PL4275033T3 - Sposób i urządzenie do wykrywania defektów produktu w kształcie pasma - Google Patents

Sposób i urządzenie do wykrywania defektów produktu w kształcie pasma

Info

Publication number
PL4275033T3
PL4275033T3 PL21843642.6T PL21843642T PL4275033T3 PL 4275033 T3 PL4275033 T3 PL 4275033T3 PL 21843642 T PL21843642 T PL 21843642T PL 4275033 T3 PL4275033 T3 PL 4275033T3
Authority
PL
Poland
Prior art keywords
strand
product
detecting defects
defects
detecting
Prior art date
Application number
PL21843642.6T
Other languages
English (en)
Inventor
Harald Sikora
Armin Holle
Kolja Tobias Schuh
Original Assignee
Sikora Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sikora Ag filed Critical Sikora Ag
Publication of PL4275033T3 publication Critical patent/PL4275033T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952Inspecting the exterior surface of cylindrical bodies or wires
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/954Inspecting the inner surface of hollow bodies, e.g. bores
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918Metal
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N2021/8925Inclusions

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
PL21843642.6T 2021-01-05 2021-12-20 Sposób i urządzenie do wykrywania defektów produktu w kształcie pasma PL4275033T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102021100051.3A DE102021100051B4 (de) 2021-01-05 2021-01-05 Verfahren und Vorrichtung zum Detektieren von Fehlstellen eines strangförmigen Produkts
PCT/EP2021/086789 WO2022148642A1 (de) 2021-01-05 2021-12-20 Verfahren und vorrichtung zum detektieren von fehlstellen eines strangförmigen produkts

Publications (1)

Publication Number Publication Date
PL4275033T3 true PL4275033T3 (pl) 2024-10-28

Family

ID=79602074

Family Applications (1)

Application Number Title Priority Date Filing Date
PL21843642.6T PL4275033T3 (pl) 2021-01-05 2021-12-20 Sposób i urządzenie do wykrywania defektów produktu w kształcie pasma

Country Status (9)

Country Link
US (1) US12461025B2 (pl)
EP (1) EP4275033B1 (pl)
JP (1) JP7715808B2 (pl)
KR (1) KR20230127270A (pl)
CN (1) CN116762003A (pl)
CA (1) CA3203792A1 (pl)
DE (1) DE102021100051B4 (pl)
PL (1) PL4275033T3 (pl)
WO (1) WO2022148642A1 (pl)

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5188281U (pl) * 1975-01-10 1976-07-15
JP2005043230A (ja) * 2003-07-23 2005-02-17 Institute Of Physical & Chemical Research 細長部材の欠陥検出方法及び装置
JP5459995B2 (ja) * 2008-07-16 2014-04-02 古河電気工業株式会社 線条表面検査装置
GB201300016D0 (en) * 2013-01-02 2013-02-13 Proton Products Ltd Measurement of industrial products manufactured by extrusion techniques
WO2016084322A1 (en) 2014-11-28 2016-06-02 Canon Kabushiki Kaisha Measuring apparatus and method for measuring terahertz pulses
WO2016139155A1 (de) 2015-03-03 2016-09-09 Sikora Ag Vorrichtung und verfahren zum messen des durchmessers und/oder der wanddicke eines strangs
EP2982932B1 (en) * 2015-03-12 2017-10-18 Proton Products International Limited Measurement of industrial products manufactured by extrusion techniques using terahertz radiation
CN105606699B (zh) * 2016-03-24 2019-04-23 烟台杰瑞石油装备技术有限公司 连续油管缺陷检测仪
DE102016105599A1 (de) * 2016-04-14 2017-10-19 Inoex Gmbh Terahertz-Messvorrichtung zur Vermessung von Prüfobjekten sowie ein Terahertz-Messverfahren
DE102016111044A1 (de) * 2016-06-16 2017-12-21 INOEX GmbH Innovationen und Ausrüstungen für die Extrusionstechnik Terahertz-Messvorrichtung und ein Terahertz-Messverfahren, zur Vermessung eines Prüfobjektes mittels einer Laufzeitmessung
US10060861B2 (en) 2017-01-10 2018-08-28 Sunspring America, Inc. Technologies for identifying defects
DE102017125753A1 (de) 2017-11-03 2019-05-09 INOEX GmbH Innovationen und Ausrüstungen für die Extrusionstechnik Terahertz-Messverfahren und Terahertz-Messvorrichtung zum Messen mindestens einer Wanddicke eines rohrförmigen Messobjektes
DE102017125740B4 (de) * 2017-11-03 2021-05-27 INOEX GmbH Innovationen und Ausrüstungen für die Extrusionstechnik Terahertz-Messverfahren und Terahertz-Messvorrichtung zur Vermessung von Rohren
CN207867053U (zh) * 2018-02-06 2018-09-14 烟台太赫兹光电科技有限公司 一种主动式透射式三维太赫兹包裹危险品检测装置
CN108426852A (zh) * 2018-02-28 2018-08-21 首都师范大学 一种多层介质材料内部缺陷的检测装置及其方法
DE102019101152B3 (de) * 2019-01-17 2020-01-30 Sikora Ag Vorrichtung und Verfahren zum Bestimmen der Oberflächenkontur und/oder der Lage im Raum eines Gegenstandes
US12096567B2 (en) * 2019-11-25 2024-09-17 Socovar Société En Commandite Method of assessing ink deposition accuracy in an electronic device printing process

Also Published As

Publication number Publication date
KR20230127270A (ko) 2023-08-31
EP4275033A1 (de) 2023-11-15
CA3203792A1 (en) 2022-07-14
CN116762003A (zh) 2023-09-15
JP7715808B2 (ja) 2025-07-30
JP2024505354A (ja) 2024-02-06
US12461025B2 (en) 2025-11-04
DE102021100051A1 (de) 2022-07-07
EP4275033C0 (de) 2024-08-07
WO2022148642A1 (de) 2022-07-14
EP4275033B1 (de) 2024-08-07
US20240068939A1 (en) 2024-02-29
DE102021100051B4 (de) 2024-01-11

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