|
EP0125116A2
(en)
|
|
Method and instrument for measuring moisture
|
|
Lopez et al.
|
|
A proposal to eliminate the impact of crosstalk on resistive sensor array readouts |
|
US3784908A
(en)
|
|
Electrical conductivity measurement method and apparatus
|
|
Bera et al.
|
|
A study of practical biological phantoms with simple instrumentation for electrical impedance tomography (EIT) |
|
Patel et al.
|
|
Full-wave electromagnetic characterization of 3D interconnects using a surface integral formulation |
|
PL59476B1
(en:Method)
|
|
|
|
US1890545A
(en)
|
|
Moisture measuring device
|
|
CN106769835B
(zh)
|
|
镀锌钢大气腐蚀行为模拟监测装置及其方法
|
|
Curdts
|
|
Some of the fundamental aspects of ground resistance measurements |
|
US3005154A
(en)
|
|
Moisture testing electrode assembly
|
|
Moron et al.
|
|
The possibility of employing a calculable four-electrode conductance cell to substitute for the secondary standards of electrolytic conductivity |
|
KR20100048060A
(ko)
|
|
저항 측정장치 및 측정방법
|
|
Bera et al.
|
|
A Simple instrumentation calibration technique for Electrical Impedance Tomography (EIT) using a 16-electrode phantom |
|
US3341772A
(en)
|
|
Device for measuring locally dependent differences between the magnetic field gradient at different points of a magnetic field
|
|
CN211743145U
(zh)
|
|
测试结构
|
|
US3102979A
(en)
|
|
Apparatus for measuring corrosion having probe with cathodically-protected, temperature compensating element
|
|
US3667040A
(en)
|
|
Sensor for detecting radio frequency currents in carbon bridge detonator
|
|
CN108318848A
(zh)
|
|
一种沉积静电放电电流的校准装置和方法
|
|
Burr et al.
|
|
Millivoltmeters |
|
Sophocleous et al.
|
|
Modeling and performance comparison of screen-printed, impedance spectroscopy probes for harsh environments |
|
JP4867209B2
(ja)
|
|
脳磁計測装置のファントム
|
|
RU2306624C1
(ru)
|
|
Тонкопленочный измерительный резистор
|
|
San-Pablo-Juarez et al.
|
|
Reconstruction of electrical conductivity using an RLC meter and the two-probes method |
|
GB2572835A
(en)
|
|
Sensing physical attributes
|
|
Majid
|
|
Resistivity measurements of conductors and semiconductors of different geometrical shapes using Van der Pauw technique |