RU2345377C1 - Self-acting calibrator of standards of measuring and computing complex - Google Patents

Abstract

FIELD: physics, measuring.

SUBSTANCE: invention concerns the measuring technics, in particular, for metrological certification of multichannel multipurpose gauges of electrical quantities. High-speed key devices (multiplexers M1…M10) switched by signals of the microprocessor of the measuring and computing complex (MCC) are entered. Influence of resistance of key devices of multiplexers at the expense of feed of precision resistor sets RS1…RS7 SAC by a stable current is thus excluded. Calibrator outputs are connected to input circuits of operational MCC amplifiers. And feed of precision resistor sets RS1…RS7 by the "weighed" MCC cells is applied to separate types of data units for the purpose of an exception of the active devices (active neutralisation) in multiplexers (M1…M10) for error and noise reduction at formation of target voltages of the calibrator.

EFFECT: expansion of functionality.

16 cl, 29 dwg

Description

The invention relates to measuring equipment, in particular, for metrological certification of multichannel multifunctional means for measuring electrical quantities (Measuring and computing systems "IVK"). It can be used to set the physical parameters of resistance, voltage, and current to the input of the IVC, which is designed to service strain gauge and thermistor sensors that change their resistance when the value of the physical parameter varies, as well as other types of sensors with an output voltage or current signal. The device allows you to work with various schemes for switching on resistive sensors, such as single, half-bridge, bridge, "socket", as well as with various combinations of their inclusion.

Known mechanical type devices for generating values of model resistances and their increments, for example, resistance stores R-4831, R-3026, etc. However, their use for multifunctional IVK (with a large number of types of measured sensors, measurement ranges, sensor switching circuits) for monitoring purposes and verification of the metrological characteristics of the IVC is significantly limited due to the large volume and time of preparatory work, the inability to use the calibration procedure for automation in the serial production of the IVC, etc.

Small-sized low-resistance resistors, for example, Р2-67, С2-29С, etc., of sufficiently high accuracy (up to 0.001%) and TKC = ± (5 ÷ 10) · 10 ^-6 1 / ° C are known commercially available from the domestic industry. Corresponding sets of such resistors (HP) at normal temperature (20 ± 2) ° С can be used at the measuring inputs of the IVC as equivalents of sensors for checking the metrological characteristics of the IVC. The main disadvantage of using such sets of resistors is the lack of automation of setting their respective configurations and values in order to completely exclude the subjective factor from the actions of the operator at the stage of metrological tests of the CPI, in particular, connecting and switching the values of the reference means, as well as the time factor, etc.

Known devices: “Device for automating research of metrological characteristics”, Proceedings of TsAGI, M., 1981, no. 2105, p. 75, Beklemishev A.I. and Sudakov V.A .; USSR Copyright Certificate No. 1551979, class G01B 7/18, 1987, Shevchuk B.V .; Patent No. 2023979, Shevchuk V.V. These inventions relate to means for measuring non-electric quantities by electric measuring transducers and can be used to simulate a stepwise increment of the resistance of a strain gauge or thermoresistive single sensors during graduation of subsequent links of the measuring systems. Here, an increase in accuracy is achieved by reducing the influence on the output signal of the graduated system of the resistance of the switching element included in the switching circuit of the shunt resistor, the operation of which gives an abrupt change in the resistance of the simulator and allows to reduce the error introduced by the instability of the resistance of the switching element.

All devices described in analogs solve particular problems and are not adapted for automatic verification of multichannel multifunctional measuring and computing complexes (IVK). This factor is especially important when checking the metrological characteristics of the IVC, designed for continuous monitoring of the strength of complex mechanical structures, when the dismantling of the IVC from the object is impossible.

To understand the verification process of such a CPI, you can use the materials of the article: “TENZOR Small-Size Measuring and Computing Complex for Monitoring the Strength of Complex Mechanical Structures”, Sensors and Systems, 2006, No. 5. p.2-7.

A device for reproducing the increment of resistance, voltage and current for the measuring and computing complex "Tensor", for example, "Ensuring metrological testing of the measuring and computing complex" TENSOR ", Sensors and systems, 2006, No. 8. pg. 34-36. It is the closest to the claimed solution and is used as a prototype, which describes the structure and general parameters of the automatic calibrator of measures (AKM) without measuring and computing complex (IVC) and does not disclose the features of its construction and communication with the input and output measuring circuits of the IVC. Service signal associations are not shown, and they are indicated in symbolic form.

Figure 1 presents the structural diagram of the AKM, the article "Provision of metrological tests of the measuring and computing complex" TENSOR ", Sensors and systems, 2006, No. 8. pg. 34-36, where:

UR1 - node 1 of the nominal resistors;

UR2 - node 1 of the range resistors;

UR3 - node 2 rated resistors;

UR4 - node 2 range resistors;

UR5 - node 3 rated resistors;

UN - stress node;

UU - control node;

The set of resistors in the proposed solution of the automatic calibrator of measures of the measuring and computing complex is designated HP1-HP7.

UR1 (НР1, НР2) serves to form a set of resistors of the corresponding nominal value for the main circuits of strain gauge multifunction converters (MIN) (single, half-bridge and bridge strain gages).

UR2 (НР3) provides the formation of a set of resistors for the corresponding measuring range of the strain gauge MIN.

UR3 (НР1, НР2) is used to form an additional set of resistors when servicing MIPs of the type ZTR, ZTR + TS, 4TP, 4TP + TS.

UR4 (НР4, НР5, НР6) provides the formation of a set of resistors for the corresponding measurement range of resistance thermal converters.

UR5 (НР7) is used to form a set of resistors of the corresponding nominal value in addition to the set of resistors formed for MIP type 1TP. It is used for servicing MIN type 2TP.1 (single strain gages with a common compensation strain gage).

UN (НР4, НР5, НР6) - serves to generate reference voltages for the corresponding measuring range of the generator voltage sensors.

UU (UU) - provides management of all AKM nodes. It is made in the form of a decoder of control codes from the IVK, which also determines the configuration of the reprogrammable normalizing converter (types of sensors, their nominal values, ranges of increment of nominal values, channel numbers, conversion time, etc.) into positional control codes in the IVK.

Codes NT-DO ... NT-D4 determine the type of MIP. Using the NT code, a circuit is formed in the AKM, which is the equivalent of a working sensor from the list of sensors serviced by the CPI. Depending on the type of MIP in UR1, UR3, UR5 (НР1, НР2, НР7) a set of resistors of the corresponding nominal value is formed. The selection of a set of resistors for the required nominal value is determined by the NP code.

Codes NP-DO ... NP-D2 determine the parameter number. Using the NP code, you can select:

- for strain gauge MIP - a set of resistors in UR1, UR3, UR5 (НР1, НР2, НР7) of the corresponding nominal value (100, 120, 200, 400, 800) Ohms;

- for resistance thermal converters - a set of resistors in UR4 (НР4, НР5, НР6) for the corresponding measuring range (0-17) Ohm, (0-100 Ohm, 0-1000 Ohm);

- for generator voltage sensors, the corresponding output voltage range (± 0.016 V, ± 0.1 V, ± 1.0 V) is set in UN (HP4, HP5, HP6);

Using codes N1 and DI for strain gauge MIPs in UR2, a set of resistors is selected for the corresponding measuring range (± 1 Ohm, ± 2 Ohm, ± 4 Ohm).

Codes NKT-D0 ... NKT-D3 determine the number of the control point. Using the NKT code in UR2, UR4 (НР3) UN, the corresponding point of the output characteristic of the AKM conversion is set: NKT = 0 - starting point ... NKT = 5 - midpoint ... NKT = 10 - end point.

The set of control codes NT, NP, NI, DI forms a measurement program (PI), written to the IVC data register in two bytes. Using the codes of the working program for measuring PI and, in addition, the NKT code, which are simultaneously supplied to the AKM, a conversion characteristic is generated at its output that corresponds to this type of MIP, its parameter (NP) and the measurement range.

This is determined by the requirements for the complete exclusion of the influence of the subjective factor from the operator’s actions at the stage of verifying the metrological characteristics of the CPI (in particular, connecting and switching the limits of the standard means, excluding the time factor, etc.).

The disadvantage of the proposed prototype is the construction of key elements using active compensation methods (including operational amplifiers in the switching circuit of sensor equivalents), which leads to the appearance of additional noise (reduced accuracy) and reduced performance.

The technical result is to increase the accuracy and speed of formation of the equivalent of the sensor, which is achieved by the fact that the automatic calibrator measures the measuring and computing complex to generate the precision values of the resistances and voltages used in the verification and calibration of tensometric, thermometric and thermoelectric paths of the measuring and computing complex, which includes composition sets of precision resistors and control device, consists of seven sets of reference rubber tori and ten additional multiplexers, where the resistors of the first and second sets are respectively connected in series and their common bus is connected to the input of the third set of series-connected resistors, the output of which is connected to the common bus of the fourth, fifth and sixth sets of series-connected resistors, with the inputs of the corresponding the resistors of the first and second sets are connected in parallel to two inputs of the first and second additional multiplexers, two outputs of which are connected by a common an additional multiplexer with current sources and measuring amplifiers of the measuring and computing complex, the third set of series-connected resistors is respectively connected to the third multiplexer, the output of which, like the midpoint of this set, are connected by a common additional multiplexer with current sources and measuring amplifiers of the measuring and computing complex, this is the fourth, fifth and sixth sets of series-connected resistors having a common bus connected by a common complement a multiplexer with current sources and measuring amplifiers of the measuring and computing complex, respectively, connected to the inputs of the fourth, fifth and sixth additional multiplexers, the outputs of which are interconnected and connected by a common additional multiplexer with current sources and measuring amplifiers of the measuring and computing complex, and the outputs of the fourth, the fifth and sixth sets of series-connected resistors are connected to the inputs of the eighth additional multiplexer, connecting its output with a common additional multiplexer with current sources and measuring amplifiers of the measuring and computing complex, while the midpoints of the fourth, fifth and sixth sets of resistors connected in series are connected to the inputs of the ninth additional multiplexer, the output of which is connected with current sources and measuring sources by a common additional multiplexer amplifiers of a measuring and computing complex, while the outputs of the seventh set of resistors are respectively parallel but connected to two inputs of the seventh additional multiplexer, the two outputs of which and the common bus of this set of resistors are connected by a common additional multiplexer with current sources and measuring amplifiers of the measuring and computing complex, and the control output of the measuring and computing complex is connected to the input of the control device, the outputs of which are connected to control inputs of all multiplexers.

