RU2353002C2 - Method for high-resolution optoelectronic touch screen testing (versions) for touch-point and system therefor (versions) - Google Patents

Abstract

FIELD: information systems.

SUBSTANCE: group of inventions concerns sensor data input technology. According to the methods, rough touch-point is pre-evaluated to be adjusted by emitter assembly to be control-activated while arranged along the sides of the touch screen, and by receiver assembly to be control-activated while arranged along the sides of the touch screen opposite to emitters. Receivers and emitters are adapted to each other to form variety of set parallel detector rays coordinate-spaced. Touch-point is resulted from the set detector rays formed of the specified variety of set parallel detector rays and configured set detector rays formed of from detector rays from set parallel detector rays.

EFFECT: ensured touch point adjustment of the touch screen resulted from pre-configuration of detector rays from set parallel detector rays thus reducing system response time.

10 cl, 16 dwg

Description

The present invention relates to the field of technology of touch data input and can be used in the development of optoelectronic sensor systems, characterized by high resolution and short response time.

Sensor systems are increasingly used in everyday activities. They are widely used in information kiosks, automated process control systems, medical equipment, in military equipment, as well as in entertainment multimedia systems. Moreover, the most important factors determining the use of sensor systems are their cost, resolution and response time.

Known input device with a touch panel in accordance with patent US 4689446 [1]. The touch panel includes many pairs of infrared (IR) emitters and receivers arranged on mutually opposite sides, means of sequential activation of emitters and receivers along the x-coordinate and y-coordinate axes, and a processor. The touchpad touch location is estimated based on the sequential activation of each emitter and the opposite receiver along the x-coordinate and y-coordinate axes.

A disadvantage of the known method and device is the limited resolution and its dependence on the number of emitter-receiver pairs used in the device.

The closest in technical essence to the present invention in terms of essential features are a system and method for determining the touch position of a touch screen with high resolution in accordance with patent US 6429857 [2]. The system and method is based on a preliminary assessment of the location of the touch and subsequent refinement of the location of the touch.

One embodiment of the method is that the touch screen has a plurality of infrared emitters located along the first and second adjacent sides, and a plurality of infrared receivers located along the third and fourth adjacent sides opposite the plurality of infrared emitters so that each emitter is aligned on-axis (coaxial) with one receiver, and the method includes the following operations:

- evaluate the rough touch location based on the systematic on-axis activation of each infrared emitter and the opposite receiver, and

- specify the location of the touch based on the systematic off-axis (misaligned) activation of the selected infrared emitters and receivers.

Another embodiment of the method is that the touch screen has a plurality of infrared emitters located along the first and second adjacent sides, and a plurality of infrared receivers located along the third and fourth adjacent sides opposite the plurality of infrared emitters, so that each emitter is aligned on-axis with one receiver, and the method includes the following operations:

- evaluate the rough touch location based on the systematic on-axis activation of each infrared emitter and the opposing receiver,

- select the off-axis pairs of the emitter-receiver based on the rough estimate of the location of the touch and

- specify the location of the touch based on the systematic activation of the selected off-axis pairs of the emitter-receiver.

Another embodiment of the method is that the touch screen has a first set of x-coordinate infrared emitters along the x-coordinate side, a second set of y-coordinate infrared emitters along the y-coordinate side, the first set of infrared receivers along two sides opposite the infrared emitters, moreover, each emitter is aligned on-axis with one receiver, and the method includes the following operations:

- evaluate the rough x-coordinate and y-coordinate location of the touch of the touch screen based on the systematic on-axis activation of each infrared emitter and the opposing receiver,

- choose off-axis x-coordinate pairs of the emitter-receiver based on the assessment of the rough y-coordinate location of the touch,

- specify the x-coordinate location of the touch based on the systematic activation of the selected off-axis x-coordinate pairs of the emitter-receiver;

- select the off-axis y-coordinate pairs of the emitter-receiver based on the assessment of the rough x-coordinate location of the touch; and

- specify the y-coordinate location of the touch based on the systematic activation of the selected off-axis y-coordinate pairs of the emitter-receiver.

A further embodiment of the method is that said screen has a first plurality of x-coordinate infrared emitters along the x-coordinate side, a second plurality of y-coordinate infrared emitters along the y-coordinate side, a plurality of infrared receivers along two sides opposing the plurality of infrared emitters, each activated infrared emitter forms an infrared ray perceived by the on-axis receiver and at least one receiver adjacent to the on-axis receiver, and sp GSS comprises the following steps:

- identify the coarse x-coordinate and y-coordinate touch areas based on the identification of blocked detector beams between the activated x-coordinate and y-coordinate emitters and receivers based on the sequential activation of each on-axis x-coordinate infrared emitter and the opposing receiver and each on -axis y-axis infrared emitter and opposing receiver,

- compute the coarse x-coordinate and y-coordinate touch area from the identified coarse x-coordinate and y-coordinate touch areas and

- specify the x-coordinate and y-coordinate location of the touch based on the systematic activation of the off-axis pairs of the emitter-receiver having infrared rays intersecting the calculated rough touch area.

One embodiment of a system for determining the location of a touch of a touch screen includes:

- the first set of infrared emitters located along the first side of the touch screen, and each infrared emitter from the specified set of infrared emitters controllably emits a cone of infrared light,

- the first set of infrared receivers located along the second side of the touch screen opposite the first set of infrared emitters, with each receiver of the first set of infrared receivers aligned on-axis with one infrared emitter from the first set of infrared emitters and off-axis with each other emitter from the first set infrared emitters,

a second plurality of infrared emitters arranged along a third side of the touch screen approximately perpendicular to the first side of the touch screen, each infrared emitter of the second plurality of infrared emitters emitting a cone of infrared light controllably,

- a second set of infrared receivers located along the fourth side of the touch screen opposite the second set of emitters, with each receiver of the second set of infrared receivers aligned on-axis with one infrared emitter from the second set of infrared emitters and off-axis with each other emitter from the second set of emitters ,

- a processor configured to manage the activation of the named set of infrared emitters and manage the activation of the named set of infrared receivers, calculate the touch position of the touch screen based on on-axis and off-axis activation of the infrared emitters and receivers, and when calculating the touch position of the touch screen, the processor

- estimates rough touch location based on sequential on-axis activation of each infrared emitter and the opposite receiver;

- selects the off-axis pairs of the emitter-receiver based on the rough estimate of the location of the touch and

- clarifies the location of the touch based on the sequential activation of the selected off-axis pairs of the emitter-receiver.

Another embodiment of a system for determining the location of a touch of a touch screen includes:

- the first set of infrared emitters located along the first side of the touch screen, and each infrared emitter from the specified set of infrared emitters controllably emits a cone of infrared light,

- the first set of infrared receivers located along the second side of the touch screen opposite the first set of infrared emitters, with each receiver of the first set of infrared receivers aligned on-axis with one infrared emitter from the first set of infrared emitters and off-axis with each other emitter from the first set infrared emitters,

a second plurality of infrared emitters arranged along a third side of the touch screen approximately perpendicular to the first side of the touch screen, each infrared emitter of the second plurality of infrared emitters emitting a cone of infrared light controllably,

- a second set of infrared receivers located along the fourth side of the touch screen opposite the second set of emitters, with each receiver of the second set of infrared receivers aligned on-axis with one infrared emitter from the second set of infrared emitters and off-axis with each other emitter from the second set of emitters ,

- a processor configured to manage the activation of the named set of infrared emitters and manage the activation of the named set of infrared receivers, calculate the touch position of the touch screen based on on-axis and off-axis activation of the infrared emitters and receivers, and when calculating the touch position of the touch screen, the processor

- estimates the rough x-coordinate and y-coordinate location of the touch screen touch based on the sequential on-axis activation of each infrared emitter and the opposite receiver,

- selects the off-axis x-coordinate pairs of the emitter-receiver based on the evaluation of the rough y-coordinate location of the touch,

- clarifies the x-coordinate location of the touch based on the systematic activation of the selected off-axis x-coordinate pairs of the emitter-receiver,

- selects the off-axis y-coordinate pairs of the emitter-receiver based on the rough rough x-coordinate location of the touch and

- clarifies the y-coordinate location of the touch based on the systematic activation of the selected off-axis y-coordinate pairs of the emitter-receiver.

