Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institutul National De Metrologie, Bucuresti, RofiledCriticalInstitutul National De Metrologie, Bucuresti, Ro
Priority to RO1988135211ApriorityCriticalpatent/RO101661A2/en
Publication of RO101661B1publicationCriticalpatent/RO101661B1/en
Publication of RO101661A2publicationCriticalpatent/RO101661A2/en
The invention concerns an optical and mechanical device for the measurement in two coordinates of building movement, consisting of measuring of the horizontal movement of a lead line that objectifies the site's vertical.In accordance with this invention, the device is equipped with two optical and mechanical microscopes (A) with calibrated reticle (12) located in the object plane of the eyepiece, allowing the direct targeting of a lead line, as well as the measurement of the lead line movement on a measuring scale (7) of the microscope eyepiece.The device provides a clear image of the targeted lead line, it may be assembled easily, it is not difficult to operate, and is very accurate.<IMAGE>
PROCEDURE FOR THE CREATION OF METROLOGICAL STRUCTURES PARTICULARLY FOR THE ANALYSIS OF THE ACCURACY OF ALIGNMENT MEASUREMENT INSTRUMENTS ON PROCESSED SUBSTRATES.