In the dependent claims, various types of connecting the AKM to the IVK are presented, which simulates various equivalents of sensors with various schemes for their inclusion.

In figures 2, 3 ÷ 17 shows a functional diagram of the AKM and options for connecting its output / input to the circuits of the IVK.

Figure 18 shows the main window of the Metrolig program.

In figure 19 is a window confirming the successful opening of the file.

In figure 20 is a set of bookmarks with decryption and file processing.

The figure 21 indicates the number of levels of measurements.

The figure 22 - decryption of primary data.

In figure 23 - the message "report is generated successfully."

The figure 24 - processing of results.

In figure 25 - print the results.

Figure 26 shows the results of simultaneous verification of a 4-component socket (4TR) and a resistance thermometer using AKM and processed by the Excel complex. In this figure, row 1, 2, 3, 4 are 4TR strain gages, row 5 is a resistance thermometer (TC).

27 and 28 show the AKM board and the appearance of the AKM.

In the figure 29, the AKM is connected to the TENZOR information center (maintenance of 32 measuring channels).

In figures 3-17, the control signals are indicated in symbolic form, where:

1 - a set of resistors (NR1), corresponding to the applied values of the strain gauge sensors in the IVK R _H (Ohm) or their corresponding sum 2R _H , 3R _H (OM);

2 - a set of resistors (НР2), corresponding to the applied resistors of the strain gauge sensors in the IVK (R _H -5.0) Ohm;

3 - a set of resistors (NRH) in series of 10 resistors with a nominal value of 1 Ohm, a measuring range of strain gauge sensors in the IVK;

4 - a set of resistors (НР4) of 10 resistors connected in series with a nominal value of 2 Ohms, measuring range (0-20) Ohms of thermistor sensors in the IVK;

5 - a set of resistors (HP5) of 10 resistors connected in series with a nominal value of 10 Ohms, a measuring range (0-100) Ohms of thermistor sensors in the IVK;

6 - a set of resistors (NR6) of 10 resistors connected in series with a nominal value of 100 Ohms, a measuring range (0-1000) Ohms of thermistor sensors in the IVK;

7 - a set of resistors (NR7), corresponding to the applied nominal value of R _H Ohm strain gauge sensors in the IVK when connecting a circuit with a common compensation sensor;

8 - multiplexer switching denominations and schemes of inclusion of strain gauge sensors;

9 - multiplexer switching denominations and schemes of inclusion of strain gauge sensors;

10 - switching multiplexer 11 values of the increment of resistance of the strain gauge sensors in the measuring range through 1 Ohm, starting from the 0th value;

11 - switching multiplexer 11 values of the increment of the resistances of the thermistor sensors of the measuring range (0-20) Ohms after 2 Ohms, starting from the 0th value;

12 - switching multiplexer 11 values of the resistance increment of thermistor sensors of the measuring range (0-100) Ohm after 10 Ohm, starting from the 0th value;

13 - switching multiplexer 11 values of the resistance increment of thermistor sensors of the measuring range (0-1000) Ohm after 100 Ohm, starting from the 0th value;

14 - multiplexer switching ratings and switching circuits of compensation sensors;

15 - multiplexer switching denominations of resistance thermal converters;

16 - switching voltage reference multiplexer of voltage sensors;

17 - a common multiplexer for switching the outputs / inputs of the multiplexers M1 ... M9 to the corresponding outputs / inputs of the calibrator, depending on the generated sensor equivalent;

18 - control device AKM from the microprocessor IVK;

19 - measuring and computing complex (IVK);

20 - reference voltage source with the equivalent of the connected sensor in the IVK;

21 - the first measuring amplifier IVK;

22 - analog-to-digital converter IVK;

23 - the first "weighted" current source IVK;

24 - the second "weighted" current source IVK;

25 - second measuring amplifier IVK;

26 - input multiplexer IVK;

27 - input multiplexer IVK;

28 - input multiplexer IVK;

29th third measuring amplifier IVK;

30 - multiplexer IVK;

31 - multiplexer IVK;

32 - measuring amplifier LKM;

33 - AKM multiplexer;

34 - AKM multiplexer.

The device is as follows.

1. Figure 2 (the functional diagram of the AKM IVK) shows the series connection of sets of precision resistors 1, 2, 3 (HP1, HP2 and HPZ) connected via multiplexers 8, 9 and 10 (M1, M2, M3) to a common input / output multiplexer 17 (M10), which connects them to the CPI. The sets of reference resistors 4, 5 and 6 (НР4, НР5 and НР6) connected by a common point are also connected in series to the output of a set of precision resistors 1, 2, 3 (НР1, HP2 and ЗРЗ) and this point to a common multiplexer 17 (М10), and the midpoint of the set of resistors 4 (HP4) is connected to the input of the multiplexer 16 (M9), and the endpoint of this set of resistors 4 (HP4) is connected to the input of the multiplexer 15 (M8). The sets of resistors 4, 5 and 6 (НР4, НР5 and НР6) are each connected to their own multiplexer 11, 12 and 13 (М4, М5 and М6), the output of which is combined and connected to a common multiplexer 17 (M10). The midpoints of the sets of resistors 4, 5, 6 (НР4, НР5, НР6) are connected to the multiplexer 16 (М9), and the end points to the multiplexer 15 (М8), and the outputs of these multiplexers 15, 16 (М8, М9) are connected to the common multiplexer 17 (M10). The set of resistors 7 (НР7) is connected to the multiplexer 14 (М7), and the end point - to the common multiplexer 17 (М10). The control device 18 (CU) at the input is connected to the output of the microprocessor IVK and generates the corresponding control signals according to the measurement program (PI) to all control inputs of the multiplexers AKM 8, 9, 10, 11, 12, 13, 14, 15, 16 and 17 ( M1, M2, M3, M4, M5, M6, M7, M8, M9 and M10).

The invention is illustrated by figures 3-17, which shows the connection of the AKM to the IVK, simulating a variety of equivalents of sensors with different schemes for their inclusion. Accepted designations:

NT - number for specifying the type of sensor;

NP - parameter number for setting the sensor parameter (R _H , measuring range);

NKT - the number of the control point for setting the test value in the measuring range of the sensor;

NU - serial number of voltage for measurement in the ADC;

R _H is the nominal resistance value of the strain gauge equivalent;

I is the sensor supply current;

U _CR - conversion voltage at the input of the ADC;

ИУ - input measuring amplifier ИВК (ИУ1, ИУ2, ИУЗ);

K is the gain of the DUT (K _tr , K _tf , K _bottom );

AR - resistance increment set by the NKT code for equivalent strain gauge sensors;

R _t is the resistance value established by the NKT code for equivalents of resistance thermal converters (R _t1 , R _t2 , R _t3 );

ΔU is the voltage set by the NKT code for equivalents of sensors with voltage output (ΔU1, ΔU2, ΔU3, ΔU4).

The device operates as follows.

During metrological verification of a multichannel multifunctional IVK with AKM, normal working measurements are performed according to a given configuration program: type of sensors, their nominal value, switching circuit, operating range, conversion time, etc., previously recorded in the IVK microcontroller. These data also enter the AKM control unit (UC) from the IVK with an additional code that sets 11 values of the control point number (NKT), which determines the value on the scale range of the channel under study.

Next, a binary file of measurement results is determined, which is recorded and transmitted to an external computer for processing according to a program where reading, decryption and automated metrological data processing using the Metrologic program are performed.

Detailed simulations of each type of sensor equivalents generated by the AKM are presented in figures 3-17.

The control signals of the microprocessor IVK through the control signal decoding device 18 (CC) reconfigure the AKM structure to a predetermined mode, corresponding to a given measurement program.

2. Figure 3 shows the formation of calibration values for the equivalent of a single AKM strain gage connected via a four-wire connection diagram. A set of resistors 2 (НР2) contains five nominal values of resistors R _H - (95, 115, 195, 395 and 795) Ohm, a set of 10 series-connected resistors 3 (НРЗ) connected in series is connected to it in series. These “weighted” sets of resistors through a multiplexer 9 (M9) controlled by the NP signal and a multiplexer 17 (M10) controlled by the NT = 1 signal are connected to the current source 23 (signals I ₁ and I ₂ ) of the CPI 19. The potential outputs of the sets of resistors 2 (НР2) and 3 (НРЗ) are connected by multiplexers 9 (М2), 10 (МЗ), controlled by the NKT signal, and 17 (М10) with the measuring part of the IVK 19 (signals U ₂ and U ₃ ). The multiplexer 9 (M2) is controlled by an NP signal, which determines the nominal value of the selected sensor (95, 115, 195, 395 and 795) Ohms, and also connects its potential line to the multiplexer 17 (M10). The formation of 11 values of the full scale change in the nominal value of the selected sensor equivalent under the control of the NKT signal (control point number) is performed by multiplexer 10 (MV) with the help of 10 resistors 3 (NRZ), for example, for the sensor equivalent R _H = 100 OM there will be values (95, 96 , 97, 98, 99, 100, 101, 102, 103, 104 and 105) Ohm, which allows simulating during testing the forward and reverse strokes on the measurement scale.

A feature of connecting the equivalent of the sensor with AKM to the IVK 19 is the use of a reference voltage source 20 (U _H ) formed in the IVK 19 by supplying a reference resistor or a specific set of resistors to the reference (equivalent to a given type of sensor in the AKM) ACM sensor equivalent from weighted "source 23. This voltage (U _H = I · R _H ) compensates for the high potential (U ₂ -U ₃ ) with the equivalent of the AKM sensor and the potentials (U ₂ -U ₃ ) and U _H are fed to the differential input of the measuring amplifier 21, where their difference stands out eny, which increases with a predetermined coefficient K _Tp, and input to analog-to-digital converter (ADC) 22 for converting a coded equivalent. As a result of this procedure, the output of the AKM will be U _o = U ₂ -U ₃ = I · ((R _H -5) + ΔR), and the converted and amplified voltage will be equal to U _pr = I · (ΔR-5) · K _tr .

