SE0001679L - Ways of measuring topography in an interface and using the method of a high voltage cable - Google Patents

Ways of measuring topography in an interface and using the method of a high voltage cable

Info

Publication number
SE0001679L
SE0001679L SE0001679A SE0001679A SE0001679L SE 0001679 L SE0001679 L SE 0001679L SE 0001679 A SE0001679 A SE 0001679A SE 0001679 A SE0001679 A SE 0001679A SE 0001679 L SE0001679 L SE 0001679L
Authority
SE
Sweden
Prior art keywords
interface
voltage cable
ways
high voltage
mhz
Prior art date
Application number
SE0001679A
Other languages
Unknown language ( )
Swedish (sv)
Other versions
SE0001679D0 (en
Inventor
Anders Ericsson
Carl-Olof Olsson
Johan Palm
Original Assignee
Abb Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Abb Ab filed Critical Abb Ab
Priority to SE0001679A priority Critical patent/SE0001679L/en
Publication of SE0001679D0 publication Critical patent/SE0001679D0/en
Priority to AU60869/01A priority patent/AU6086901A/en
Priority to PCT/SE2001/000979 priority patent/WO2001086280A1/en
Publication of SE0001679L publication Critical patent/SE0001679L/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • G01B17/06—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
    • G01N29/348—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with frequency characteristics, e.g. single frequency signals, chirp signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36—Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/40—Detecting the response signal, e.g. electronic circuits specially adapted therefor by amplitude filtering, e.g. by applying a threshold or by gain control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S15/00—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems
    • G01S15/88—Sonar systems specially adapted for specific applications
    • G01S15/89—Sonar systems specially adapted for specific applications for mapping or imaging
    • G01S15/8906—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques
    • G01S15/8909—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques using a static transducer configuration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids
    • G01N2291/0231—Composite or layered materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/26—Scanned objects
    • G01N2291/263—Surfaces
    • G01N2291/2634—Surfaces cylindrical from outside

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Remote Sensing (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Acoustics & Sound (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Testing Relating To Insulation (AREA)

Abstract

A method, in a high-voltage cable (1) comprising a central conductor (2) consisting of one or more strands (2a), an inner semiconductive layer (3) and a surrounding insulating layer (4), of measuring the topography (3a, 3c, 3d, 3e, 3f, 3g) at the interface between the inner semiconductive layer (3) and the insulating layer (4). Ultrasound with a frequency of between 0.1 MHz and 20 MHz, preferably between 0.5 MHz and 5 MHz, is used.
SE0001679A 2000-05-08 2000-05-08 Ways of measuring topography in an interface and using the method of a high voltage cable SE0001679L (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
SE0001679A SE0001679L (en) 2000-05-08 2000-05-08 Ways of measuring topography in an interface and using the method of a high voltage cable
AU60869/01A AU6086901A (en) 2000-05-08 2001-05-04 A method of measuring topography in an interface and use of the method for a high-voltage cable
PCT/SE2001/000979 WO2001086280A1 (en) 2000-05-08 2001-05-04 A method of measuring topography in an interface and use of the method for a high-voltage cable

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0001679A SE0001679L (en) 2000-05-08 2000-05-08 Ways of measuring topography in an interface and using the method of a high voltage cable

Publications (2)

Publication Number Publication Date
SE0001679D0 SE0001679D0 (en) 2000-05-08
SE0001679L true SE0001679L (en) 2001-05-21

Family

ID=20279578

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0001679A SE0001679L (en) 2000-05-08 2000-05-08 Ways of measuring topography in an interface and using the method of a high voltage cable

Country Status (3)

Country Link
AU (1) AU6086901A (en)
SE (1) SE0001679L (en)
WO (1) WO2001086280A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8958994B2 (en) 2009-05-05 2015-02-17 Actuant Corporation Non-contact acoustic signal propagation property evaluation of synthetic fiber rope
CN106546933B (en) 2015-09-17 2020-11-27 上海联影医疗科技股份有限公司 Radio frequency coil assembly for magnetic resonance imaging
CN105738474B (en) * 2016-04-14 2018-10-30 华南理工大学 One kind is towards the needle-shaped formula ultrasonic guided wave detection device of twisted wire structural damage and method

