RU2002125411A - DEVICE FOR ANALYSIS OF PHYSICAL AND / OR CHEMICAL PROPERTIES OF A SURFACE LAYER OF A SOLID - Google Patents
DEVICE FOR ANALYSIS OF PHYSICAL AND / OR CHEMICAL PROPERTIES OF A SURFACE LAYER OF A SOLIDInfo
- Publication number
- RU2002125411A RU2002125411A RU2002125411/28A RU2002125411A RU2002125411A RU 2002125411 A RU2002125411 A RU 2002125411A RU 2002125411/28 A RU2002125411/28 A RU 2002125411/28A RU 2002125411 A RU2002125411 A RU 2002125411A RU 2002125411 A RU2002125411 A RU 2002125411A
- Authority
- RU
- Russia
- Prior art keywords
- vacuum chamber
- sample
- surface layer
- analyzing
- vacuum
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/32—Polishing; Etching
Claims (4)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
RU2002125411/28A RU2212650C1 (en) | 2002-09-16 | 2002-09-16 | Facility to analyze physical and/or chemical properties of surface layer of solid body |
PCT/RU2003/000312 WO2004025276A1 (en) | 2002-09-16 | 2003-07-15 | Device for analysing physical and/or chemical properties of the surface layer of a solid body (variants) |
AU2003252631A AU2003252631A1 (en) | 2002-09-16 | 2003-07-15 | Device for analysing physical and/or chemical properties of the surface layer of a solid body (variants) |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
RU2002125411/28A RU2212650C1 (en) | 2002-09-16 | 2002-09-16 | Facility to analyze physical and/or chemical properties of surface layer of solid body |
Publications (2)
Publication Number | Publication Date |
---|---|
RU2212650C1 RU2212650C1 (en) | 2003-09-20 |
RU2002125411A true RU2002125411A (en) | 2004-03-27 |
Family
ID=29777893
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
RU2002125411/28A RU2212650C1 (en) | 2002-09-16 | 2002-09-16 | Facility to analyze physical and/or chemical properties of surface layer of solid body |
Country Status (3)
Country | Link |
---|---|
AU (1) | AU2003252631A1 (en) |
RU (1) | RU2212650C1 (en) |
WO (1) | WO2004025276A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2595829C2 (en) * | 2011-08-27 | 2016-08-27 | Инфикон Гмбх | Device and method for determination of purity of checked coolant |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2509301C1 (en) * | 2012-06-29 | 2014-03-10 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Рязанский государственный радиотехнический университет" | Method for determining crystalline phase in amorphous films of nanodimensional thickness |
RU2509299C1 (en) * | 2012-06-29 | 2014-03-10 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Рязанский государственный радиотехнический университет" | Method of determining charge state of atoms in subnanolayer films on surface of metals and semiconductors |
RU2522667C2 (en) * | 2012-07-30 | 2014-07-20 | Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" | Method of determining elemental composition and thickness of surface film of solid body with external action on surface |
RU2533338C2 (en) * | 2013-01-25 | 2014-11-20 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Омский государственный университет им. Ф.М. Достоевского" | Method for heating and temperature determination of specimens |
CN104596892A (en) * | 2015-02-11 | 2015-05-06 | 中国工程物理研究院材料研究所 | Gas-solid surface reaction device and measuring method adopting same |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2086037C1 (en) * | 1991-06-17 | 1997-07-27 | Научно-исследовательский технологический институт | Electrostatic charged-particle energy analyzer |
US5705821A (en) * | 1996-11-07 | 1998-01-06 | Sandia Corporation | Scanning fluorescent microthermal imaging apparatus and method |
JPH11295247A (en) * | 1998-04-14 | 1999-10-29 | Toshiba Corp | Method for analyzing sample surface |
-
2002
- 2002-09-16 RU RU2002125411/28A patent/RU2212650C1/en not_active IP Right Cessation
-
2003
- 2003-07-15 AU AU2003252631A patent/AU2003252631A1/en not_active Abandoned
- 2003-07-15 WO PCT/RU2003/000312 patent/WO2004025276A1/en not_active Application Discontinuation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2595829C2 (en) * | 2011-08-27 | 2016-08-27 | Инфикон Гмбх | Device and method for determination of purity of checked coolant |
Also Published As
Publication number | Publication date |
---|---|
WO2004025276A1 (en) | 2004-03-25 |
RU2212650C1 (en) | 2003-09-20 |
AU2003252631A1 (en) | 2004-04-30 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RH4A | Copy of patent granted that was duplicated for the russian federation |
Effective date: 20060520 |
|
MM4A | The patent is invalid due to non-payment of fees |
Effective date: 20180917 |