3. Figure 4 shows the formation of calibration values for the equivalent of half-bridge individual strain gages included in a four-wire connection diagram. The formation of the equivalent of the strain gauge TR, its increment of the resistance and the signal from it in the AKM, is carried out similarly as described above using a set of resistors 2 (НР2), 3 (НРЗ) and microprocessors 9 (М2), 10 (МЗ).

To form the equivalent of the TPK strain gage (compensation), a set of resistors 7 (НР7) is used, switched by a multiplexer 14 (M7), controlled by an NP signal, and connected to a multiplexer 17 (М10), controlled by a signal NT = 2, which is used to power a set of resistors 7 (НР7) ) connects the second "weighted" current source 24 with a current I _{2 of the} IVK 19, equal to the current I _{1 of the} current source 23 of the IVK 19.

In this case, the difference between the large voltages at the input of the measuring amplifier 21 (IU1) will be minimal due to the close equality of the voltages U ₂ and U ₄ . The output voltages from the equivalents of the AKM strain gages U ₁ and U _{6 are} connected to the "ground" bus of the current sources 23 and 24, and the voltages U ₃ and U ₅ to the bus of the virtual "ground" IVK 19. Then the difference and amplified signal U _{np is} fed to the ADC input . In this case, the calibrator outputs will correspond to:

U _o1 = U ₂ -U ₃ = I · ((R _H -5) + ΔR), U _oo2 = U ₄ -U ₅ = I · R _H ,

wherein U _ave = I · (ΔR-5) · K _tr.

4. Figure 5 shows the formation of calibration values for the equivalent of half-bridge strain gages with a common switching point, included in a five-wire connection diagram. The formation of the equivalent of the strain gage TR, its increment of resistance, as well as the signal from it in the AKM is performed similarly to that described in paragraph 2 using 2 (НР2), 3 (НРЗ), 9 (М2), 10 (МЗ).

In this case, two current sources 23 and 24 are connected in series, and their common point is connected to the virtual bus "ground" IVK 19, which is also connected to the output bus of the multiplexer 10 (MZ), controlled by the signal NT = 3. Signals from potential buses of resistive sets НР1, НР2 and НРЗ voltage U ₂ and U ₃ are fed to the differential input of the measuring amplifier 21 (IU1), and then to the input 22 of the ADC. At the same time, at the outputs of the calibrator:

U _out1 = U ₃ = I · ((R-5) + ΔR) + 2 · I · R _class , U _out2 = U ₂ = I · R _H + 2 · I · R _class , U _pr = I · (ΔR -5) K _tr

R _KL - total resistance in the connection circuits M2 and M10.

5. The figure 6 shows the formation of calibration values for the equivalent of half-bridge strain gages included in the four-wire connection scheme and the total compensation equivalent of the strain gage TR _to . The formation of the equivalent of the strain gage TR, its increment of resistance and the signal from it in the AKM is performed similarly to that described in paragraph 2 using a set of resistors 2 (НР2), 3 (НРЗ) and multiplexers 9 (М2), 10 (МЗ). To form the equivalent of the TP _k strain gage (compensation), a set of resistors 7 (НР7) is used, switched by a multiplexer 14 (M7) controlled by an NP signal and connected to a multiplexer 17 (M7) controlled by an NT = 4 signal, which is used to power a set of resistors 7 ( НР7) connects the second "weighted" current source 24 ИВК 19 with current I ₂ equal to current I ₁ . The inputs of the multiplexer 10 (MV) are connected to the set of resistors 3 (NRZ), and its output is connected via the multiplexer 17 (M10) to the virtual bus "ground" IVK 19, and the common bus of the set of resistors 7 (НР7) by the multiplexer 17 (М10) alternately connected to the ground bus of the current sources 23 and 24 of the IVK 19, or to the bus virtual “ground” of the IVK 19. The signals U ₂ and U _4-4 are fed to the differential input of the measuring amplifier 21 (IU1), and then to the input 22 of the ADC. At the same time, at the outputs of the calibrator:

U _o1 = U ₂ · U ₃ = I · ((R _H -5) + ΔR), and

U = U _{Out2 4-4 5-4} -U = I _H · R · U _ave = I · (ΔR-5) · K _tr.

6. The figure 7 shows the formation of calibration values of the equivalent of full bridge isolated strain gages included in a four-wire connection diagram. In this embodiment, the output voltage is modeled and scaled with the equivalent of a bridge circuit for activating strain gages. The sensor type is selected from the set of resistors 2 (НР2) with a series-connected set of resistors 3 (НРЗ), which are powered from the current source 23 of the IVK 19 through multiplexers 9 (M2), controlled by the NP signal, and 17 (M10), controlled by the signal NT = 5. A feature of this scheme is the connection of a potential bus with an output signal U ₂ to the midpoint of a set of resistors 3 (NRZ), and its output bus is connected by a multiplexer 17 (M10), as well as a current source 23, to the virtual ground bus of the IVK 19. Multiplexer output 10 (MOH) is connected to a multiplexer 17 (M10), the output signal of which, together with the signal U _{2, is} supplied to the differential input of the measuring amplifier 21 (IU1). The output signal ΔU = U ₂ -U ₃ is simulated, which is equal to: NKT0 - 20 mV, NKT1 - 16 mV, NKT2 - 12 mV, NKT3 - 8 mV, NKT4 - 4 mV, NKT5 - 0 mV, NKT6 - +4 mV, NKT7 - +8 mV, NKT8 - +12 mV, NKT9 - +16 mV, NKT10 - +20 mV.

The signal output from the calibrator: U _o = U ₂ -U ₃ = ΔU, U _CR = ΔU · K _tr .

7. The figure 8 shows the formation of calibration values of the equivalent of the full bridge circuit of the strain gauges included in the four-wire connection diagram, with a common point of connection to the bus virtual "ground" IVK 19.

In this embodiment, the output voltage is modeled and scaled with the equivalent of a bridge circuit for activating strain gages. The sensor type is selected from the set of resistors 2 (НР2) with a series-connected set of resistors 3 (НРЗ), which are fed from the current source 23 of the IVK 19 through multiplexers 9 (M2), controlled by the NP signal, and 17 (M10), controlled by the signal NT = 6. A feature of this scheme is the connection of buses of a set of resistors 3 (NRZ), and the middle point of a set of resistors 3 (NRZ) is connected to a multiplexer 17 (M10), and the output bus of a set of resistors 3 (NRZ), as well as a current source 23, is connected to a virtual bus "Ground" IVK 19 through the multiplexer 17 (M10).

The signals U ₂ and U ₃ from the multiplexer 17 (M10) are fed to the differential input of the measuring amplifier 21 (IU1). In this case, the output signal ΔU = U ₂ -U ₃ is simulated equal to: NKT0 - 20 mV, NKT1 - 16 mV, NKT2 - 12 mV, NKT3 - 8 mV, NKT4 - 4 mV, NKT5 - 0 mV, NKT6 - +4 mV , NKT7 - +8 mV, NKT8 - +12 mV, NKT9 - +16 mV, NKT10 - +20 mV.

The output signal from the calibrator: U _o = U ₂ -U ₃ = ΔU, U _CR = ΔU · K _Tr .

8. Figure 9 shows the formation of calibration values for the equivalent of a 3-component strain gauge outlet. Since the equivalents of the strain gauge sensors are connected in series, therefore, due to the insufficient current value of the IVK 19, equivalents with a nominal value of R _H = 100, 120 and 200 Ohms are used, the equivalent of which is formed by the AKM.

The equivalent of a strain gauge socket is formed by a series connection of sets of resistors 1 (НР1), 2 (НР2) and 3 (НРЗ). A set of resistors 1 (HP1) determines the double value of the selected sensor value 2R _H = 200, 240 and 400 Ohms, respectively, a set of resistors 2 (НР2) determines R _H -5 = 95, 115 and 195 Ohms, and a set of resistors 3 (НРЗ) consists of 10 series-connected single-ohm resistors. Multiplexers 8 (M1), controlled by the signal NP, and 17 (M10), controlled by the signal NT = 7, connect the current source 23 IVK 19 to power the selected equivalent strain gauge sockets in the AKM. The multiplexer 9 (M2), controlled by the NP signal, also determines the value of R _H -5 of the selected equivalent strain gauge sockets in the AKM. The outputs of these multiplexers are connected to the multiplexer 17 (M10), which sequentially switches the signals (voltage U ₁ , U ₂ , U ₂ , U ₄ ) to the input of the multiplexer 26, controlled by the signal NU, IVK 19 - serial number of voltage connection for measurement in the ADC 22 (NU = 0, NU = 1, NU = 2). According to the NU signals, the voltages for measurement in the ADC 22 will correspond to:

when NU = 0 U _out1 = U ₁ -U ₂ = I · ((R _H -5) + ΔR),

when NU = 1 U _out2 = U ₂ -U ₃ = I · ((R _H -5) + ΔR),

when NU = 2 U _out3 = U ₃ -U ₄ = I · ((R _H -5) + ΔR).

In this case, one of the outputs of the multiplexer 26 of the IVK 19 is connected to the virtual ground bus of the IVK 19, and the other to one of the differential inputs of the measuring amplifier 21 (ИУ1), and the reference voltage U _H = I · R _{H is} applied to the other input of this amplifier, and its output is connected to the input of the ADC 22, the input of which will be sequentially supplied voltage:

U _CR 1 = I · (ΔR-5) · K _Tr

U _CR2 = I · (ΔR-5) · K _Tr

U _CR3 = I · (ΔR-5) · K _Tr .

9. Figure 10 shows the formation of calibration values for the equivalent of a 4-component strain gauge outlet. Since the strain gauge sensors are connected in series, the resistance equivalents R _H = 100, 20 and 200 Ohms, the equivalent of which is formed by the AKM, are used due to the insufficient current value of the IVK 19.