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3857091A (en) * 1972-07-24 1974-12-24 Continental Copper & Steel Ind Apparatus having ultrasonic transducer for detecting cable dielectric faults
US3929006A (en) * 1973-11-26 1975-12-30 Western Electric Co Measuring article thickness ultrasonically
JPS5737243A (en) * 1980-08-18 1982-03-01 Central Res Inst Of Electric Power Ind Method of detecting soft spot for tape wound insulated cable
US4738139A (en) * 1987-01-09 1988-04-19 Blessing Gerald V Ultrasonic real-time monitoring device for part surface topography and tool condition in situ
US5258922A (en) * 1989-06-12 1993-11-02 Wieslaw Bicz Process and device for determining of surface structures
US5795531A (en) * 1991-04-09 1998-08-18 Zumbach Electronic Ag Method and apparatus for the cross-sectional measurement of electric insulated conductors
NO179926C (en) * 1993-04-02 1998-03-11 Red Band As Procedures for automatic condition checking, inspection, cleaning and / or surface treatment of structures, in particular thickness measurement of plate structures and pipes
NO302915B1 (en) * 1996-09-18 1998-05-04 Alcatel Kabel Norge As Cable test equipment

Also Published As

Publication number Publication date
AU6086901A (en) 2001-11-20
WO2001086280A1 (en) 2001-11-15
SE0001679D0 (en) 2000-05-08

Similar Documents

Publication Publication Date Title
FI962715A0 (en) Coaxial high frequency cable and its insulation
IS5516A (en) The dry-line gel composition, the use of such a dry-line gel formulation, an isolated electric current cable comprising such a gel composition, and a method of producing an isolated electric current cable comprising such a gel composition
AU1989100A (en) Impedance measurements of bodily matter
EA199801055A1 (en) ISOLATED CONDUCTOR FOR HIGH-VOLTAGE WINDOWS AND METHOD FOR ITS MANUFACTURE
ATE244449T1 (en) POWER TRANSFORMER/INDUCTANCER
DE69923086D1 (en) USE OF AN ELECTRICAL INSULATION RESIN MATERIAL AND ELECTRICAL CABLE AND CABLE THEREOF USED THEREOF
DE69515327D1 (en) INSULATED ELECTRICAL DEVICES
SE0001679L (en) Ways of measuring topography in an interface and using the method of a high voltage cable
IL137212A (en) Semiconductor device having insulating film of fluorine-added carbon film and method of producing the same
GB0216503D0 (en) Apparatus for the high voltage testing of insulated conductors and oscillator circuit for use with same
ATE544213T1 (en) CABLE CONNECTOR OF A CONNECTION DEVICE FOR MEDIUM AND HIGH VOLTAGE TECHNOLOGY
EA199801049A1 (en) INSULATED CONDUCTOR FOR HIGH-VOLTAGE WINDINGS
SE0200179L (en) Electric machine and its use
SE0002243D0 (en) Ways of measuring topography in an interface and using the method of a high voltage cable
TW200616054A (en) Semiconductor devices and methods of making
SE9701156L (en) Method and apparatus for semiconductor components
DE50213331D1 (en) HIGH VOLTAGE IMPLEMENTATION
Yasui et al. RI, TVI and AN characteristics of HVDC insulator assemblies under contaminated condition
SE9700335L (en) A power transformer / reactor
DE69603549T2 (en) Encapsulated electrical devices, protected against overvoltages
DE69601837T2 (en) Aluminum conductor with improved electrical contact properties and method of manufacturing the same
SE9700347L (en) Method and apparatus for reducing third-party phenomena in direct connection of AC machines
SE9804084D0 (en) Transformer, reactor
SE9602077D0 (en) Methods of insulating an electrical conductor, insulated electrical conductor and electrical device comprising insulated electrical conductor
TW356606B (en) Inductor for semiconductor device and method of making the same

Legal Events

Date Code Title Description
NAV Patent application has lapsed

Ref document number: 0001679-0

Format of ref document f/p: F