RU1538703C - Method for determination of junction resistance of contact to thin-film resistors with electrodes - Google Patents

Method for determination of junction resistance of contact to thin-film resistors with electrodes

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Publication number
RU1538703C
RU1538703C SU4225515A RU1538703C RU 1538703 C RU1538703 C RU 1538703C SU 4225515 A SU4225515 A SU 4225515A RU 1538703 C RU1538703 C RU 1538703C
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RU
Russia
Prior art keywords
electrodes
contact
determination
thin
film resistors
Prior art date
Application number
Other languages
Russian (ru)
Inventor
Г.Ф. Жуков
В.К. Смолин
Original Assignee
Zhukov G F
Smolin V K
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zhukov G F, Smolin V K filed Critical Zhukov G F
Priority to SU4225515 priority Critical patent/RU1538703C/en
Application granted granted Critical
Publication of RU1538703C publication Critical patent/RU1538703C/en

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Abstract

FIELD: electric measuring. SUBSTANCE: contact areas 3,4 and 4,5 of resistor are designed as resistive ribbons with pieces 1 and 2. Contact areas 3-5 are applied over resistive ribbon and are connected to power supply 9 and voltage measuring device 10. power supply 9 is connected to contact areas 3 and 4, while voltage measuring device 10 is connected to contact areas 4 and 5. EFFECT: simplified measuring. 1 dwg

Description

Изобретение касается электроизмерений, в частности измерений контактного (переходного) сопротивления. The invention relates to electrical measurements, in particular measurements of contact (transient) resistance.

Целью изобретения является упрощение процесса измерения. The aim of the invention is to simplify the measurement process.

На чертеже изображена схема устройства, реализующего предлагаемый способ. The drawing shows a diagram of a device that implements the proposed method.

Устройство содержит резистивные 1 и 2 полосы, контактные площадки 3-5, зонды 6-8, источник 9 тока и измеритель 10 напряжения. The device contains resistive 1 and 2 bands, pads 3-5, probes 6-8, a current source 9 and a voltage meter 10.

Контактные площадки 3-5 нанесены на резистивные полосы 1 и 2, зонды 6-8 соединены (находятся в контакте) с контактными площадками 4-5, зонды 6 и 7 соединены с выходом источника 9 тока, а зонды 7 и 8 с входом измерителя 10 напряжения. Зонд 7 соединен также с общей шиной. Contact pads 3-5 are applied to resistive strips 1 and 2, probes 6-8 are connected (in contact) with contact pads 4-5, probes 6 and 7 are connected to the output of current source 9, and probes 7 and 8 to the input of meter 10 voltage. The probe 7 is also connected to a common bus.

Способ измерения состоит в следующем. The measurement method is as follows.

Объект измерения представляет собой резистивную полосу с участками 1 и 2, на которую нанесены контактные площадки 3-5, к которым подведены зонды 6-8. Зонды 6 и 7 соединены с источником 9 тока, а зонды 7 и 8 с измерителем 10 напряжения. Напряжение U, регистрируемое измерителем напряжения, определяется (при его входном сопротивлении, много большем сопротивления резистивной полосы 2 и сопротивления контакта: полоса 2 контактная площадка 5) величиной R14 ˙I, где R14 сопротивление контакта: резистивная полоса 1 контактная площадка 4; I ток источника 9. Поэтому величина контактного сопротивления Rк между резистивной полосой 1 и контактной площадкой 4 определяется как
Rк=

Figure 00000002
The measurement object is a resistive strip with sections 1 and 2, on which contact pads 3-5 are applied, to which probes 6-8 are connected. The probes 6 and 7 are connected to a current source 9, and the probes 7 and 8 with a voltage meter 10. The voltage U recorded by the voltage meter is determined (with its input resistance much higher than the resistance of the resistive strip 2 and contact resistance: strip 2 contact pad 5) of the value R 14 ˙I, where R 14 contact resistance: resistive strip 1 contact pad 4; I the current of the source 9. Therefore, the value of the contact resistance R to between the resistive strip 1 and the contact pad 4 is defined as
R to =
Figure 00000002

Claims (1)

СПОСОБ ОПРЕДЕЛЕНИЯ ПЕРЕХОДНОГО СОПРОТИВЛЕНИЯ КОНТАКТА К ТОНКОПЛЕНОЧНЫМ РЕЗИСТОРАМ С ЭЛЕКТРОДАМИ, заключающийся в том, что пропускают ток I заданной величины через два электрода и измеряют напряжение U между двумя электродами, отличающийся тем, что, с целью упрощения процесса измерения резистров с тремя электродами, ток пропускают через один из крайних и средних электродов, напряжение измеряют между вторым крайним и средним электродами, а сопротивление контакта Rк определяют из соотношения
Figure 00000003
.THE METHOD FOR DETERMINING THE TRANSITIONAL RESISTANCE OF THE CONTACT TO THIN FILM RESISTORS WITH ELECTRODES, which consists in passing a current I of a given value through two electrodes and measuring the voltage U between two electrodes, characterized in that, in order to simplify the process of measuring resistors with three electrodes, the current one of the extreme and middle electrodes, the voltage is measured between the second extreme and middle electrodes, and the contact resistance R to is determined from the ratio
Figure 00000003
.
SU4225515 1987-04-07 1987-04-07 Method for determination of junction resistance of contact to thin-film resistors with electrodes RU1538703C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SU4225515 RU1538703C (en) 1987-04-07 1987-04-07 Method for determination of junction resistance of contact to thin-film resistors with electrodes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU4225515 RU1538703C (en) 1987-04-07 1987-04-07 Method for determination of junction resistance of contact to thin-film resistors with electrodes

Publications (1)

Publication Number Publication Date
RU1538703C true RU1538703C (en) 1995-12-10

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
SU4225515 RU1538703C (en) 1987-04-07 1987-04-07 Method for determination of junction resistance of contact to thin-film resistors with electrodes

Country Status (1)

Country Link
RU (1) RU1538703C (en)

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
Приборы и техника эксперимента, 1969, N 4, с.191-192. *
Электронная техника, сер.8, вып.11(29), 1974, с.82-86. *

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