The equivalent of a strain gauge socket is formed by a series connection of sets of resistors 1 (НР1), 2 (НР2) and 3 (НРЗ). Set 1 (NR1) determines the triple value of the selected sensor rating 3R _H = 300, 360 and 600 Ohms, respectively, a set of resistors 2 (NR2) determines R _H -5 = 95, 115 and 195 Ohms, and set 3 (NRZ) consists of 10 series-connected single-ohm resistors.

Multiplexers 8 (M1), controlled by the NP signal, and 17 (M10), controlled by the signals NT = 8 and NU, connect the current source 23 of the IVK 19 to power the selected equivalent strain gauge socket in the AKM. The multiplexer 9 (M2), controlled by the NP signal, also determines the value of R _H -5 of the selected equivalent strain gauge sockets in the AKM. The outputs of these multiplexers are connected to the multiplexer 17 (M10), which sequentially switches the signals from them (voltage U ₁ , U ₂ , U ₃ , U ₄ , U ₅ ) to the input of the multiplexer 26, controlled by the signal NU IVK 19 - serial number of voltage connection for measurements in ADC 22 (NU = 0, NU = 1, NU = 2, NU = 3). According to the NU signals, the voltages for measurement in the ADC 22 will correspond to:

when NU = 0 U _out1 = U ₁ -U ₂ = I · ((R _H -5) + ΔR),

when NU = 1 U _out2 = U ₂ -U ₃ = I · ((R _H -5) + ΔR),

when NU = 2 U _out3 = U ₃ -U ₄ = I · ((R _H -5) + ΔR),

when NU = 3 U _o4 = U ₄ -U ₅ = I · ((R _H -5) + ΔR).

In this case, one of the outputs of the multiplexer 26 of the IVK 19 is connected to the virtual ground bus of the IVK 19, and the other to one of the differential inputs of the measuring amplifier 21 (ИУ1), and the reference voltage U _H = I · R _{H is} applied to the other input of this amplifier, and its output is connected to the input of the ADC 22, the input of which will be sequentially supplied voltage:

U _CR 1 = I · (ΔR-5) · K _Tr

U _CR2 = I · (ΔR-5) · K _Tr

U _CR3 = I · (ΔR-5) · K _Tr

U _CR4 = I · (ΔR-5) · K _Tr .

10. The figure 11 shows the formation of calibration values of the equivalent connected in a five-wire circuit of a single strain gauge with a resistance thermoconverter connected in series. A set of resistors 2 (НР2) contains five nominal values of resistors R _H (95, 115, 195, 395 and 795) Ohm, a set of 10 series-connected single-resistor resistors (NRH) is connected in series to it. These sets of resistors and a series of 10 series-connected two-ohm resistors 4 (НР4) connected in series through multiplexers 9 (M9), controlled by the NP signal, multiplexer 17 (M10), controlled by the signal NT = 9 and NU, and multiplexer 15 (M8) controlled by the signal NP = 0 are connected to the current source 23 (signals 11 and 12) of the IVK 19. The potential outputs of the sets of resistors 2 (НР2) and 3 (НРЗ) are connected by multiplexers 9 (М2), 10 (МЗ), controlled by the signal NKT, and 17 (M10) with the measuring part of the IVK 19 (signals U4 and U5). The common bus of the multiplexer 11 (M4) through the multiplexer 17 (M10) (signal U6) is connected to the input of the multiplexer 28, controlled by the signal NU = 4 IVK 19, which is periodically connected to the virtual ground bus of the IVK 19. The multiplexer 9 (M2) is controlled by the signal NP, which determines the rating of the selected sensor (95, 115, 195, 395 and 795) Ohm, also connects its potential bus (signal U ₄ ) to the multiplexer 17 (M10), which connects it to the input of the multiplexer 27 IVK 19. Formation of 11 values full scale variation of the nominal value of the selected equivalent single strain gauge a store under the control of the NKT signal (control point number) is produced by a multiplexer 10 (MZ) using 10 resistors 3 (NRM), the common bus of the multiplexer 10 (MN) and a bus from a common connection point of a set of resistors 3 (NRM) and 4 ( НР4) are connected to the multiplexer 17 (М10), which alternately switches them with control signals NU = 3 and NU = 4 to the signal bus U5, while it is fed to the input of multiplexers 27 of the IVK 19, controlled by NU = 3, and 28 of the IVK 19, controlled NU = 4. The bus with a signal U _{4 is} also connected to another input of the IVK 19 multiplexer 27, the output of which connects it to the input of the measuring amplifier 21 (ИУ1), the second input of which is supplied with a reference voltage U _n relative to the bus virtual ground “IVK 19, to which the signal NU = 3 multiplexer 27 IVK 19 connects the signal bus U5. This voltage (U _H = I · R _H ) compensates for the high potential with the equivalent of the AKM strain gauge sensor. Potentials (U ₄ -U ₅ ) and U _H are supplied to the differential input of the measuring amplifier 21, where the difference of these voltages is allocated, which is amplified with a given coefficient K _tr and periodically passes through the multiplexer 30, controlled by the signal NU = 3, to the analog-digital input a converter (ADC) 22 for conversion to a code equivalent.

To form the equivalent of the resistance thermal converter, a set of resistors 4 (НР4) is used, connected in series with sets of resistors 2 (НР2) and 3 (НРЗ), the output bus of which is connected to the input of multiplexer 15 (M8), controlled by the signal NP = 0, the output of which is connected to input multiplexer 17 (M10), while its output is connected to the ground bus of the IVK 19. The formation of 11 values of the full scale of the nominal value of the selected equivalent of the resistance thermocouple under the control of the NKT signal (control point number) is performed lithlexer 11 (M4) using 10 resistors 4 (НР4). A set of resistors 4 (НР4) is connected to the multiplexer 11 (М4), the output of which is connected to the input of the multiplexer 17 (М10), which at its output forms a signal bus U ₆ connected to the first input of the multiplexer 28 IVK 19, controlled by the signal NU = 4, to the second input of which the signal bus U ₅ is connected. In this case, the first output of the IVK 19 multiplexer 28 (signal U ₅ ) is connected to the first input of the IVK 19 measuring amplifier 25 (ИУ2), and its second input is connected to the virtual ground bus of the IVK 19, to which the second output of the IVK 19 multiplexer 28 is also connected (signal U ₆ ).

The signal from the equivalent of the AKM resistance thermoconverter is determined by determining the difference of the signals U ₅ and U ₆ on the measuring amplifier 25, the output of which is periodically connected to the output of the multiplexer 31 controlled by the signal NU = 4, also to the input of the ADC 22 of the IVK 19. As a result of this procedure, with AKM output:

when NU = 3 U _out1 = U ₄ -U ₅ = I · ((R _H -5) + ΔR),

when NU = 4 U _out2 = U ₅ -U ₆ = I · R _t ,

and the converted and amplified voltage will be equal to:

U _CR 1 = I · (ΔR-5) · K _Tr

U _CR2 = I · R _t · K _tr

11. Figure 12 shows the formation of calibration values for the equivalent of a 3-component strain gauge outlet with a resistance thermoconverter. Since the strain gauge sensors are connected in series, therefore, due to the insufficient current value of the IVK 19, sensors R _H = 100, 120, and 200 Ohms are used, the equivalent of which is formed by the AKM and the equivalent of the resistance thermal converter 20 Ohm.

The equivalent of a strain gauge outlet is formed by series connection of a set of resistors 1 (НР1), 2 (НР2) and 3 (НРЗ). Set 1 (НР1) determines the double value of the selected sensor value 2R _H = 200, 240 and 400 Ohms, respectively 2 (НР2) determines R _H -5 = 95, 115 and 195 Ohms, and set 3 (НРЗ) consists of 10 series-connected single ohm resistors.

The resistance thermoconverter equivalent includes a set of resistors 4 (НР4) of 10 series-connected two-ohm resistors, connected in series with the equivalent of the strain gauge socket. The formation of 11 values of the full scale change in the nominal value of the equivalent of a single strain gauge under the control of the NKT signal (control point number) is performed by multiplexer 10 (МЗ) with the help of 10 resistors 3 (НРЗ). The formation of 11 values of the full scale change in the nominal value of the resistance thermal converter under the control of the NKT signal (control point number) is performed by multiplexer 11 (M4) using 10 resistors 4 (НР4). Multiplexers 8 (M1), controlled by the NP signal, and 17 (M10), controlled by the signals N = 7 and NU, connect the current source 23 of the IVK 19 to supply the selected equivalent of the strain gauge socket in an AKM with a resistance temperature transducer. The multiplexer 9 (M2), controlled by the NP signal, also determines the value of R _H -5 of the selected equivalent strain gauge sockets in the AKM. The outputs of the multiplexers 8 (M1), 9 (M2), 10 (MOH), 11 (M4) and 15 (M8) are connected to the multiplexer 17 (M10), which sequentially switches the signals from them (voltage U ₁ , U ₂ , U ₃ , U ₄ ) to the input of multiplexer 26, controlled by the NU signal of the IVK 19. The NU signal determines the order of voltage connection for measurement in the ADC (NU = 0, NU = 1, NU = 2), which will correspond to:

when NU = 0 U _out1 = U ₁ -U ₂ = I · ((R _H -5) + ΔR),

when NU = 1 U _out2 = U ₂ -U ₃ = I · ((R _H -5) + ΔR),

when NU = 2 U _out3 = U ₃ -U ₄ = I · ((R _H -5) + ΔR),

In this case, one of the outputs of the multiplexer 26 (M7) IVK 19 is connected to the virtual ground bus, and the other to one of the differential inputs of the first measuring amplifier 21 (ИУ1), and the reference voltage U _H = I · R is applied to the other input of this amplifier _H , and its output is connected by a multiplexer 30 controlled by a signal NU = 0, 1, 2, to the input of which periodically in order they will be fed from the measuring amplifier 21 (IU1) to the input of the ADC 22 voltage IVK 19:

U _CR 1 = I · (ΔR-5) · K _Tr

U _CR2 = I · (ΔR-5) · K _Tr

U _CR3 = I · (ΔR-5) · K _Tr .

