis
Prior art date
Application number
SE1830093A
Other versions
SE541185C2 (en
Inventor
Mikkel Brydegaard
Original Assignee
Neolund Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Neolund Ab filed Critical Neolund Ab
Priority to SE1830093A priority Critical patent/SE1830093A1/en
Priority to US16/623,743 priority patent/US11169272B2/en
Priority to EP18831597.2A priority patent/EP3652523A4/en
Priority to US16/623,749 priority patent/US11536849B2/en
Priority to PCT/SE2018/050768 priority patent/WO2019013698A1/en
Priority to EP18831056.9A priority patent/EP3652522A4/en
Priority to PCT/SE2018/050769 priority patent/WO2019013699A1/en
Publication of SE541185C2 publication Critical patent/SE541185C2/en
Publication of SE1830093A1 publication Critical patent/SE1830093A1/en
Priority to US17/504,998 priority patent/US11768295B2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/95—Lidar systems specially adapted for specific applications for meteorological use
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4709—Backscatter
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02A—TECHNOLOGIES FOR ADAPTATION TO CLIMATE CHANGE
    • Y02A90/00—Technologies having an indirect contribution to adaptation to climate change
    • Y02A90/10—Information and communication technologies [ICT] supporting adaptation to climate change, e.g. for weather forecasting or climate simulation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

A method is provided for detecting a property of a gas comprising: emitting a light, comprising a plurality of wavelengths covering a plurality of absorption lines of the gas, along a first axis, the light being scattered by particles of the gas resulting in a scattered light, generating a sensor image using a detection arrangement configured to receive the scattered light and comprising: an optical arrangement having an optical plane and being configured to direct the scattered light on to a light sensor, the light sensor having at least one pixel columns, wherein the pixel columns are aligned to an image plane and configured to output a sensor image, wherein the first axis, the optical plane, and the image plane intersect such that a Scheimpflug condition is achieved, determining, from the sensor image, properties of the gas at a plurality of positions along the first axis.
SE1830093A 2017-07-14 2018-03-21 High Spectral Resolution Scheimpflug Lidar SE1830093A1 (en)

Priority Applications (8)

Application Number Priority Date Filing Date Title
SE1830093A SE1830093A1 (en) 2018-03-21 2018-03-21 High Spectral Resolution Scheimpflug Lidar
US16/623,743 US11169272B2 (en) 2017-07-14 2018-07-14 High spectral resolution Scheimpflug LIDAR
EP18831597.2A EP3652523A4 (en) 2017-07-14 2018-07-14 High spectral resolution scheimpflug lidar
US16/623,749 US11536849B2 (en) 2017-07-14 2018-07-14 High resolution molecular LIDAR
PCT/SE2018/050768 WO2019013698A1 (en) 2017-07-14 2018-07-14 High spectral resolution scheimpflug lidar
EP18831056.9A EP3652522A4 (en) 2017-07-14 2018-07-14 High resolution molecular lidar
PCT/SE2018/050769 WO2019013699A1 (en) 2017-07-14 2018-07-14 High resolution molecular lidar
US17/504,998 US11768295B2 (en) 2017-07-14 2021-10-19 High spectral resolution Scheimpflug LIDAR

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE1830093A SE1830093A1 (en) 2018-03-21 2018-03-21 High Spectral Resolution Scheimpflug Lidar

Publications (2)

Publication Number Publication Date
SE541185C2 SE541185C2 (en) 2019-04-23
SE1830093A1 true SE1830093A1 (en) 2019-04-23

Family

ID=66167775

Family Applications (1)

Application Number Title Priority Date Filing Date
SE1830093A SE1830093A1 (en) 2017-07-14 2018-03-21 High Spectral Resolution Scheimpflug Lidar

Country Status (1)

Country Link
SE (1) SE1830093A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113075684A (en) * 2021-04-06 2021-07-06 浙江师范大学 Novel Sas atmosphere laser radar based on TDLAS technology

