RU2012148218A - METHOD OF CONTROL TESTS FOR A GAMMA-PERCENT RESOURCE OF NON-RESTORABLE RADIO ELECTRONIC DEVICES WITH AN EXTENTIONAL LAW OF TIME DISTRIBUTION BEFORE FAILURE - Google Patents
METHOD OF CONTROL TESTS FOR A GAMMA-PERCENT RESOURCE OF NON-RESTORABLE RADIO ELECTRONIC DEVICES WITH AN EXTENTIONAL LAW OF TIME DISTRIBUTION BEFORE FAILURE Download PDFInfo
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Abstract
Способ контрольных испытаний на гамма-процентный ресурс невосстанавливаемых радиоэлектронных устройств с экспоненциальным законом распределения времени до отказа, согласно которому испытания проводят одноступенчатом методом с ограниченной продолжительностью испытания и сводят к контролю вероятности ненаступления предельного состояния за заданное время, в качестве предельного состояния принимают отказ радиоэлектронного устройства, выбирают предельную продолжительность tиспытания и заданное значение гамма-процентного ресурса, рассчитывают вероятность Рненаступления отказа за время, равное гамма-процентному ресурсу, выбирают или рассчитывают приемочное Ри браковочное Рзначения вероятности ненаступления отказа, в зависимости от Р, Р, риска изготовителя и риска потребителя определяют количество nрадиоэлектронных устройств, необходимое для проведения испытаний, и приемочное число Сотказов, в процессе испытаний отказавшие радиоэлектронные устройства не заменяют, по окончании испытаний определяют отказавшие радиоэлектронные устройства, отличающийся тем, что число nувеличивают в m раз, где m - целое положительное число большее единицы, полученное таким образом количество радиоэлектронных устройств разделяют на одинаковые группы по m радиоэлектронных устройств, tпринимают равным уменьшенному в m раз заданному значению гамма-процентного ресурса, из отказавших радиоэлектронных устройств отбирают по одному из каждой группы, имеющей отказавшие радиоэлектронные устройства, при этом, если общее число отобранных таким образом радиоэлектронных устройств меньше или равно С, то результаты испытаний сч�The control test method for the gamma percentage resource of non-recoverable electronic devices with an exponential distribution of time to failure, according to which the tests are carried out by a single-stage method with a limited duration of the test and reduce the probability of non-occurrence of the limit state for a given time, take the failure of the electronic device as the limit state, the limiting duration of the test and the set value of the gamma-percent resource are selected, calculate the probability of failure occurrence for a time equal to the gamma-percent resource; select or calculate acceptance Р reject; The probability of failure failure, depending on Р, Р, manufacturer's risk and consumer risk, determine the number of radio electronic devices required for testing and the acceptance number of Sotkaz , during the test, failed electronic devices are not replaced, at the end of the tests, the failed electronic devices are determined, characterized in that the number n is increased by a factor of m, where m is a positive integer greater than one, the number of electronic devices thus obtained is divided into identical groups of m electronic devices, t is taken to be the gamma percentage resource set to a value reduced by m times, one by one taken from the failed electronic devices from each group that has failed electronic devices, in this case, if the total number of electronic devices selected in this way is less than or equal to C, then the test results
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RU2012148218/28A RU2517948C1 (en) | 2012-11-14 | 2012-11-14 | Method of gamma-percentile life validation tests for non-recoverable radioelectronic devices under exponential law of failure probability distribution |
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RU2012148218/28A RU2517948C1 (en) | 2012-11-14 | 2012-11-14 | Method of gamma-percentile life validation tests for non-recoverable radioelectronic devices under exponential law of failure probability distribution |
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RU2012148218A true RU2012148218A (en) | 2014-05-20 |
RU2517948C1 RU2517948C1 (en) | 2014-06-10 |
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RU2012148218/28A RU2517948C1 (en) | 2012-11-14 | 2012-11-14 | Method of gamma-percentile life validation tests for non-recoverable radioelectronic devices under exponential law of failure probability distribution |
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RU2660748C1 (en) * | 2017-06-23 | 2018-07-09 | Акционерное общество "Научно-исследовательский институт точных приборов" | Method of inspection tests on the gamma-percentile life of non-recoverable radioelectronic devices |
RU2745037C1 (en) * | 2020-02-19 | 2021-03-18 | Федеральное государственное бюджетное образовательное учреждение высшего образования "Московский автомобильно-дорожный государственный технический университет (МАДИ)" | Method for automatic control of performance stability of vehicles, agricultural and road machines |
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RU2168735C2 (en) * | 1999-04-05 | 2001-06-10 | РНИИ "Электронстандарт" | Procedure of selection of electron articles by stability and reliability |
US7194366B2 (en) * | 2001-10-19 | 2007-03-20 | Auburn University | System and method for estimating reliability of components for testing and quality optimization |
WO2009072204A1 (en) * | 2007-12-06 | 2009-06-11 | Japan Electric Meters Inspection Corporation | Life estimating method and device of electronic weighting instrument |
RU2444741C1 (en) * | 2010-07-20 | 2012-03-10 | Федеральное государственное унитарное предприятие "НПО "ОРИОН" | Method of testing device reliability |
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