The signal from the equivalent of the resistance thermal converter, a set of resistors 4 (НР4) connected to the inputs of the multiplexer 11 (М4), controlled by the signals NKT and NP = 0, whose common bus is via the multiplexer 15 (М8), controlled by the signal NP = 0, and the multiplexer 17 ( M10) is connected to the ground bus of the IVK 19. In this case, the output bus of the multiplexer 11 (M4) (signal U ₅ ) is switched by the multiplexer 17 (M10) to the first input of the multiplexer 27 of the IVK 19, controlled by the signal NU = 7, the output of which is connected to the second differential input of the second measuring amplifier 27 (IU2) IVK 19, which is connected to the virtual ground cable of the IVK 19. To the other input of the second measuring amplifier 25 (IV2) IVK 19 from the output of the multiplexer 27 of the IVK 19, the signal U ₅ is supplied from the common connection point of the equivalent of a 3-component strain gauge socket with a resistance temperature transducer, while this is the output the second measuring amplifier 25 (ИУ2) ИВК 19 is connected to the input of the multiplexer 30 controlled by the signal NU = 7 ИВК 19. The outputs of the multiplexers 30 and 31 ИВК 19 are connected and alternately connect the outputs of the measuring amplifiers 21 (ИУ1) and 25 (ИУ2) ИВК 19 to the input ADC 22. At the input One measuring amplifier 25 (IU2), with the control signal NU = 7, U _output3 = U ₄ -U ₅ = I · ((R _H -5) + ΔR), and the voltage U _pr3 = I · R _t · K _tr

12. Figure 13 shows the formation of calibration values for the equivalent of a 4-component strain gauge outlet with a resistance thermoconverter. Since the strain gauge sensors are connected in series, therefore, due to the insufficient current value of the IVK 19, sensors R _H = 100, 120, and 200 Ohms are used, the equivalent of which is formed by the AKM and the equivalent of the resistance thermal converter 20 Ohm.

The equivalent of a strain gauge outlet is formed by series connection of a set of resistors 1 (НР1), 2 (НР2) and 3 (НРЗ). Set 1 (NR1) determines the triple value of the selected sensor rating 3R _H = 300, 360 and 600 Ohms, respectively, a set of resistors 2 (NR2) determines R _H -5 = 95, 115 and 195 Ohms, and set 3 (NRZ) consists of 10 series-connected single-ohm resistors. The resistance thermoconverter equivalent includes a set of resistors 4 (НР4) from 10 series-connected two-ohm resistors, connected in series with the equivalent of a strain gauge socket. The formation of 11 values of the full scale change in the nominal value of the equivalent of a single strain gauge under the control of the NKT signal (control point number) is performed by multiplexer 10 (MZ) using 10 resistors 3 (NRZ). The formation of 11 values of the full scale change in the nominal value of the resistance thermal converter under the control of the NKT signal (control point number) is performed by multiplexer 11 (M4) using 10 resistors 4 (HP4). The multiplexer 8 (M1), controlled by the NP signal, and the multiplexer 17 (M10), controlled by the signals N = 7 and NU, connect the current source 23 of the IVK 19 to power the selected equivalent of the strain gauge socket in the AKM with a resistance temperature converter. The multiplexer 9 (M2), controlled by the NP signal, also determines the value of R _H -5 of the selected equivalent strain gauge sockets in the AKM. The outputs of the multiplexers 8 (M1), 9 (M2), 10 (MOH), 11 (M4) and 15 (M8) are connected to the multiplexer 17 (M10), which sequentially switches the signals from them (voltage U ₁ , U ₂ , U ₃ , U ₄ , U ₅ ) to the input of the multiplexer 26, controlled by the signal NU, IVK19.

The NU signal determines the order of voltage connection for measurement in the ADC (NU = 0, NU = 1, NU = 2 NU = 3), which will correspond to:

when NU = 0 U _out1 = U ₁ -U ₂ = I · ((R _H -5) + ΔR),

when NU = 1 U _out2 = U ₂ -U ₃ = I · ((R _H -5) + ΔR),

when NU = 2 U _out3 = U ₃ -U ₄ = I · ((R _H -5) + ΔR),

when NU = 3 U _o4 = U ₄ -U ₅ = I · ((R _H -5) + ΔR).

In this case, one of the outputs of the multiplexer 26 of the IVK 19 is connected to the virtual ground bus of the IVK 19, and the other to one of the differential inputs of the first measuring amplifier 21 (ИУ1), and the reference voltage U _n = I · R _{H is} applied to the other input of this amplifier , and its output is connected by a multiplexer 31, controlled by a signal NU = 0, 1, 2, 3, to the input of which it will periodically be fed in order from the measuring amplifier 21 (IU1) to the input of the ADC 22 voltage IVK 19:

U _CR 1 = I · (ΔR-5) · K _Tr

U _CR2 = I · (ΔR-5) · K _Tr

U _CR3 = I · (ΔR-5) · K _Tr

U _CR4 = I · (ΔR-5) · K _Tr .

The signal from the equivalent of the resistance thermal converter, a set of resistors 4 (НР4) connected to the inputs of the multiplexer 11 (М4), controlled by the signals NKT and NP = 0, whose common bus is via the multiplexer 15 (М8), controlled by the signal NP = 0, and the multiplexer 17 ( M10) is connected to the ground bus of the IVK 19. In this case, the output bus of the multiplexer 11 (M4) (signal U ₆ ) is switched by the multiplexer 17 (M10) to the first input of the multiplexer 27 of the IVK 19, controlled by the signal NU = 7, the output of which is connected to the second differential input of the second measuring amplifier 25 (ИУ2) ИВК 19, which is connected to the virtual ground bus of the IVK 19. To the other input of the second measuring amplifier 25 (ИУ2) ИВК 19 from the output of the multiplexer 27 ИВК 19, the signal U ₅ is supplied from the common connection point of the equivalent of the 4-component resistance strain gauge outlet with a resistance temperature transducer, at the output of the second measuring amplifier 25 (ИУ2) ИВК 19 is connected to the input of the multiplexer 31, controlled by the signal NU = 4, ИВК 19. The outputs of the multiplexers 30 and 31 ИВК 19 are connected and alternately connect the outputs of the measuring amplifiers 21 (ИУ1) and 25 (ИУ2) ИВК 19 to the input of the ADC 22. N and the input of the measuring amplifier 25 (IU2), with the control signal NU = 4, U _output5 = U ₅ -U ₆ = I · R _t , and the input of the ADC 22 voltage U _CR4 = I · R _t · K _tf .

In this case, the generated values of the increment of the equivalent resistance of the elements of the tensor outlet (ΔR) and resistance thermometer (R _t ) by the NKT signal will be respectively (Ohm):

NKT-0 ΔR = 0 R _t = 0; NKT = 1 ΔR = 1 R _t = 2; NKT = 2 ΔR = 2 R _t = 4; NKT = 3 ΔR = 3 R _t = 6; NKT = 4 ΔR = 4 R _t = 8; NKT = 5 ΔR = 5 R _t = 10; NKT = 6 ΔR = 6 R _t = 12; NKT = 7 ΔR = 7 R _t = 14; NKT = 8 ΔR = 8 R _t = 16; NKT = 9 ΔR = 9 R _t = 18; NKT = 10, ΔR = 10 R _t = 20.

13. The figure 14 shows the formation of calibration values of the equivalent thermocouple resistance. AKM has three sets of resistances:

4 (НР4) with values of R _t1 0, 2, 4, 6, 8, 10, 12, 14, 16, 18 and 20 Ohms;

5 (НР5) with values of R _t2 0, 10, 20, 30, 40, 50, 60, 70, 80, 90 and 100 Ohms;

6 (НР6) with values of R _t3 0, 100, 200, 300, 400, 500, 600, 700, 800, 900 and 1000 Ohms, which corresponds to the maximum resistance values connected to the IVK 19 resistance thermocouples equal to R _t1 = 20 Ohm , R _t2 = 100 Ohms and R _t3 = 1000 Ohms.

They are respectively connected to multiplexers 11 (M4), 12 (M5), 13 (M6), controlled by NP and NKT signals, which select and switch sets of resistors: for NP = 0, set 4 (НР4), NP = 1, set 5 (НР5 ), NP-2 set 6 (НР6). The multiplexers 15 (M8), controlled by the signal NP, and 17 (M10), controlled by the signal NT = 12, the current from the source 23 IVK 19 is supplied to these sets. The multiplexers 11 (M4), 12 (M5), 13 (M6) are controlled by signals NKTs, which sequentially switch the sets of resistors 4 (НР4), 5 (НР5), 6 (НР6), and all the outputs of the multiplexers are combined and alternately connected (signal U3) to the virtual bus "ground" of the IVK 19, to which one of the combined differential inputs of the measuring amplifier 25 (IU2), and to another differential input of this measuring amplifier Ithel U ₂ is supplied with a common signal bus 4 sets of resistors (HP4), 5 (HP5), 6 (NR6), switchable by the multiplexer 17 (M10).