Another embodiment of a system for determining the location of a touch of a touch screen includes:

- the first set of infrared emitters located along the first side of the touch screen, and each infrared emitter from the first set of infrared emitters controllably emits infrared light,

a first plurality of infrared receivers located along the second side of the touch screen opposite the first plurality of emitters, each receiver of the first plurality of infrared receivers aligned on-axis with one infrared emitter from the first plurality of emitters and off-axis with each other emitter from the first plurality of emitters, and additionally the infrared ray emitted by each emitter from the first plurality of infrared emitters is perceived by at least two infrared receivers from the first a plurality of infrared receivers

- the second set of infrared emitters located along the third side of the touch screen, and each infrared emitter from the second set of infrared emitters controllably emits infrared light,

a second plurality of infrared receivers located along the fourth side of the touch screen opposite the second plurality of emitters, wherein each emitter from the second plurality of infrared receivers is aligned on-axis with one infrared emitter from the second plurality of emitters and off-axis with each other emitter from the second plurality of emitters, and the infrared ray emitted by each emitter from the second set of infrared emitters is perceived by at least two infrared emitters from the second set va infrared receivers

- a first processor for sequentially activating each emitter from the first and second sets of infrared emitters and each receiver from the opposite of the first and second sets of infrared receivers and

- a second processor for calculating a touch position on the touch screen, the second processor:

- identifies a rough x-coordinate touch region based on the identification of blocked detector beams between activated emitters and receivers,

- identify the rough y-coordinate region of contact based on the identification of blocked detector beams between the activated emitters and receivers,

- calculates a rough x-coordinate and y-coordinate touch area from the identified rough x-coordinate and y-coordinate touch areas and

- clarifies the x-coordinate and y-coordinate location of the touch based on the systematic activation of the off-axis pairs of the emitter-receiver having detector beams crossing the calculated rough touch region.

The disadvantage of this method and system is the significant response time, which leads to disturbances in the feedback between the sensor system and the human operator interacting with it, which ultimately leads to a decrease in the functioning efficiency of the entire control system as a whole.

A significant response time of the sensor system implemented in accordance with this invention is due to a number of reasons.

Firstly, the increased resolution provided by the sensor system involves the operation of refining the location of the touch based on the formation of additional refining detector rays, which requires significant computational resources and time-consuming. As follows from Fig.6 to the patent US 6429857 [2], the number of detector rays generated by the sensor system when specifying the location of the touch exceeds the number of rays generated when evaluating the rough location of the touch, more than 2.5 times.

Secondly, the fundamental drawback of this technical solution is the use as a unit of scanning element of a separate detector beam formed by a separate pair of emitter-receiver. Accordingly, each operation of activation of the emitter-receiver pair is preceded by the operation of selecting this pair from the total number of emitter-receiver pairs, guided by a certain criterion. Moreover, the unproductive waste of time spent by the sensor system on the choice of detector rays generated when the location of the touch is refined is directly dependent on the number of refining detector rays and thereby directly affects the duration of the process of refining the location of the touch as a whole. In addition, in a real sensor system, the activation process of each individual emitter-receiver pair is preceded by the initialization procedure. As a rule, the internal interface of small-sized electronic devices, to which the sensor system can be assigned, is a serial interface, for example, SPI or I2C. The use of such an interface makes the initialization time of the emitter-receiver pair almost comparable to the time of the actual formation of the detector beam. It follows that the more the number of detector beams involved in the refinement scan, the longer it takes to select and initialize the activated emitter-receiver pairs and, accordingly, to determine the location of the touch screen touch.

Thirdly, the considered technical solution is characterized by the redundancy of the number of detector rays involved in determining the location of the touch, which is due to the inadequacy of the used criterion for the selection of refinement detector rays to the problem being solved. For example, despite the fact that the location of the touch is refined by eliminating the uncertainty of the location of the borders of the touch, the considered technical solution uses the detection beams to scan the location of the touch, which scan the entire predefined rough touch area. For this reason, part of the detector rays generated when the touch location is specified are not informative and do not provide additional information in relation to the information obtained during the rough touch location estimation stage.

One of the solutions to the problem of reducing response time in this patent is an increase in the computing resources of the sensor system due to the use of two processors in its composition and, thereby, the separation between them of implemented system functions. However, this technique solves the problem at hand with certain costs. Obviously, the use of an additional processor in an unconditional order leads to a significant increase in the cost of the sensor system.

Another solution to this problem is proposed to use the tabular method in the implementation of the procedure for the selection of refinement detector rays, which eliminates resource-intensive computational operations and, thereby, reduce the response time of the sensor system. This method involves the preliminary determination of refinement detector rays as a function of the infrared ray network formed by rough scanning, tabulating the data obtained and storing it in the processor's ROM, followed by sampling during the refinement scan. However, the considered technique also has its drawbacks. So the access time to the ROM (EEPROM) of the memory of general-purpose microcontrollers (for example, microcontrollers of the PIC16Fxxx series), as a rule, exceeds the duration of the operation cycle by the microcontroller by more than an order of magnitude and remains comparable to the duration of the activation cycle of the emitter-receiver pair.

The aim of the proposed variants of the method for determining the location of the touch of the optoelectronic touch screen with high resolution and system options for its implementation is to reduce the response time of the sensor system.

The goal is achieved in that in a method for determining the location of a touch of an optoelectronic touch screen with a higher resolution, which consists in a preliminary assessment of the rough location of the touch and the subsequent refinement of the location of the touch, based on the formation of detector beams by controlled activation of a plurality of infrared emitters located along the sides of the touch screen, and controlled activation of a plurality of infrared receivers located along the sides of the touch screen opposite the infrared emitters,

- said infrared emitters and said infrared receivers are adapted to each other with the possibility of forming a plurality of sets of parallel detector beams, wherein the detector beams of each individual set of the named set of sets of parallel detector beams have a slope relative to the detector beams of other sets of the named set of sets of parallel detector beams;

- evaluate the rough touch location based on the formation of N (N = 1, 2, ...) of the first sets of detector beams from the named set of sets of parallel detector beams and

- specify the location of the touch based on the formation of N (N = 1, 2, ...) of the second sets of detector beams configured from the detector beams P (P = 1, 2, 3, ...) of the third sets of the said set of sets of parallel detector beams.

Moreover, the formation of N (N = 1, 2, ...) of the first sets of detector beams can be performed by forming a set of detector beams configured from the detector beams M (M = 1, 2, ...) of the first sets of detector beams.

In another embodiment of the method for determining the location of the touch of an optoelectronic touch screen with a higher resolution, while specifying the location of the touch,

- configure N (N = 1, 2, ...) second sets of detector beams from the detector beams P (P = 1, 2, 3, ...) third sets of detector beams from the above set of sets of parallel detector beams based on rough roughness and

- specify the location of the touch based on the formation of the configured second sets of detector beams.

In a further embodiment of the method for determining the location of a touch of a high resolution optoelectronic touch screen

- evaluate the coarse x-coordinate and y-coordinate location of the touch screen touch based on the formation of M (M = 1, 2, ...) x-coordinate and y-coordinate first sets of the named set of sets of parallel detector beams;

- configure N _x (N _x = 1, 2, ...) x-coordinate second sets of detector beams from the detector beams P _x (P _x = 1, 2, 3 ...) x-coordinate third sets from the named set of sets of parallel detector beams on a basis for estimating a rough y-coordinate touch location;

- specify the x-coordinate location of the touch based on the formation of the configured x-coordinate second sets of detector beams;

- configure N _y (N _y = 1, 2, ...) y-coordinate second sets of detector rays from the detector rays P _y (P _y = 1, 2, 3 ...) y-coordinate third sets of the above set of sets of parallel detector rays on Based on rough x-coordinate touch location estimation and

- specify the y-coordinate location of the touch based on the formation of the configured y-coordinate second sets of detector beams.

