RU2017143787A3 - - Google Patents
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- Publication number
- RU2017143787A3 RU2017143787A3 RU2017143787A RU2017143787A RU2017143787A3 RU 2017143787 A3 RU2017143787 A3 RU 2017143787A3 RU 2017143787 A RU2017143787 A RU 2017143787A RU 2017143787 A RU2017143787 A RU 2017143787A RU 2017143787 A3 RU2017143787 A3 RU 2017143787A3
- Authority
- RU
- Russia
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/60—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrostatic variables, e.g. electrographic flaw testing
- G01N27/61—Investigating the presence of flaws
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/RU2016/000213 WO2017180007A1 (ru) | 2016-04-14 | 2016-04-14 | Способ локального обнаружения дефектов и устройство для реализации такого способа (варианты) |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| RU2017143787A3 true RU2017143787A3 (ko) | 2019-06-17 |
| RU2017143787A RU2017143787A (ru) | 2019-06-17 |
Family
ID=60041734
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| RU2017143787A RU2017143787A (ru) | 2016-04-14 | 2016-04-14 | Способ локального обнаружения дефектов и устройство для реализации такого способа (варианты) |
Country Status (2)
| Country | Link |
|---|---|
| RU (1) | RU2017143787A (ko) |
| WO (1) | WO2017180007A1 (ko) |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6957154B2 (en) * | 2003-02-03 | 2005-10-18 | Qcept Technologies, Inc. | Semiconductor wafer inspection system |
| JP2005274381A (ja) * | 2004-03-25 | 2005-10-06 | Tohoku Techno Arch Co Ltd | 電磁気的手法による裏面欠陥および材料特性の非破壊検査方法とそのための装置 |
| FR2901610B1 (fr) * | 2006-05-24 | 2009-01-16 | Airbus France Sas | Dispositif de controle non destructif d'une struture par analyse vibratoire |
| RU2396999C1 (ru) * | 2009-01-11 | 2010-08-20 | Владислав Васильевич Горшков | Шагокат |
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2016
- 2016-04-14 WO PCT/RU2016/000213 patent/WO2017180007A1/ru active Application Filing
- 2016-04-14 RU RU2017143787A patent/RU2017143787A/ru unknown
Also Published As
| Publication number | Publication date |
|---|---|
| WO2017180007A1 (ru) | 2017-10-19 |
| RU2017143787A (ru) | 2019-06-17 |