The output of the measuring amplifier 25 (ИУ2) ИВК 19 is connected to the input of the ADC 22 by signals NP = 2. In this case, the output of the calibrator will be:

when NU = 0 U _out1 = U ₂ -U ₃ = I · R _t1 · U _CR = I · R _t1 · K1 _tf ,

when NU = 1 U _out1 = U ₂ -U ₃ = I · R _t2 · U _ol = I · R _t2 · K2 _tf ,

when NU = 2 U _out1 = U ₂ -U ₃ = I · R _t3 · U _ol = I · R _t3 · K3 _tf ,

14. The figure 15 shows the formation of calibration values of the equivalent of a 3-component strain gauge sockets with a common isolated compensation strain gauge. Since the strain gauge sensors are connected in series, the sensors R _H = 100, 120 and 200 Ohms, the equivalent of which are formed by the AKM, are used due to the insufficient current value of the IVK 19. The equivalent of a strain gauge outlet is formed by series connection of a set of resistors 1 (НР1), 2 (НР2) and 3 (НРЗ). Set 1 (НР1) determines the double value of the selected sensor value 2R _H = 200, 240 and 4000 m, respectively 2 (НР2) determines R _H -5 = 95, 115 and 1950 m, and set 3 (НРЗ) consists of 10 series-connected single ohm resistors. Multiplexers 8 (M1), controlled by the NP signal, and 17 (M10), controlled by the signals NT = 13 and NU, connect the current source 23 of the IVK 19 to power the selected equivalent strain gauge outlet in the AKM. The multiplexer 9 (M2), controlled by the NP signal, also determines the value of R _H -5 of the selected equivalent strain gauge sockets in the AKM. The outputs of these multiplexers are connected to a multiplexer 17 (M10), which sequentially switches the signals from them (voltages U ₁ , U ₂ , U ₃ , U ₄ ) to the input of the multiplexer 26, controlled by the NU signal, IVK 19 by the NU signals - voltage serial number for measurements in the ADC (NU = 0, NU = 1, NU = 2), which will correspond to:

when NU = 1 U _out1 = U ₁ -U ₂ = I · ((R _H -5) + ΔR)

when NU = 2 U _out2 = U ₂ -U ₃ = I · ((R _H -5) + ΔR),

when NU = 3 U _out3 = U ₃ -U ₄ = I · ((R _H -5) + ΔR).

In this case, one of the outputs of the multiplexer 26 of the IVK 19 is connected to the virtual ground bus of the IVK 19, and the other to one of the differential inputs of the measuring amplifier 21 (ИУ1), and its output is connected to the input of the ADC 22, the input of which will be supplied with voltage in series:

U _CR 1 = I · (ΔR-5) · K _Tr

U _CR2 = I · (ΔR-5) · K _Tr

U _CR3 = I · (ΔR-5) · K _Tr .

In this case, the reference voltage U _H = I · R _H is removed from the set of compensation resistors 7 (НР7) connected via multiplexers 17 (М10) and 14 (М7), controlled by the NP signal, to the current source 24 of the IVK 19. Currents of current sources 23 and 24 are equal. The voltage U _H = I · R _H is supplied to another differential input of the measuring amplifier 21 (IU1).

At the same time, according to the signal NU = 0, 1, 2 U _o = (U ₄ -4) - (U ₅ -4) -U _H = I · R _H , ac of the output of the measuring amplifier 21 (IU1), alternately, the ADC input 22 enters voltage:

U _CR 1 = I · (ΔR-5) · K _Tr

U _CR2 = I · (ΔR-5) · K _Tr

U _CR3 = I · (ΔR-5) · K _Tr .

15. Figure 16 shows the formation of calibration values for the equivalent of a 4-component strain gauge socket with a common compensation strain gauge. Since the strain gauge sensors are connected in series, the sensors R _H = 100, 120 and 200 Ohms, the equivalent of which are formed by the AKM, are used due to the insufficient current value of the IVK 19. The equivalent of a strain gauge outlet is formed by series connection of a set of resistors 1 (НР1), 2 (НР2) and 3 (НРЗ). Set 1 (НР1) determines the triple value of the selected sensor rating 3R _H = 300, 340 and 600 Ohms, respectively, set 2 (НР2) determines R _H -5 = 95, 115 and 195 Ohms, and set 3 (НРЗ) consists of 10 in series included single-ohm resistors. The multiplexer 8 (M1), controlled by the NP signal, and the multiplexer 17 (M10), controlled by the signals NT = 14 and NU connect the current source 23 of the IVK 19 to power the selected equivalent strain gauge socket in the AKM. The multiplexer 9 (M2) also determines the value of R _H -5 of the selected equivalent strain gauge sockets in the AKM. The outputs of the multiplexers 9 (M2) and 10 (M2) are connected to the multiplexer 17 (M10), controlled by the NKT signals, which from them sequentially switches the signals (voltage U1, U2, U3, U4,) to the input of the multiplexer 26, controlled by the signal NU, IVK 19 according to the signals with the NU-serial number of the voltage for measurement in the ADC (NU = 0, NU = 1, NU = 2, NU = 3), which will correspond to:

when NU = 0 U _out1 = U ₁ -U ₂ = I · ((R _H -5) + ΔR),

when NU = 1 U _out2 = U ₂ -U ₃ = I · ((R _H -5) + ΔR),

when NU = 2 U _out3 = U ₃ -U ₄ = I · ((R _H -5) + ΔR),

when NU = 3 U _o4 = U ₄ -U ₅ = I · ((R _H -5) + ΔR).

In this case, one of the outputs of the multiplexer 26 of the IVK 19 is connected to the virtual ground bus of the IVK 19, and the other to one of the differential inputs of the measuring amplifier 21 (ИУ1), and the reference voltage U _H = I · R _{H is} applied to the other input of this amplifier, and its output is connected to the input of the ADC 22, the input of which will be sequentially supplied voltage:

U _CR 1 = I · (ΔR-5) · K _Tr

U _CR2 = I · (ΔR-5) · K _Tr

U _CR3 = I · (ΔR-5) · K _Tr

U _CR4 = I · (ΔR-5) · K _Tr .

In this case, the reference voltage U _H = I · R _H is removed from the set of compensation resistors 7 (НР7) connected via multiplexers 17 (М10) and 14 (М7), controlled by the NP signal, to the current source 24 of the IVK 19. Currents of the current sources 23 and 24 are equal. This voltage U _H = I · R _H is supplied to another differential input of the measuring amplifier 21 (IU1). Moreover, according to the signal NU = 0, 1, 2, 3:

U _o = (U ₄ -4) - (U ₅ -4) = U _H = I · R _H , and from the output of the measuring amplifier 21 (IU1), the following voltages are input to the ADC 22:

U _CR 1 = I · (ΔR-5) · K _Tr

U _CR2 = I · (ΔR-5) · K _Tr

U _CR3 = I · (ΔR-5) · K _Tr

U _CR4 = I · (ΔR-5) · K _Tr .

16. The figure 17 shows the formation of calibration values of the equivalent voltage sensor. To form the voltage increment at the output of the AKM, sets of resistors 4 (НР4), 5 (НР5) and 6 (НР6) are used, respectively connected to multiplexers 11 (М4) controlled by NKT and NP = 0, 12 (M5) controlled by NKT and NP = 1, and 13 (M6) controlled by NKT and NP = 2, the outputs of which are combined and connected to the inputs of the multiplexer 34, controlled by NP = 0,1,2, and measuring amplifier 32 (IC) of the AKM unit. The inputs of the resistor sets 4 (НР4), 5 (НР5) and 6 (НР6) are combined and, through a multiplexer 17 (М10) controlled by NT = 15, are connected to one of the output bus of the current source 23 ИВК 19, which is connected to the virtual ground bus »IVK 19. Other outputs of resistor sets 4 (НР4), 5 (НР5) and 6 (НР6) are connected to the inputs 15 (М8) of the multiplexer controlled by NP, the output of which is connected via the multiplexer 17 (М10) to another output bus of the current source 23 IVK 19. The average outputs of the sets of resistors 4 (НР4), 5 (НР5) and 6 (НР6), used as reference, are connected to the inputs of the multiplexer 16 (М9 ), controlled by NP, one of the inputs of which is also connected to the virtual ground bus, and its output through the multiplexer 17 (M10) to one of the differential inputs of the measuring amplifier 29 (IUZ) of the IVK 19. In this case, the following signals are generated from the NKT and NP signals voltage in millivolts (mV):

NP = 0 NP = 1 NP = 2 NP = 3 NKT ΔU1 (mV) ΔU2 (mV) ΔU3 (mV) ΔU4 (mV) 0 -twenty -one hundred -1000 -5000 one -16 -80 -800 -4000 2 -12 -60 -600 -3000 3 -8 -40 -400 -2000 four -four -twenty -200 -1000 5 0 0 0 0 6 +4 +20 +200 +1000 7 +8 +40 +400 +2000 8 +12 +60 +600 +3000 9 +16 +80 +800 +4000 10 +20 +100 +1000 +5000

The voltage AU4 is obtained by amplifying the AU3 signal by a factor of 32 by the amplifier 32 AKM when applying the control signal NP = 3 to the multiplexer 34, which connects the output of the amplifier 32 32 AKM through the multiplexer 34, controlled by NP = 3, and the multiplexer 17 (M10) to another differential input of the measuring amplifier 29 (IUZ) IVK 19, which is also connected to the output of the multiplexer 34 through the multiplexer 17 (M10). In this case, the output of the calibrator will be the voltage coming from the measuring amplifier 29 (IUZ) to the input of the ADC 22 IVK 19:

NP = 0 U _o1 = U ₁ -U ₂ = ΔU ₁ U _CR = ΔU ₁ · K1 _days NP = 1 U _o2 = U ₁ -U ₂ = ΔU ₂ U _ol = ΔU ₂ · K2 _days NP = 2 U _o3 = U ₁ -U ₂ = ΔU ₃ U _ol = ΔU ₃ · K3 _days NP = 3 U _out4 = U ₁ -U ₂ = ΔU ₄ U _ol = ΔU ₄ · K4 _days

The Metrologic program is designed to process data in order to obtain channel metrological characteristics. The program calculates individual and typical metrological characteristics in accordance with the standard methodology. To obtain primary data, a multifunctional automatic calibrator of measures (AKM) is connected to the 32nd input channels of the IVC, which automatically generates the corresponding reference values of the resistors and voltages.

The basis for the exchange of data between the data acquisition program with the AKM and the Metrologic program is a binary file whose structure is similar to the file of the measurement program recorded in the microprocessor IVK. The result of the program is the output of data on the display, in a text file and, if necessary, for printing. You can view and save the primary results in a text file if there is a need for further processing using existing (such as MS Excel) or specially written programs.

After starting the Metrologic.exe file, the main program window will open (Fig. 18). At the top of the window is the name field of the binary data file and the “Open file” button to open the file open window.

You can open the file by clicking on the “Open file” button and choosing the path and name of the binary file in the window that appears. If the file is opened successfully, a confirmation window will appear (Fig. 19). The “Date / time of measurements” field displays the date and time of the measurements stored in the file.