In yet another embodiment of a method for determining the location of a touch of a high resolution optoelectronic touch screen

- identify the coarse x-coordinate and y-coordinate areas of touch of the touch screen based on the identification of blocked detector beams during the formation of M (M = 1, 2, ...) x-coordinate and y-coordinate first sets of the named set of sets of parallel detector rays;

- compute the rough x-coordinate and y-coordinate border touch region from the identified rough x-coordinate and y-coordinate touch regions and

- specify the x-coordinate and y-coordinate location of the touch based on the formation of N (N = 1, 2, ...) second sets of detector beams, configurable from detector beams P (P = 1, 2, 3, ...) third sets of the said set sets of parallel detector rays intersecting the computed rough border region of contact.

Moreover, the refinement of the x-coordinate and y-coordinate location of the touch can be performed on the basis of the formation of the second sets of detector beams, configurable from the detector beams P (P = 1, 2, 3, ...) of the third sets of the said set of sets of parallel detector beams intersecting the calculated a border touch region and an area limited to a computed rough border touch region.

This goal is also achieved by the fact that in the system for determining the location of the touch of the optoelectronic touch screen with a higher resolution, including many infrared emitters located along the sides of the touch screen, many infrared receivers placed along the sides of the touch screen opposite the infrared emitters, and a processor for calculating the touch position touch screen by pre-evaluating a rough touch location and then refining the location touch based on the formation of detector beams by activating the named set of infrared emitters and activating the named set of infrared receivers,

- said infrared receivers and said infrared emitters are adapted to each other with the possibility of forming a plurality of sets of parallel detector beams, wherein the detector beams of each individual set of the named set of sets of parallel detector beams have a slope relative to the detector beams of other sets of the named set of sets of parallel detector beams, and

- the processor is configured to configure sets of detector beams from detector beams of sets from the named set of sets of parallel detector beams and to generate configured sets of detector beams and sets of detector beams from the named set of sets of parallel detector beams by controlled activation of sets of infrared emitters from the named set of infrared emitters and controlled activation of sets of infrared receivers from the named set infrared receivers when calculating the touch position, and when calculating the touch position based on the formation of the configured sets of detector beams and sets of detector beams from the named set of sets of parallel detector beams, the processor

- estimates the rough touch location based on the formation of M (M = 1, 2, ...) of the first sets of detector beams from the named set of sets of parallel detector beams;

- configures N (N = 1, 2, ...) second sets of detector beams from detector beams P (P = 1, 2, ...) second sets from the named set of sets of parallel detector beams based on rough rough touch location estimation and

- clarifies the location of the touch based on the formation of the configured second sets of detector beams.

In another embodiment of a system for determining the location of a touch of an optoelectronic touch screen with a higher resolution, when calculating a touch position based on the formation of configured sets of detector beams from detector beams, sets from said set of sets of parallel detector beams and sets of detector beams from said set of sets of parallel detector beams, CPU

- estimates the rough x-coordinate and y-coordinate location of the touch screen touch based on the formation of M (M = 1, 2, ...) x-coordinate and y-coordinate first sets of detector rays from the named set of sets of parallel detector rays;

- configures N _x (N _x = 1, 2, ...) x-coordinate second sets of detector beams from the detector beams P _x (P _x = 1, 2, ...) x-coordinate third sets of said sets of sets of parallel detector beams based estimating a rough y-coordinate touch location;

- clarifies the x-coordinate location of the touch based on the formation of the configured x-coordinate second sets of detector beams;

- configures N _y (N _y = 1, 2, ...) y-coordinate second sets of detector rays from the detector rays P _y (P _y = 1, 2, ...) third y-coordinate sets from the named set of sets of parallel detector rays based on estimating a rough x-coordinate touch location and

- refines the y-coordinate location of the touch based on the formation of the configured y-coordinate second sets of detector beams.

In a further embodiment of the system for determining the location of a touch of an optoelectronic touch screen with a higher resolution, when calculating a touch position based on the formation of configured sets of detector beams from detector beams, sets from said set of sets of parallel detector beams and sets of detector beams from said set of sets of parallel detector beams, CPU

- identifies the coarse x-coordinate and y-coordinate areas of touch of the touch screen based on the identification of blocked detector rays from the generated M (M = 1, 2 ...) x-coordinate and y-coordinate first sets of detector rays from the named set of sets of parallel detector rays;

- calculates a rough x-coordinate and y-coordinate border touch region based on the identified rough x-coordinate and y-coordinate touch regions and

- specifies the x-coordinate and y-coordinate location of the touch based on the formation of N (N = 1, 2, ...) second sets of detector beams, configurable from the detector beams P (P = 1, 2, 3) of the third sets of the named set of parallel detector rays crossing the computed rough border region of contact.

Moreover, the processor can specify the x-coordinate and y-coordinate location of the touch based on the formation of the second sets of detector beams, configurable from the detector beams P (P = 1, 2, 3, ...) of the third sets of the named set of sets of parallel detector beams intersecting the calculated boundary the touch area and the area limited by the calculated rough border touch area.

All the claimed variants of the method for determining the location of the touch of the optoelectronic sensor system with high resolution and the variants of the system for its implementation solve a single problem - reducing the response time of the sensor system.

All known systems and methods for determining the location of a touch of a sensor system [1, 2] solve the problem of determining a position of a touch based on the alternate generation of a large number of individual detector rays and the sequential processing of the results of their formation. In addition, the known methods and systems are characterized by an excessive number involved in determining the location of the touch of the detector rays, due to the inadequacy of the criterion used to select the detector rays to be solved by the sensor system task. As a result, an increase in the response time of the sensor system and a decrease in the efficiency of the entire control system, an integral part of which is called the sensor system.

The claimed technical solutions provide the formation and processing of the results of the formation of only those detector rays that are necessary and sufficient to determine the location of the touch. In addition, these technical solutions provide an accurate location of the touch of the touch screen based on pre-configuring sets of detector beams from detector beams of sets of many sets of parallel detector beams, performed simultaneously, and the subsequent formation of these configured sets of detector beams in one go. In accordance with which the claimed technical solutions help minimize the time spent on determining the position of the touch, and thereby provide a decrease in the response time of the system as a whole.

No technical solutions with the claimed combination of features have been found that can significantly reduce the response time of an optoelectronic sensor system without increasing its computing resources in the patent and scientific literature, which allows us to conclude that the claimed technical solutions meet the inventive step criterion.

Figure 1 presents a schematic implementation of an optoelectronic sensor system with high resolution;

figure 2 - functional diagram of the processor;

figure 3 is a functional implementation of the sensitivity control circuit pairs of the emitter-receiver;

figure 4 is an example of the radiation pattern of the optoelectronic component;

figure 5 is an example of the formation of a pair of emitter-receiver of the detector beam;

6 is a flowchart of a procedure for generating a set of parallel detector beams;

7 is an example of the implementation of many sets of parallel detector beams;

on Fig - evaluation scheme rough touch location;

figure 9 is a refinement diagram of the x-coordinate location of the touch;

figure 10 - refinement scheme of the y-coordinate location of the touch;

11 is a flowchart of a procedure for generating a configurable set of detector beams;

on Fig - assessment scheme rough location of the touch, based on the formation of three sets of detector beams;

on Fig - assessment scheme rough location of the touch, based on the formation of one set of detector rays;

on Fig - refinement of the location of the touch, based on the formation of the configured x-coordinate sets of detector beams;

on Fig - refinement scheme of the location of the touch, based on the formation of the configured y-coordinate sets of detector beams;

in Fig.16 is a diagram for clarifying the location of the touch, based on the calculation of the rough border area of the touch.