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110317147A1 (en) * 2010-06-23 2011-12-29 U.S.A. As Represented By The Administrator Of The National Aeronautics And Space Administration Time Shifted PN Codes for CW LIDAR, RADAR, and SONAR
WO2012105973A1 (en) * 2011-02-02 2012-08-09 Michigan Aerospace Corporation Atmospheric measurement system and method
US20130314694A1 (en) * 2010-04-20 2013-11-28 Michigan Aerospace Corporation Atmospheric measurement system and method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130314694A1 (en) * 2010-04-20 2013-11-28 Michigan Aerospace Corporation Atmospheric measurement system and method
US20110317147A1 (en) * 2010-06-23 2011-12-29 U.S.A. As Represented By The Administrator Of The National Aeronautics And Space Administration Time Shifted PN Codes for CW LIDAR, RADAR, and SONAR
WO2012105973A1 (en) * 2011-02-02 2012-08-09 Michigan Aerospace Corporation Atmospheric measurement system and method

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
Brydegaard, M., Gebru, A. and Svanberg, S., "Super Resolution Laser Radar with Blinking Atmospheric Particles - Application to Interacting Flying Insects", Prog. Electromagn. Res., vol. 147, pp. 141-151 (2014). *
Liang Mei & Mikkel Brydegaard, "Atmospheric aerosol monitoring by an elastic Scheimpflug Lidar system", Optics Express vol. 23, No. 24 (2015). DOI: 10.1364/OE.23.0A1613 *
Mikkel Brydegaard, Elin Malmqvist, Samuel Jansson, Jim Larsson, Sandra Török, Guangyu Zhao, "The Scheimpflug lidar method," Proc. SPIE 10406, Lidar Remote Sensing for Environmental Monitoring 2017, 104060I (30 August 2017); doi: 10.1117/12.2272939 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113075684A (en) * 2021-04-06 2021-07-06 浙江师范大学 Novel Sas atmosphere laser radar based on TDLAS technology
CN113075684B (en) * 2021-04-06 2023-09-19 浙江师范大学 Novel sand's atmosphere laser radar based on TDLAS technology

Also Published As

Publication number Publication date
SE541185C2 (en) 2019-04-23

Similar Documents

Publication Publication Date Title
WO2016132222A3 (en) Scanning infrared measurement system
MX2019015303A (en) Vehicle with multiple light detection and ranging devices (lidars).
WO2015193804A3 (en) Detector for determining a position of at least one object
MX2019004575A (en) A light detection and ranging (lidar) device having multiple receivers.
WO2018106360A3 (en) Fast scanning lidar with dynamic voxel probing
MX2020008893A (en) Obtaining images for use in determining one or more properties of skin of a subject.
WO2011093523A3 (en) X-ray imaging apparatus and x-ray imaging method
MX348395B (en) Apparatus and method for determining the target position deviation of two bodies.
MX2020004280A (en) Non-invasive substance analysis.
MX366016B (en) Method and apparatus for detecting matter.
IL246806B (en) Diode laser based broad band light sources for wafer inspection tools
WO2016062785A3 (en) Smart photonic imaging method and apparatus
SA519401590B1 (en) Radiation Inspection System and Method
EP2921877A3 (en) Object detection device and remote sensing apparatus
TW201614383A (en) Method of measuring a property of a target structure, inspection apparatus, lithographic system and device manufacturing method
EP4254330A3 (en) Flaw detection device and flaw detection method
WO2015189172A3 (en) Apparatus for determining information associated with reflection characteristics of a surface
JP2015143685A5 (en)
PH12018502032A1 (en) Image processing apparatus, imaging apparatus, and control methods thereof
MY197360A (en) Optical examination device and optical examination method with visible and infrared light for semiconductor components
MX2017015177A (en) Optical device for detecting an internal flaw of a transparent substrate and method for the same.
WO2015132391A3 (en) Imaging device for a microscope
WO2014186476A3 (en) Integrated multi-pass inspection
JP2014524128A5 (en)
WO2017174795A3 (en) Microscope and method for imaging a sample