After opening the file, the lower part of the screen will become available, which is a set of bookmarks with decryption and data processing (Fig. 20).

The first tab “Channel Parameters” displays the configuration of the IVK channels for which measurements were saved in the file. The configuration is displayed in the form of a table, each line of which implements a description of one system channel. The configuration is a reference for the operator and cannot be edited.

On the tab "Number of levels and temperature" (Fig.21) displays the number of levels of measurements.

Each level is a complete survey of all channels in accordance with the configuration. This allows you to sequentially interrogate the CPI at different temperatures for some time and save the data in one file. The tab "Measurements" (Fig) is designed to decrypt the primary data and display them on the screen. Directly the measurements are displayed in a column and sorted sequentially by the numbers of levels, channels and channel sensors, section numbers and the order of passage of the sections (forward, reverse). In total, in accordance with the algorithm, the program processes 11 sections of the forward stroke and 11 reverse stroke. In order to display the initial data on the screen, you must click on the "Generate" button. After successful completion, the program will display a message (Fig.23) "Report generated successfully." After that, if necessary, you can save the data in a text file. To do this, click on the "Save ..." button. To clear the window and return to the initial state, click the "Clear" button.

On the tab "Processing Results" (Fig.24) displays the calculated metrological characteristics. It is possible to generate a report for each sensor or for the entire configuration, while the calculation occurs sequentially at all levels.

Defined metrological characteristics (in each section, with the exception of the individual conversion function):

- individual conversion function (calculated by the least squares method);

- average and polynomial values;

- the systematic component of the channel error;

- standard deviation of the random component of the channel error;

- variation of the measuring channel;

- permissible error of the measuring channel.

The generated report can be saved to a text file by clicking on the "Save ..." button, or displayed on the printer by clicking on the "Print ..." button. To clear the window and return to the initial state, click the "Clear" button.

On the tab "Printing results" you can configure the printer and print the generated (Fig.25) report. The printer is configured using the "Settings ..." button, printing - using the "Print ..." button.

Thus, the software package in conjunction with the AKM provides metrological certification for the 176 output characteristics of the IVC necessary for certification of the main functional dependence of the measuring channels. The task of automating the processes of metrological certification of the CPM or its verification has been completely solved, which reduces the time for their implementation by several times and eliminates the subjective errors of the maintenance staff.

Figure 26 shows the results of simultaneous verification of a 4-component outlet (4TR) and a resistance thermometer using AKM and processed by the Excel complex.

In this figure, row 1, 2, 3, 4 are 4TR strain gages, row 5 is a resistance thermometer (TC).

Figures 27 and 28 show the AKM board and the appearance of the AKM.

In the figure 29, the AKM is connected to the TENZOR information center (maintenance of 32 measuring channels).

Claims (16)