Individual elements of these illustrations, in accordance with existing practice, cannot be scaled, the shape of some graphic objects is idealized, while the sizes of others are deliberately arbitrarily increased or decreased.

Figure 1 presents a schematic implementation of an optoelectronic sensor system 1, including a touch screen 2 and a processor 3 with an activation circuit 4. Touch screen 2 includes many IR emitters 5, 6, ... 13, 14, 15 ..., 19, placed along the sides of the touch a screen and a plurality of IR receivers 20, 21, ..., 27, 28, 28, ..., 34, placed along the sides of the touch screen opposite these IR emitters, which form a grid of 35 detector rays.

Figure 2 presents the functional diagram of the processor 3, which includes an activation circuit 4 and a microcontroller 36 with memory 37. In turn, the activation circuit 4 includes an emitter activation circuit 38, a receiver activation circuit 39, a limiting resistor 40, and a sensitivity correction circuit 41 of the emitter pairs receiver. The group of interface outputs SDO, SCK, STB, CS of the microcontroller 36 through the interface bus 42 based on the serial interface (in this example, the SPI interface) is connected to the group of interface inputs of the activation circuit 4. The signal input AN of the microcontroller 3 via the signal bus 43 is connected to the signal output of the activation circuit 4.

The emitter activation circuit 38 and the receiver activation circuit 39 have a serial interface and are connected in series to provide end-to-end data shift. The SDO data signal is transmitted from the microcontroller 36 in serial code on the interface bus 42, accompanied by an SCK clock signal, an STB data latch signal, and a CS sample signal. The outputs of the emitter activation circuit 38 and the outputs of the receiver activation circuit 39 are connected respectively to the cathodes of the IR emitters 5, ..., 19 and the emitters of the IR receivers 20, ..., 34. The anodes of the IR emitters 5, ..., 19, in turn, are connected to one output a limiting resistor 40, the other terminal of which is connected to the bus voltage emitter activation voltage Vcc. The collectors of the IR receivers 20, ..., 34 are connected to the analog output of the COM circuit 41 of the sensitivity correction of the pairs of the emitter-receiver and the signal bus 43.

The sensitivity correction circuit 41 of the emitter-receiver pairs, the functional diagram of which is shown in FIG. 3, includes an analog multiplexer 44 with a serial interface and a set of 45 load resistors. The interface inputs SDI, SCK, CS and the analog output COM of the analog multiplexer 44 are connected via the corresponding interface bus 42 to the interface outputs SDO, SCK, CS and the signal bus 43 with the signal input AN of the microcontroller 36. The analog inputs of the analog multiplexer 44 are connected to the first terminals of the load resistors from a set of 45 load resistors, the second terminals of which are connected to the voltage bus Vdd of activation of IR receivers.

The presented circuit implementation of the inventive optoelectronic sensor system operates as follows. At the beginning of each detector beam generation cycle, the microcontroller 36 generates the position codes of the activated IR emitter and the IR receiver, extracts the sensitivity correction code of the current activated emitter-receiver pair from memory 37 and sends them via the interface bus 42, respectively, to the emitter activation circuit 38, circuit 39 activation of the receivers and the circuit 41 of the sensitivity correction of the pairs of the emitter-receiver. In accordance with which the position code (as a rule, the logical “1” of the position code corresponds to the activation state) activates one output of the emitter activation circuit 38, which connects the cathode of the corresponding IR emitter to ground. An activation current flows through the activated IR emitter, which is determined by the value of the limiting resistor 40 and the voltage level Vcc. In accordance with which the activated infrared emitter emits infrared light. Accordingly, the position code of the IR receiver activates one output of the receiver activation circuit 39, which connects the emitter of the corresponding IR receiver to ground. Similarly, the positional correction code for the sensitivity of the currently activated emitter-receiver pair activates one of the analog inputs of the multiplexer 44 of the emitter-receiver pair sensitivity correction circuit 41 and thereby connects a load resistor of the corresponding nominal value to the collector of the activated IR receiver. Accordingly, the activated IR receiver receives the infrared light flux emitted by the activated IR emitter, which is a detection beam and generates a photocurrent in it. The photocurrent flows through the selected load resistor and causes a voltage drop across it. The detector signal from the load resistor via the signal bus 43 is fed to the signal input of the microcontroller 36, which recognizes this signal.

In the event that the detector signal supplied to the signal input AN of the microcontroller 36 is low, which corresponds to the maximum level of the photocurrent flowing through the activated IR receiver, the microcontroller 36 interprets this detector signal as the absence of interruption of the detector beam connecting the activated IR emitter and IR receiver. Otherwise, that is, when the level of the detector signal is high, which corresponds to the minimum level of the photocurrent flowing through the activated IR receiver, the microcontroller 36 interprets it as an interruption of the detector beam, i.e., as a touch on the touch screen.

The sensitivity correction circuit 41 maintains at approximately the same level the detector signals obtained by recognizing detector beams characterized by a different slope. Thus, the circuit 41 of the sensitivity correction of the pairs of the emitter-receiver acts as an integral part of the adaptation of the IR emitters and IR receivers to each other. Adaptation of IR emitters and IR receivers to each other, in relation to the present invention, is multi-level in nature and aims to provide the ability of sensor systems to form many sets of detector beams, in which the detector beams of each individual set have an inclination relative to the detector beams of other sets.

The first level of adaptation consists in placing the IR emitters evenly along each of the three adjacent sides of the touch screen in the form of a half frame, for example, illustrated in FIG. The optical axis of the IR emitters must be unidirectional and parallel to each other. Similarly, IR receivers should be ordered, that is, in accordance with the same pattern, they should also be placed evenly along each of the three adjacent sides of the touch screen opposite the aforementioned IR emitters. The optical axis of the IR receivers should be oriented in the direction of the IR emitters, and accordingly, the optical axis of the IR emitter should be oriented in the direction of the IR emitters.

The second level of adaptation is the use of IR emitters and IR receivers with similar radiation patterns, characterized by a slight change in the output characteristics within the working range of angles. IR LEDs and IR phototransistors, used, as a rule, in optoelectronic sensor systems, are characterized by well-defined radiation patterns, according to which IR LEDs emit an IR stream and, accordingly, IR phototransistors perceive an IR stream. Figure 4 presents an example of the radiation pattern of the optoelectronic component, which may be considered acceptable for IR emitters and IR receivers of the sensor system implemented in accordance with the present invention. As follows from the presented diagram, the highest radiation intensity of the IR emitter or the sensitivity of the IR receiver occurs in the direction coinciding with its optical axis 46. Obviously, when deviating from the optical axis, the radiation intensity for the IR emitter decreases, equal to the sensitivity of the IR receiver also decreases.

The aforementioned correction of the sensitivity of the detector pairs of the emitter-receiver is the third level of adaptation of the IR emitters and IR receivers and in the simplest case can be implemented by selecting or calculating the values of the load resistors of the sensitivity correction circuit 41 of the emitter-receiver pair for each set of parallel detector rays. Moreover, to maintain the detection signal at a certain level, for a larger angle of inclination of the detection beam, a larger value of the load resistor should be provided. Figure 5 presents an example of the formation of a detection beam having an inclination relative to the optical axes of the infrared emitter and infrared receiver. It is obvious that, as noted above, the identity or a slight difference in the radiation patterns of IR emitters and IR receivers in the working range of angles can be considered preferable, which leads to a minimum correction of the sensitivity of the emitter-receiver pairs activated when forming sets of detector beams. In relation to the considered technical solution, the requirements for the identity of the radiation patterns become more stringent, the greater the number of sets of detector beams contains the aforementioned set of parallel detector beams and, accordingly, the greater the angle of inclination of the detector beams. Failure to comply with this requirement entails the use of a correspondingly wider range of ratings of load resistors, which is undesirable. A high value of the load resistor with a high level of external illumination can lead to saturation of the currently activated IR receiver, loss of the detection signal at its output and its false response. In other words, it leads to unreliable operation of the touch screen as a whole.

6 is a flowchart of a procedure for generating a set of detector beams from a plurality of sets of parallel detector beams implemented by the processor 3.

At block 48, an entry is made to the procedure for generating a set of detector beams.

In block 49, the detector ray counter is initialized by loading into it the value of the number of detector rays in the set.

In block 50, the position counter of the IR emitters and the position counter of the IR receivers are initialized by loading the positions of the IR emitter and the position of the IR receiver, forming a pair of emitter-receiver, activated to form the first detector beam of the set, respectively.

In block 51, the current detection beam is formed by activating one separate infrared emitter, the position of which determines the current contents of the position counter of infrared emitters, and one separate infrared receiver, determined by the current contents of the position counter of infrared receivers.

At block 52, the contents of the detector ray counter are reduced by one.

In block 53, the condition for completing the formation of a set of detector beams is checked. If the contents of the counter are not equal to zero, then control is passed to block 54. Otherwise, control is passed to block 55.

In block 54, the contents of the counter of the positions of the IR emitters and the contents of the positions of the counter of the positions of the IR receivers are increased by one, control is returned to block 51 and the cycle of generating the detector beam is repeated.

At block 55, the procedure is exited.

Figure 7 shows an example of the implementation of a plurality of sets of parallel detector beams, consisting of three sets of parallel detector beams: one x-coordinate set of detector beams formed by pairs of emitter-receiver 8-20, 9-21, ..., 19-31, one y -coordinate set of detector beams generated by pairs of emitter-receiver 5-23, 6-24, ..., 16-34 and one x- and y-coordinate set of detector beams formed by pairs of emitter-receiver 8-23, 9-24, 10 -25, ..., 16-31. Obviously, the larger the number of sets of detector beams involved in determining the location of the touch of the touch screen, the more accurate the result. In other embodiments, a plurality of sets of parallel detector beams may be characterized by either a greater number of sets or a smaller number of detector beams in each individual set of detector beams.

The first embodiment of the method for determining the location of a touch of a touch screen with a higher resolution is presented below and includes two steps.

In a first step, illustrated in FIG. 8, a rough touch location is estimated based on the formation of the first two sets of detector beams from the plurality of sets of parallel detector beams. These sets are formed by activating, respectively, two sets of pairs of emitter-receiver 8-20, 9-21, ..., 19-31 and 5-23, 6-24, ..., 16-34. In the case where a touch of the touch screen 56 takes place, the IR streams from the emitters 13, 14 and 10, 11 are blocked and are not perceived by the IR receivers 25, 26 and 28, 29 paired with them. According to which, the detection beams generated the transmitter-receiver pairs 13-25, 14-26, and 10-28, 11-29 are recognized as being blocked and, on this basis, the rough touch location 57 is evaluated. With reference to Fig. 8, the rough touch location estimate is based on detector beams adjacent to first and last blocked detector beams. For the considered example, these are detector beams generated by the pairs of emitter-receiver 12-24, 15-27 and 9-27, 12-30. In another embodiment of the technical solution, estimating a rough touch location can be based on blocked detector beams generated by transmitter-receiver pairs 13-25, 14-26, and 10-28, 11-29.

In the second step, the location of the touch is specified based on the formation of one second set of detector beams, configured, for example, as shown in FIGS. 9 and 10, from the detector beams of two sets of a plurality of sets of parallel detector beams. These detector beams are formed by activating, respectively, two sets of pairs of emitter-receiver 9-22, 10-23, ..., 17-30 and 7-24, 8-25, ..., 15-32. Obviously, in other implementations, the rough touch location assessment and the touch location refinement can be performed using more or fewer sets of detector beams.

In relation to the implementation of the technical solution under consideration, by configuring a set of detector beams from detector beams of sets of many sets of parallel detector beams, we understand the formation of the corresponding number of parameters that determine the mutual spatial position of the detector beams relative to each other and determine the formation of their sensor system in one go. In the simplest case, the configured set of detector beams may be a set of parallel detector beams, including the detector beams of one of the sets of multiple sets of parallel detector beams. In another embodiment, a configured set of detector beams may include detector beams of two or more sets of multiple sets of parallel detector beams.

11 is a flowchart of a procedure for generating a configured set of detector beams implemented by the processor 3.

At block 58, an entry is made to the procedure for generating a configured set of detector beams.

At block 59, a counter of sets of parallel detector beams is initialized. In the case when the deployable set of detector beams is configured from the detector beams of one set, the set counter is set to state 1. In other cases, the value defining the number of sets of parallel detector beams forming a configurable set of detector beams is entered into the counter of sets of detector beams.

In block 60, the detector ray counter is initialized by loading into it a value characterizing the number of detector rays in one separate set of parallel detector rays of a configurable set of detector rays. For the considered embodiment of the procedure for generating a configured set of detector beams, the number of detector beams in each separate set of parallel detector beams is assumed to be constant. In another embodiment, the number of detector beams can be determined individually for each individual set of parallel detector beams.

In block 61, the position counter of the IR emitters and the position counter of the IR receivers for the current deployable set of parallel detector beams are initialized. For the considered embodiment of the procedure, the initial positions of the IR emitters and IR receivers are the same for all deployable sets of parallel detector beams.

In block 62, the current detection beam of the current deployable set of parallel detector beams is formed by activating one separate infrared emitter, the position of which determines the current contents of the counter position of infrared emitters, and activating one separate infrared receiver, the position of which determines the current content of the position counter of infrared receivers .

At block 63, the contents of the detector ray counter are reduced by one.

In block 64, the condition for completion of the formation of detector rays of the current expandable set of parallel detector rays is checked. If the contents of the counter are not equal to zero, then control is passed to block 65. Otherwise, control is passed to block 66.

In block 65, the contents of the counter of positions of IR emitters and the contents of the counter of positions of IR receivers are increased by one, control is returned to block 62 and the cycle of generating the current detection beam is repeated.

At a block 66, the contents of the counter of sets of parallel detector beams are reduced by one.

In block 67, the condition for completing the formation of a configured set of detector beams is checked. If the contents of the counter of sets of parallel detector beams are not equal to zero, then control is returned to block 61 and the deployment cycle of the set of detector beams is repeated. Otherwise, control is passed to block 68.

At block 68, a process flow is generated from the flowchart for generating a configured set of detector beams.

It should be noted that the block diagram of the procedure for generating the configured set of the detector beam presented in Fig. 11 is universal. Therefore, for the special case when the configured set of detector beams includes detector beams of one set of a plurality of sets of parallel detector beams, its formation will be reduced to the formation of a set of parallel detector beams, illustrated by the flowchart of the procedure shown in Fig.6.

The lockable detector beams illustrated in FIGS. 9 and 10 can serve as the basis for a graphical solution to the problem of clarifying the location of the touch. Accordingly, the patterns of lockable and non-lockable detector beams can be saved in a table with a pattern in ROM (EEPROM) of the memory of the processor 3 with the possibility of subsequent use in determining the location of the touch. With reference to FIGS. 9 and 10, detector beams generated by activation of a pair of emitter-receiver 12-25, 13-26 and a pair of emitter-receiver 10-27, 11-28 can be considered as such patterns. Obviously, it seems expedient to construct the mentioned graphic patterns in relation to the type of configured sets of detector beams, which allows one to significantly speed up the procedure for determining the location of the touch.