1. An automatic calibrator of measures of the measuring and computing complex, which includes sets of precision resistors and a control device, characterized in that it consists of seven sets of reference resistors and ten additional multiplexers, where the resistors of the first and second sets are respectively connected in series, and their common bus is connected to the input of the third set of series-connected resistors, the output of which is connected to the common bus of the fourth, fifth and sixth sets of follower but connected resistors, while the inputs of the corresponding resistors of the first and second sets are connected in parallel to two inputs of the first and second additional multiplexers, two outputs of which are connected by a common additional multiplexer with current sources and measuring amplifiers of the measuring and computing complex, the third set of series-connected resistors are respectively connected to the third multiplexer, the output of which, like the midpoint of this set, are connected by a common additional multiplexer ohm with current sources and measuring amplifiers of the measuring and computing complex, while the fourth, fifth and sixth sets of series-connected resistors having a common bus connected by a common additional multiplexer with current sources and measuring amplifiers of the measuring and computing complex, respectively, are connected to the inputs of the fourth, fifth and the sixth additional multiplexers, the outputs of which are interconnected and connected by a common additional multiplexer with current sources and amplifiers of the measuring and computing complex, and the outputs of the fourth, fifth and sixth sets of series-connected resistors are connected to the inputs of the eighth additional multiplexer, connecting them with its output with a common additional multiplexer with current sources and measuring amplifiers of the measuring and computing complex, while also the midpoints of the series-connected the resistors of the fourth, fifth and sixth sets are connected to the inputs of the ninth additional multiplexer, output for which a common additional multiplexer is connected to current sources and measuring amplifiers of the measuring and computing complex, while the outputs of the seventh set of resistors are respectively parallel connected to two inputs of the seventh additional multiplexer, two outputs of which and the common bus of this set of resistors are connected by a common additional multiplexer to current sources and measuring amplifiers of a measuring and computing complex, the control output being measuring and computing of the complex is connected to the input of the control device, the outputs of which are connected to the control inputs of all multiplexers. 2. The device according to claim 1, characterized in that when connecting the equivalent of a single strain gauge formed from the second and series connected third sets of resistors, the current buses of the second and third sets of resistors are connected by one output of the second multiplexer and a common multiplexer, with the output of the current source computing complex, and one potential bus equivalent to a single strain gauge by the output of the third multiplexer and a common multiplexer connected to the bus virtual "ground" measured power-computer complex with which one of the buses of the reference voltage source formed in the measuring and computing complex due to the connection of a reference resistor equivalent to a given type of strain gauge reference resistor or a specific set of resistors with a power supply current source equivalent to a strain gauge and another output associated with one differential the input of the first measuring amplifier of the measuring and computing complex, and the potential tire of the strain gauge equivalent is from second to ora output of the second resistors and second multiplexers connected in common to the other differential input of the first measuring amplifier measuring and computing system, the output of which is connected to the input of analog-to-digital converter. 3. The device according to claim 1, characterized in that when connecting the equivalent of a half-bridge individual strain gage formed from two equivalents of sensors, the first equivalent is formed by the serial connection of the second and third set of resistors, and the second equivalent from the seventh set of resistors, with the current busbars of the first equivalent the first output of the second and common multiplexers are connected to the output of the first current source of the measuring and computing complex, while the potential bus is from the second set of resistors connected by the second output of the second and common multiplexers to one of the differential inputs of the first measuring amplifier of the measuring and computing complex, the second potential bus of the third set of resistors being connected to the virtual ground of the measuring and computing complex by the output of the third and common multiplexers, and the current buses of the seventh set of resistors the first output of the seventh multiplexer and a common multiplexer are connected to the second current source of the measuring and computing complex, at Ohm, one potential bus of the seventh set of resistors is connected by the second output of the seventh and common multiplexers to the second differential input of the first measuring amplifier of the measuring and computing complex, and the second potential bus of the seventh set of resistors is formed by alternately switching the current bus to the virtual ground of the measuring and computing bus by the common multiplexer complex, while the output of the measuring amplifier is connected to the input of an analog-to-digital converter. 4. The device according to claim 1, characterized in that when connecting the equivalent of a half-bridge individual strain gauge with a common ground point to the input of the measuring and computing complex, consisting of two equivalents of sensors, the equivalent is formed by a serial connection of the first and second set of resistors and connected by a common bus of the second set resistors in series with the input of the third set of resistors, with the first equivalent formed by the first set of resistors, and the second equivalent of the second and third sets of sources, and the current bus of the first equivalent with the first output of the first and common multiplexers is connected to the output of the first current source of the measuring and computing complex, and the potential bus from the first set of resistors is connected to the second output of the first and common multiplexers with one of the differential inputs of the first measuring amplifier of the measuring and computing complex and the second potential bus of the third set of resistors by the output of the third and common multiplexers is connected to another differential the input of the first measuring amplifier of the measuring and computing complex, while the current bus of the third set of resistors is connected by a common multiplexer to the second current source of the measuring and computing complex, and the common connection point of the first and second current sources is connected to the virtual ground bus, which is also connected by an output the second multiplexer common connection points of the resistors of the first and second sets, and the output of the measuring amplifier is connected to the input of the analog-to-digital converter ritelno-computer system. 5. The device according to claim 1, characterized in that when connecting the equivalent of a half-bridge strain gauge with a common compensation strain gauge formed of two equivalents of sensors, the first equivalent is formed by the serial connection of the second and third set of resistors, and the second equivalent from the seventh set of resistors, while the current buses of the first equivalent with the first output of the second and common multiplexers connected to the output of the first current source of the measuring and computing complex, while the potential bus The second set of resistors is connected by the second output of the second and common multiplexers to one of the differential inputs of the first measuring amplifier of the measuring and computing complex, the second potential bus of the third set of resistors being connected to the virtual ground of the measuring and computing complex by the output of the third and common multiplexers, and the current buses the seventh set of resistors with the first output and a common multiplexer connected to the second current source of the measuring and computing complex, while the bottom of the potential bus of the seventh set of resistors is connected by the second output of the seventh and common multiplexers to the second differential input of the first measuring amplifier of the measuring and computing complex, and the second potential bus of the seventh set of resistors is formed by alternately switching the current bus to the virtual ground of the measuring and computing complex by the common multiplexer while the output of the measuring amplifier is connected to the input of the analog-to-digital Converter. 6. The device according to claim 1, characterized in that when connecting the equivalent of a full bridge isolated strain gages formed from a series connection of the second and third sets of resistors, which is connected by the current bus of the second set of resistors through the second and common multiplexer to the first current source of the measuring and computing complex moreover, the output of the third set of resistors is connected by a common multiplexer to the virtual ground bus of the measuring and computing complex, to which the second bus is also connected the first current source, while the midpoint of the third set of resistors is connected by a common multiplexer to one of the differential inputs of the first measuring amplifier of the measuring and computing complex, the second input of which is connected through the third and common multiplexers to the third set of resistors, while the output of the first measuring amplifier is connected to analog-to-digital converter input. 7. The device according to claim 1, characterized in that when connecting the equivalent of full bridge strain gages with a common switching point formed from a series connection of the second and third sets of resistors, which is connected by the current bus of the second set of resistors through the second and common multiplexers to the first current source measuring and computing complex, which is connected by a second output to the virtual ground bus, and the output of the third set of resistors is connected by a common multiplexer to the virtual ground bus, and measuring and computing complex, while the midpoint of the third set of resistors is connected by a common multiplexer to one of the differential inputs of the first measuring amplifier of the measuring and computing complex, the second input of which is connected to the output of the third multiplexer through a common multiplexer with the third set of resistors, while the output of the first measuring amplifier connected to the input of an analog-to-digital converter. 8. The device according to claim 1, characterized in that when connecting the equivalent of 3 strain gages formed by the first and second set of resistors, respectively connected in series and having at the connection points the output of potential buses connected to the inputs of the second multiplexer, as well as connected in series with the third set of resistors, while the corresponding current inputs of the first set of resistors by the first and common multiplexers are connected to the output of the first current source of the measuring and computing computer exa, and the output bus of the third set of resistors is connected by a common multiplexer to the second output of this current source, and the common connection points of the corresponding resistors of the first and second sets of the second and common multiplexers are connected through six channels with the multiplexer of the measuring and computing complex having two outputs, one output of which connected to one differential input of the measuring amplifier, and its second output is connected to the virtual ground bus, while the output of the third multiplexer is a common multiplex The speaker is also connected to the input multiplexer of the measuring and computing complex, and the second differential input of the measuring amplifier is connected to the output of the reference voltage source of the measuring and computing complex, while the output of this amplifier is connected to the input of the analog-to-digital converter. 9. The device according to claim 1, characterized in that when connecting the equivalent of 4 strain gages formed by the first and second set of resistors connected in series and having at the connection points the output of potential buses connected to the inputs of the second multiplexer, as well as connected in series with the third set of resistors, the corresponding current inputs of the first set of resistors by the first and common multiplexers are connected to the output of the first current source of the measuring and computing complex, and the output bus t its set of resistors is connected by a common multiplexer to the second output of this current source, and the common connection points of the corresponding resistors of the first and second sets of second and common multiplexers are connected through eight channels with a multiplexer of a measuring and computing complex having two outputs, one output of which is connected to one differential input measuring amplifier, and its second output is connected to the virtual ground bus, while the output of the third multiplexer by a common multiplexer is also connected to the input Nome multiplexer measuring and computing system, and measuring a second differential amplifier input connected to the output reference voltage measuring and computing system, wherein the output of this amplifier is connected to the input of analog-to-digital converter. 10. The device according to claim 1, characterized in that when connecting the equivalent of a series-connected single strain gauge with a resistance thermocouple formed by a series connection of the second, third and fourth sets of resistors, its current bus from the corresponding inputs of the second set of resistors by the first output of the second and common multiplexers is connected with one of the outputs of the current source, and its potential bus with the second output of the second and common multiplexers are connected to the first input multiplex ru, which has two outputs, one of which is connected to one differential input of the first measuring amplifier, and its second output is connected to the virtual ground bus, and the output of the third multiplexer and the connection point of the third and fourth set of resistors by current buses are connected to the common bus by a common multiplexer the first and second input multiplexers of the measuring and computing complex, the first output of the second input multiplexer connected to the differential input of the second measuring amplifier, the second input of which, like the second output of the second input multiplexer, is connected to the virtual ground bus, while the output of the fourth multiplexer is connected by a common multiplexer to the second input of the second input multiplexer of the measuring and computing complex, the second bus of the fourth set of resistors is connected to the second by the fourth and common multiplexers the output of the current source, while the reference voltage source is connected to the second differential input of the first measuring amplifier, and the outputs of these amplifiers are edno two multiplexers connected measuring and computing system to the input of analog-to-digital converter. 11. The device according to claim 1, characterized in that when connecting the equivalents of 3 strain gages connected in series with a resistance thermoconverter formed by a series connection of the first, second, third and fourth sets of resistors having at the corresponding connection points of the first and second sets the output of potential buses connected to the inputs of the second multiplexer, the corresponding current inputs of the first set of resistors by the first and common multiplexers are connected to the output of the first source the current of the measuring and computing complex, and the output bus of the fourth set of resistors is connected by the output of the fourth and common multiplexer to the second output of this current source, and the common connection points of the corresponding resistors of the first and second sets of the second and common multiplexers are connected through six channels to the first input multiplexer of the measuring a computer complex having two outputs, one output of which is connected to one differential input of the first measuring amplifier, the second input being the first the first amplifier is connected to a reference voltage source, the second output of the first input multiplexer is connected to the virtual ground bus, and the output of the third multiplexer by a common multiplexer is also connected to the first and second input multiplexers of the measuring and computing complex, and the connection point of the third and fourth sets of resistors is a common multiplexer connected to the inputs of the first and second input multiplexers, and the output of the fourth multiplexer by a common multiplexer is connected to the inputs of the first and second input multiplexers, while the two outputs of the second multiplexer are connected to the differential inputs of the second measuring amplifier, one of the inputs of which is connected to the virtual ground bus, while the outputs of these amplifiers are connected by the multiplexers of the measuring and computing complex to the input of the analog-to-digital converter. 12. The device according to claim 1, characterized in that when connecting the equivalents of 4 strain gages connected in series with a resistance thermoconductor, formed by a series connection of the first, second, third and fourth sets of resistors having at the corresponding connection points of the first and second sets the output of potential buses connected to the inputs of the second multiplexer, while the corresponding current inputs of the first set of resistors by the first and common multiplexers are connected to the output of the first the current source of the measuring and computing complex, and the output bus of the fourth set of resistors is connected by the output of the fourth and common multiplexer to the second output of this current source, and the common connection points of the corresponding resistors of the first and second sets of the second and common multiplexers are connected through eight channels to the first input multiplexer of the measuring a computer complex having two outputs, one output of which is connected to one differential input of the first measuring amplifier, the second in One of the first amplifier is connected to a reference voltage source, and the second output of the first input multiplexer is connected to the virtual ground bus, while the output of the third multiplexer by a common multiplexer is also connected to the first and second input multiplexers of the measuring and computing complex, and the connection point of the third and fourth sets resistors by a common multiplexer is connected to the inputs of the first and second input multiplexers, and the output of the fourth multiplexer by a common multiplexer is connected to the first and second input multiplexers, while the two outputs of the second multiplexer are connected to the differential inputs of the second measuring amplifier, one of the inputs of which is connected to the virtual ground bus, while the outputs of these amplifiers are alternately connected by the multiplexers of the measuring and computing complex to the analog-digital input converter. 13. The device according to claim 1, characterized in that when connecting the equivalent of a resistance thermal converter formed of three different nominal sets of resistors, one input connected and connected by a common multiplexer to a current source and one differential input of a second measuring amplifier, the second input of which is connected to the bus virtual "ground", while the midpoints of the connection of these sets of resistors are also connected by a common multiplexer to this bus, and the output buses of these sets of resistors are alternately are connected by the eighth and common multiplexers to the second bus of the current source, while the output of the measuring amplifier is connected to the input of the analog-to-digital converter. 14. The device according to claim 1, characterized in that when connecting the equivalent of 3 series-connected strain gauges and a common isolated compensation strain gauge formed by the first and second set of resistors connected in series and having potential busbars connected to the inputs at the connection points a second multiplexer, as well as connected in series with a third set of resistors, as well as an isolated seventh set of resistors, respectively connected to a seventh multiplexer, the corresponding current inputs of the first set of resistors by the first and common multiplexers are connected to the output of the first current source of the measuring and computing complex, and the output bus of the third set of resistors is connected by a common multiplexer to the second output of this current source, and the common connection points of the corresponding resistors of the first and second sets of the second and common multiplexers are connected through six channels with a multiplexer of a measuring and computing complex having two outputs, one output of which is connected to one differential input of the first measuring amplifier, and its second output is connected to the virtual ground bus, while the output of the third multiplexer by a common multiplexer is also connected to the six-channel input multiplexer of the measuring and computing complex, and the second differential input of the first measuring amplifier is connected to the output of the seventh and common multiplexers, which is also connected to a second current source, while the other bus of the seventh set of resistors is alternately connected to another the output of the second current source or bus is virtual ground, and the output of this amplifier is connected to the input of an analog-to-digital converter. 15. The device according to claim 1, characterized in that when connecting the equivalent of 4 strain gages connected in series and a common isolated compensation strain gage formed by the first and second set of resistors connected in series and having potential bus points at the connection points connected to the inputs of the second multiplexer, as well as connected in series with the third set of resistors, as well as an isolated seventh set of resistors, respectively connected to the seventh multip an expor, while the corresponding current inputs of the first set of resistors by the first and common multiplexers are connected to the output of the first current source of the measuring and computing complex, and the output bus of the third set of resistors is connected by a common multiplexer to the second output of this current source, and the common connection points of the corresponding resistors of the first and second sets of second and common multiplexers are connected through eight channels with a multiplexer of a measuring and computing complex having two outputs, one output which is connected to one differential input of the first measuring amplifier, and its second output is connected to the virtual ground bus, while the output of the third multiplexer by a common multiplexer is also connected to the eight-channel input multiplexer of the measuring and computing complex, and the second differential input of the first measuring amplifier is connected to the output the seventh and common multiplexers, which is also connected to the second current source, while the other bus of the seventh set of resistors is connected to the inputs Vuh common multiplexer contacts, one of which is connected to the other output of the second current source, the other - with the virtual bus "land", and the amplifier output is connected to the input of analog-to-digital converter. 16. The device according to claim 1, characterized in that when connecting the equivalents of four types of voltage sensors formed by the fourth, fifth and sixth sets of resistors connected by one output through a common multiplexer to the first current source of the measuring and computing complex, two multiplexers are additionally introduced into it and a measuring amplifier, and this one multiplexer is connected in input to the output buses of the fourth, fifth and sixth multiplexers of sets of model resistors and one of the inputs of the measuring device an alternator, the second input of which is connected to the midpoint of the sixth set of resistors and through another multiplexer is alternately connected to the virtual ground bus, while the second additional multiplexer is connected to the output of the measuring amplifier and the output is connected to the output of the first additional multiplexer, which are associated with one of the potential voltage equivalent of the voltage sensor, while two potential output buses, in accordance with the selected mode, are connected by a multiplexer to the differential inputs of the third and Tonnage amplifier measuring and computing system, the output of which is connected to the input of analog-to-digital converter.

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