An embodiment of a technical solution may consider a scheme in which the rough touch location is estimated based on a scheme involving the formation of a larger number of sets of detector beams. For example, the three sets of detector beams illustrated in FIG. 12 and providing a more accurate estimate of the rough touch location.

Guided by the desire to reduce the time spent by the sensor system to determine the location of the touch of the screen of the sensor system, rough estimation of the location and refinement of the location of the touch can be performed using fewer detection beams than was discussed above. For example, the rough touch location can be estimated based on the formation of one set of detector beams, illustrated in Fig. 13 and formed by a set of emitter-receiver pairs 8-23, 9-24, ..., 16-31. This estimation scheme for a rough touch location is based on the property of a straight line, characterized by an inclination relative to both coordinate axes at the same time, to have non-zero projections on both coordinate axes. Accordingly, a rough location can be estimated by forming detector beams formed, for example, by pairs of emitter-receiver 11-24, 16-29 and 9-26, 14-31.

Another embodiment of a method for determining the location of a touch of a high resolution touch screen is presented below. The method is based on the use of the operation of configuring refinement sets of detector beams performed by the sensor system based on a rough estimate of the location of the touch, and includes three steps. The method is implemented as follows.

For the current implementation of the technical solution, the rough touch location can be estimated in the same way as was considered for the previous implementation, that is, based on the formation of the first two sets of detector beams from the set of sets of parallel detector beams.

As for pinpointing the location of the touch, it can be done by generating detector beams crossing the most relevant, from the point of view of pinpointing the location of the touch, area of the touch screen. Such an area, in the most general case, can be considered the rough location of the touch 57. Accordingly, the configuration of the refinement sets of detector beams should be based on the assessment of the rough location of the touch. For the considered embodiment illustrated in FIGS. 13 and 14, detector beams crossing a rough contact area belong to four sets of a plurality of sets of parallel detector beams and can be configured into two sets of detector beams formed respectively by two sets of pairs of emitter-receiver 12- 25, 13-26, 14-27, 13-24, 14-25, 15-26 and 10-27, 11-28, 12-29, 9-28, 10-29, 10-30.

In relation to the considered embodiment of the technical solution, the configuration operation additionally solves the problem of reducing the time to determine the detector rays generated when the location of the touch is specified. In the most general case, a configured set of detector beams can combine the detector beams P (P = 1, 2, 3, ...) of sets of multiple sets of parallel detector beams. Moreover, the operation of configuring a set of detector beams from detector beams of one set of parallel detector beams, that is, at P = 1, involves setting a set of configuration parameters, which, for example, can include the position of the first generated detector beam, determined by the positions of the activated IR emitter and IR the receiver, the step of the detector beams and the total number of detector beams in the set. In another embodiment of the configuration operation, without violating the completeness and integrity of the description of the set of parallel detector beams, two parameters can be considered minimally sufficient, for example, the position of the activated infrared emitter and the position of the activated infrared receiver, that is, parameters that define one detection beam. This option can take place when the step of following the detector rays in the set is taken as the default unit and the moment of completion of the formation of the set of detector rays is determined in accordance with the principle of actual sufficiency, that is, based on the recognition of the sequence of one blocking and one non-blocking detection rays following each other.

Another embodiment of the configuration of a set of detector beams may consider a variant in which a configurable set includes detector beams from multiple sets of multiple sets of parallel detector beams. In relation to this option, the configuration of the set of detector beams is reduced to setting the positions of the first activated in the set of infrared emitter and infrared receiver and setting the number of sets of parallel detector beams. It is obvious that the number of detector beams in the set formed by parallel detector beams, the step of the detector beams and the slope of the detector beams will be determined by default, that is, single. In accordance with this, despite the fact that for the considered implementation option, the number of detector beams configured in one set has multiplied, the number of parameters determining it has not actually changed. In other words, the number of parameters defining the configurable set of detector beams does not actually depend on the number of detector beams included in the configurable set. Accordingly, the time taken by the sensor system to perform the configuration operation is comparable to the configuration time of one individual detector beam and can be performed by the sensor system simultaneously.

In the second step, in N (N = 1, 2, ...) second sets of detector beams from detector beams P (P = 1, 2, ...) of sets of a plurality of sets of parallel detector beams are configured based on the above criterion establishing the intersection of the rough detector beams with the above touch areas. Moreover, the number of configured sets of detector beams in a particular implementation may be different. For example, it can be equal to 2, that is, by the number of coordinate axes. In another embodiment, the number of configured sets can be determined based on the number of boundaries of the rough touch region, that is, N = 4. In the third embodiment, N can take the values 1, 2, ... and is determined by the appropriateness of refinement for each of the boundaries of the rough touch area. As for the number of sets of detector beams from a plurality of sets of parallel detector beams, from the detector beams of which sets of detector beams are configured for precision scanning, their number is determined by the accuracy requirements for determining the location of the touch.

In the third step, the location of the touch is specified based on the formation of the configured sets of detector beams, for example, similarly to the circuit shown in Figs. 14 and 15.

A further embodiment of the method for determining the location of a touch of a high resolution touch screen is presented below. The method is based on the use, when configuring sets of detector beams, the interdependence of the opposite coordinates of the points on the plane and includes five steps.

Representing each individual detector beam in the form of a straight line connecting the activated IR emitter and the IR receiver, the x-coordinate and y-coordinate detector rays in general can be represented by the following expressions for lines with angular coefficients:

and

Where:

XRefi - x coordinate of the i-th point of the detection beam;

YRefi - y coordinate of the i-th point of the detection beam;

xCoef is the angular coefficient determined by the slope of the x-coordinate detector beam;

yCoef is the angular coefficient determined by the slope of the y-coordinate detector beam;

XRef - reference position of the y-coordinate detector beam;

XRef - reference position of the x-coordinate detector beam.

Expressions (1) and (2) establish the interdependence of coordinates for each individual detector beam, according to which the configurable x-coordinate detector rays, which are configurable in sets, can be determined based on the rough location of the touch along the y-coordinate axis, whereas coordinate detection beams can be determined based on the rough touch location along the x-axis. The method is implemented as follows.

At the first step, the rough x-coordinate and y-coordinate location of touching the touch screen is evaluated similarly to the implementations of the technical solution discussed above, that is, based on the formation, for example, of one x-coordinate and one y-coordinate of the first sets of detector rays from the set of sets of parallel detector rays .

In the second step, configure N _h (N _h = 1, 2, ...) x-coordinate second sets of detector beams from x-coordinate detector beams P _x (P = 1, 2, 3, ...) third sets of sets of parallel detector beams on Based on the rough g-coordinate location of the touch. The configuration can be performed in the same way as was considered in the previous implementation of the technical solution, but taking into account the slope of the detector beams configured in the x-coordinate sets of detector beams, which can be determined from expression (1).

In the third step, the x-coordinate location of the touch is specified based on the formation of the configured x-coordinate second sets of detector beams.

In the fourth step, similar to the configuration operation performed in the second step, the N _y (N _y = 1, 2, ...) y-coordinate second sets of detector beams from the detector beams P _y (P _y = 1, 2, 3, ...) are configured y-coordinate third sets of sets of sets of parallel detector beams based on the rough rough x-coordinate touch location. The slope of the detector beams, configurable in the y-coordinate sets of detector beams, can be determined from expression (2).

In the fifth step, the y-coordinate location of the touch is specified based on the formation of the configured y-coordinate second sets of detector beams.

A particular case of the implementation of the considered technical solution is a method in which the x-coordinate second sets of detector beams are configured and the x-coordinate location of the touch is specified based on the formation of the configured x-coordinate second sets of detector beams in the process of estimating the rough x-coordinate location of the touch. Accordingly, the y-coordinate second sets of detector beams are configured and the y-coordinate location of the touch is specified based on the generation of the configured y-coordinate second sets of detector beams in the process of evaluating the rough y-coordinate location of the touch.

The use of a large number of rays in determining the location of the touch provides increased accuracy in determining the location of the touch, however, entails an increase in the duration of the latter, which makes the task of increasing the computing resources of the sensor system relevant. The latter can be solved by using an additional processor in the circuitry of the sensor system and transferring part of the processor functions to it. In this case, the first processor may be assigned the function of forming sets of detector beams. Accordingly, the second processor can perform rough rough touch location estimation, configure refinement sets of detector beams, refine the touch location and calculate the touch location.

Guided by the desire to minimize the time spent by the sensor system for determining the slope of the detector beams for refinement sets of detector beams, this operation can be implemented using the tabular method implemented using the memory of processor 3, as described above. That is, previously, for example, by means of graphical constructions, the dependence of the slope of the refinement detector rays on the rough touch location is determined and stored in a table in the memory (for example, ROM or EEPROM) of the processor 3. Moreover, the slope of the detector rays used to configure the refinement sets of detector rays determined as a function of the positions of the grid cells formed by the detector beams during rough scanning of the touch screen. Accordingly, when performing the configuration procedure, the slope of the refinement detector rays can be determined based on the rough touch location.

Another embodiment of the method for determining the location of a touch of a touch screen with a higher resolution is presented below. The method is based on the use of a coarse border touch region as a refinement scanning region and refinement of the touch location based on the calculation of the named region and the formation of detector beams crossing the named calculated border touch region. The method includes three steps and is implemented as follows.

In the first step, coarse x-coordinate and y-coordinate touch areas are identified based on the identification of blocked detector rays during the formation of M (M = 1, 2, ...) of the first x-coordinate and y-coordinate sets from the named set of sets of parallel detector rays. A rough x-coordinate touch region can be identified with detector beams adjacent to the first and last blocked detector beams along the x-axis. Accordingly, a coarse y-coordinate touch region can be identified with detector beams adjacent to the first and last blocked detector beams along the y-coordinate axis.

In a second step, the coarse x-coordinate and y-coordinate border touch region 58, illustrated in FIG. 16, is calculated based on the identified coarse x-coordinate and y-coordinate touch regions. The said coarse x-coordinate and y-coordinate border region can be calculated on the basis of the positions of the detector rays with which the rough touch regions are identified and the positions of the blocked detector rays adjacent to them, for example, by calculating its boundary points resulting from the intersection between themselves four x-coordinate and y-coordinate pairs of detector beams generated by the emitter-receiver pairs 12-24, 9-27 and 13-25, 10-28 and 14-26, 11-29 and 15-27, 12-30 using expressions (1) and (2).

In the third step, the contact location is specified based on the formation of N (N = 1, 2, ...) second sets of detector beams, configurable from detector beams P (P = 1, 2, 3, ...) third sets of the above-mentioned sets of parallel detector beams, that cross the calculated border touch area of the touch screen. These detector beams can be determined based on a coarse calculated border region of contact and expressions (1) and (2).

As follows from the above implementation of the claimed technical solution, the invention in question allows to reduce the response time of the sensor system by reducing direct and indirect time spent on determining the location of the touch screen with high resolution. Reducing direct time costs is achieved by reducing the number of detector beams used in determining the location of the touch, firstly, by evaluating the rough location of the touch using a set of detector beams having an inclination relative to both coordinate axes of the touch screen, and secondly, due to the exclusion of non-informative detector rays from the sets of detector rays involved in determining the location of the touch and determining the area of the refinement scan tion of cross-border area of contact. Reducing the indirect overhead is provided by introducing the operation of configuring the detector beams used in the step of refining the location of the touch into one or more sets of detector beams. The application of this operation allows one to make the procedure for determining refining detector rays simultaneous, independent of the number of refining detector rays and comparable in time to the configuration of one separate detector ray.

Despite the fact that the claimed technical solution was considered in relation to determining the location of a touch of a touch screen based on the formation of sets of detector beams formed from detector beams of sets of many sets of parallel detector beams, it is not limited to this case. This technical solution is also true for the case of using a lot of mostly parallel detector beams, that is, when the detector beams are not strictly parallel in the sets.

Bibliography

1. Patent US 4689446. An input device with a touch panel, IPC 4 G08C 21/00, published on 08.25.87.

2. Patent US 4689446 B1. System and method for resolving an optoelectronic sensor system, IPC 7 G09G 5/00, published 06.08.03

Claims (10)

1. A method for determining the location of a touch of an optoelectronic touch screen with a higher resolution (option), which consists in preliminary estimating the rough location of the touch and then refining the location of the touch based on the formation of detector beams by activating a plurality of infrared emitters arranged along the sides of the touch screen and activating a plurality infrared receivers, located along the sides of the touch screen opposite the named infrared emitters, featuring the fact that the said infrared emitters and the said infrared receivers are adapted to each other with the possibility of forming a plurality of sets of parallel detector beams, the detector beams of each individual set of the said set of sets of parallel detector beams being tilted with respect to the detector beams of other sets of the said set of sets of parallel detector beams rays, evaluate the rough touch location based on the formation of M (M = 1, 2, ...) of the first sets of detector rays from the given set of sets of parallel detector beams and specify the location of the touch based on the formation of N (N = 1, 2, ...) second sets of detector beams configured from the detector beams P (P = 1, 2, 3, ...) of the third sets of the said set of sets parallel detector beams. 2. The method according to claim 1, characterized in that the formation of the named M (M = 1, 2, ...) of the first sets of detector beams is performed by forming a set of detector beams configured from the detector beams called M (M = 1, 2, ...) first sets of detector beams. 3. A method for determining the location of a touch of an optoelectronic touch screen with a higher resolution (option), which consists in preliminary estimating the rough location of the touch and then refining the location of the touch based on the formation of detector beams by activating a plurality of infrared emitters arranged along the sides of the touch screen and activating a plurality infrared receivers, located along the sides of the touch screen opposite the named infrared emitters, featuring the fact that the said infrared receivers and the said infrared emitters are adapted to each other with the possibility of forming a plurality of sets of parallel detector beams, the detector beams of each individual set of the said set of sets of parallel detector beams being tilted with respect to the detector beams of other sets of the said set of sets of parallel detector beams rays, evaluate the rough touch location based on the formation of M (M = 1, 2, ...) of the first sets of detector rays from of the set of sets of parallel detector beams, configure N (N = 1, 2, ...) second sets of detector beams from the detector beams P (P = 1, 2, 3, ...) third sets of detector beams from the named set of sets of parallel detector beams based estimating the rough touch location and refine the touch location based on the formation of the configured second sets of detector beams. 4. A method for determining the location of the touch of an optoelectronic touch screen with a higher resolution (option), which consists in preliminary estimating the rough location of the touch and then refining the location of the touch based on the formation of detector beams by activating a plurality of infrared emitters arranged along the sides of the touch screen and activating a plurality infrared receivers, located along the sides of the touch screen opposite the named infrared emitters, featuring the fact that the said infrared receivers and the said infrared emitters are adapted to each other with the possibility of forming a plurality of sets of parallel detector beams, the detector beams of each individual set of the said set of sets of parallel detector beams being tilted with respect to the detector beams of other sets of the named set of parallel detector sets rays, estimate the rough x-coordinate and y-coordinate location of the touch screen touch based on the formation M (M = 1, 2, ...) x-coordinate and y-coordinate first sets of detector rays from the named set of sets of parallel detector rays, configure N _x (N _x = 1, 2, ...) x-coordinate second sets of detector rays from of detector rays P _x (P _x = 1, 2, 3 ...) of x-coordinate third sets of the named set of sets of parallel detector rays based on the rough co-determination of the y-coordinate location of the touch, specify the x-coordinate location of the touch based on the formation of the configured x-coordinate second detector sets rays, configure N _y (N _y = 1, 2, ...) y-coordinate second sets of detector rays from the detector rays P _y (R _y = 1, 2, 3 ...) y-coordinate third sets from the named set of parallel detector sets rays based on the estimation of the rough x-coordinate location of the touch and specify the y-coordinate location of the touch based on the formation of the configured y-coordinate second sets of detector rays. 5. A method for determining the location of a touch of an optoelectronic touch screen with a higher resolution (option), which consists in preliminary estimating the rough location of the touch and then refining the location of the touch based on the formation of detector beams by activating a plurality of infrared emitters arranged along the sides of the touch screen and activating a plurality infrared receivers, located along the sides of the touch screen opposite the named infrared emitters, featuring the fact that the said infrared receivers and the said infrared emitters are adapted to each other with the possibility of forming a plurality of sets of parallel detector beams, the detector beams of each individual set of the said set of sets of parallel detector beams being tilted with respect to the detector beams of other sets of the said set of sets of parallel detector beams rays, identify the coarse x-coordinate and y-coordinate touch areas based on the identification of the blocked detector When forming M (M = 1, 2, ...) x-coordinate and y-coordinate first sets from the named set of sets of parallel detector beams, the coarse x-coordinate and y-coordinate border touch region from the identified coarse x-coordinate and of the y-coordinate contact areas and specify the x-coordinate and y-coordinate location of the touch based on the formation of N (N = 1, 2, ...) second sets of detector beams, configurable from the detector beams P (P = 1, 2, 3, ...) third sets of said set of sets of parall Yelnia detector beams crossing the border region of the calculated coarse touch. 6. The method according to claim 5, characterized in that specify the x-coordinate and y-coordinate location of the touch based on the formation of the second sets of detector beams, configurable from the detector beams P (P = 1, 2, 3, ...) of the third sets of the above a plurality of sets of parallel detector rays intersecting the computed border touch region and the region bounded by the computed rough border touch region. 7. A system for determining the location of the touch of an optoelectronic touch screen with a higher resolution (option), including a plurality of infrared emitters arranged along the sides of the touch screen, a plurality of infrared receivers placed along the sides of the touch screen opposite the infrared emitters, and a processor for calculating the touch position of the touch screen by preliminary estimating the rough touch location and then clarifying the touch location based on the formation of detector rays by activating the named set of infrared emitters and activating the named set of infrared receivers, characterized in that the said infrared receivers and the named infrared emitters are adapted to each other with the possibility of forming a plurality of sets of parallel detector beams, and the detector beams of each individual set from the named set of sets parallel detector beams have a slope relative to the detector beams of other sets of the above a plurality of sets of parallel detector beams, and the processor is configured to configure sets of detector beams from detector beams of the sets of said plurality of sets of parallel detector beams and the ability to form configured sets of detector beams and sets of detector beams from the specified set of parallel detector beams by means of controlled activation of sets of infrared emitters from the named set of infrared emitters and controlled activation set s infrared receivers from the named set of infrared receivers when calculating the touch position, and when calculating the touch position based on the formation of the configured sets of detector beams and sets of detector beams from the specified set of parallel detector beams, the processor estimates the rough touch location based on the formation of M (M = 1, 2, ...) the first sets of detector beams from the named set of sets of parallel detector beams, configures N (N = 1, 2, ...) the second sets of detector Rays from the detector rays P (P = 1, 2, ...) of said second sets of a plurality of sets of parallel ray detector based on the coarse estimation of the location of touch and specifies the location of tangency configured based on the formation of second sets of detector rays. 8. A system for determining the location of a touch of an optoelectronic touch screen with a higher resolution (option), including a plurality of infrared emitters located along the sides of the touch screen, and a plurality of infrared receivers located along the sides of the touch screen opposite these infrared emitters, and a processor for calculating the touch position of the touch screen by preliminary estimating the rough location of the touch and then refining the location of the touch based on the shape of detecting beams by activating the aforementioned set of infrared emitters and activating the aforementioned set of infrared receivers, characterized in that the aforementioned infrared receivers and the aforementioned infrared emitters are adapted to each other with the possibility of forming a plurality of sets of parallel detector beams, moreover, the detection beams of each individual set from the named set of sets parallel detector beams have a slope relative to the detector beams of other sets of the above a plurality of sets of parallel detector beams, and the processor is configured to configure sets of detector beams from detector beams of the sets of said plurality of sets of parallel detector beams and the ability to form configured sets of detector beams and sets of detector beams from the named set of parallel detector beams by means of controlled activation of sets of infrared emitters of the aforementioned set of infrared emitters and controlled activation of s infrared receivers from the named set of infrared receivers when calculating the touch position, and when calculating the touch position based on the formation of the configured sets of detector beams and sets of detector beams from the specified set of parallel detector beams, the processor evaluates the rough x-coordinate and y-coordinate locations of the touch screen touch based on the formation of M (M = 1, 2, ...) x-coordinate and y-coordinate first sets of detector beams from the named set of sets arallelnyh ray detector configures N _x (N _x = 1, 2, ...) x-coordinate of second sets of detector beams of rays detector P _x (P _x = 1, 2, ...) x- coordinate of third sets from said plurality of sets of parallel detector rays based on the rough co-estimation of the y-coordinate location of the touch, refines the x-coordinate location of the touch based on the formation of the configured x-coordinate second sets of detector rays, configures the N _y (N _y = 1, 2, ...) y-coordinate second sets of detector rays from detector beam P _y (P _y = 1, 2, ...) of third y-coordinate sets from said plurality of sets of parallel detector beams on the basis of estimation of coarse x-coordinate touch location and precise y-coordinate location of the touch on the basis of formation configured y-coordinate second sets of detector rays. 9. The system for determining the location of the touch of the optoelectronic touch screen with a higher resolution (option), including many infrared emitters located along the sides of the touch screen, and many infrared receivers located along the sides of the touch screen opposite the above infrared emitters, and a processor for calculating the touch position of the touch screen by preliminary estimating the rough location of the touch and then refining the location of the touch based on the shape of detecting beams by activating the aforementioned set of infrared emitters and activating the aforementioned set of infrared receivers, characterized in that the aforementioned infrared receivers and the said infrared emitters are adapted to each other with the possibility of forming a plurality of sets of parallel detector beams, moreover, the detection beams of each individual set from the named set of sets parallel detector rays have an inclination relative to the detector rays of other sets of the above about a plurality of sets of parallel detector beams, and the processor is configured to configure sets of detector beams from detector beams of sets of the named set of sets of parallel detector beams and the ability to form configured sets of detector beams and sets of detector beams from the named set of sets of parallel detector beams by means of controlled activation of infrared sets emitters from the aforementioned set of infrared emitters and controlled activation of ditch infrared receivers from the specified set of infrared receivers when calculating the touch position, and when calculating the touch position based on the formation of the configured sets of detector beams and sets of detector beams from the specified set of parallel detector beams, the processor identifies the rough x-coordinate and y-coordinate touch areas based on identification of blocked detector rays from the generated M (M = 1, 2 ...) x-coordinate and y-coordinate first sets of detector rays from of a given set of sets of parallel detector beams, calculates the rough x-coordinate and y-coordinate border touch region based on the identified rough x-coordinate and y-coordinate touch regions and refines the x-coordinate and y-coordinate touch location based on the formation of N (N = 1, 2, ...) of the second sets of detector beams configurable from the detector beams P (P = 1, 2, 3) of the third sets of the named set of sets of parallel detector beams intersecting the calculated rough border region of the cus Niya. 10. The system according to claim 9, characterized in that the processor specifies the x-coordinate and y-coordinate location of the touch based on the formation of the second sets of detector beams, configurable from the detector beams P (P = 1, 2, 3, ...) of the third sets of a plurality of sets of parallel detector rays intersecting the computed border touch region and the region bounded by the computed rough border touch region.

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