PL4150357T3 - Układ probierczy wraz z urządzeniem głównym i urządzeniem pomocniczym do badania urządzenia elektrycznego - Google Patents

Układ probierczy wraz z urządzeniem głównym i urządzeniem pomocniczym do badania urządzenia elektrycznego

Info

Publication number
PL4150357T3
PL4150357T3 PL21726604.8T PL21726604T PL4150357T3 PL 4150357 T3 PL4150357 T3 PL 4150357T3 PL 21726604 T PL21726604 T PL 21726604T PL 4150357 T3 PL4150357 T3 PL 4150357T3
Authority
PL
Poland
Prior art keywords
testing
electrical devices
auxiliary device
testing system
main device
Prior art date
Application number
PL21726604.8T
Other languages
English (en)
Inventor
Klaus Studer
Reinhard Kaufmann
Michael RÄDLER
Boris Unterer
Wernich De Villiers
Matthias KUKUK
Felix FEUSTEL
Lukas BITSCHNAU
Horst Schedler
Original Assignee
Omicron Electronics Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omicron Electronics Gmbh filed Critical Omicron Electronics Gmbh
Publication of PL4150357T3 publication Critical patent/PL4150357T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3272—Apparatus, systems or circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/16—Construction of testing vessels; Electrodes therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/62—Testing of transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Testing Relating To Insulation (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
PL21726604.8T 2020-05-13 2021-05-11 Układ probierczy wraz z urządzeniem głównym i urządzeniem pomocniczym do badania urządzenia elektrycznego PL4150357T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ATA50416/2020A AT523776B1 (de) 2020-05-13 2020-05-13 Prüfsystem sowie Hauptgerät und Zusatzgerät davon zur Prüfung einer elektrischen Einrichtung
PCT/EP2021/062460 WO2021228841A1 (de) 2020-05-13 2021-05-11 Prüfsystem sowie hauptgerät und zusatzgerät davon zur prüfung einer elektrischen einrichtung

Publications (1)

Publication Number Publication Date
PL4150357T3 true PL4150357T3 (pl) 2025-09-08

Family

ID=76011927

Family Applications (1)

Application Number Title Priority Date Filing Date
PL21726604.8T PL4150357T3 (pl) 2020-05-13 2021-05-11 Układ probierczy wraz z urządzeniem głównym i urządzeniem pomocniczym do badania urządzenia elektrycznego

Country Status (13)

Country Link
US (1) US12379415B2 (pl)
EP (1) EP4150357B1 (pl)
KR (1) KR102787620B1 (pl)
CN (1) CN115769093A (pl)
AT (1) AT523776B1 (pl)
AU (1) AU2021272678B2 (pl)
BR (1) BR112022022732A2 (pl)
CA (1) CA3183125A1 (pl)
ES (1) ES3038432T3 (pl)
MX (1) MX2022014278A (pl)
PL (1) PL4150357T3 (pl)
WO (1) WO2021228841A1 (pl)
ZA (1) ZA202213419B (pl)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023088877A1 (de) * 2021-11-16 2023-05-25 Omicron Electronics Gmbh Prüfsystem und verfahren zum bestimmen einer kapazität einer hochspannungseinrichtung
CN120418666A (zh) * 2022-12-21 2025-08-01 欧米克朗电子仪器有限公司 用于对高压设备执行多功能测试的系统、方法和高压测试信号设备
CN117031100B (zh) * 2023-09-28 2026-01-06 深圳市鼎阳科技股份有限公司 一种万用表的前端电路及万用表

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5131272A (en) 1990-03-15 1992-07-21 Harris Corporation Portable deployable automatic test system
DE19713932A1 (de) 1997-04-04 1998-10-08 Omicron Electronics Gmbh Testsystem und Testverfahren
US6462961B1 (en) * 2000-01-13 2002-10-08 Powerware Corporation Component housing assembly having universal mounting capability and mounting bracket for use therewith
DE10048962B4 (de) 2000-10-04 2006-12-07 Omicron Electronics Gmbh Tragbare Prüfeinrichtung zum Prüfen von mit hohen Spannungen und/oder hohen Strömen zu betreibenden Prüflingen und Prüfsystem
US6751091B2 (en) * 2002-09-06 2004-06-15 Circadiant Systems, Inc. Modular housing for use with test equipment
US8395394B2 (en) * 2008-08-01 2013-03-12 Avo Multi-Amp Corporation System and method for power system component testing
JP5659784B2 (ja) * 2010-12-27 2015-01-28 住友電気工業株式会社 複合コネクタの組物
US9057626B2 (en) * 2011-01-13 2015-06-16 General Electric Company Advanced metering infrastructure (AMI) cartridge for an energy meter
EP2664933B1 (de) * 2012-05-15 2014-06-25 Omicron electronics GmbH Testgerät, Testsystem und Verfahren zum Testen eines energietechnischen Prüflings
US20160080666A1 (en) 2014-09-17 2016-03-17 Fluke Corporation Test and measurement system with removable imaging tool
WO2016066701A1 (de) 2014-10-30 2016-05-06 Omicron Electronics Gmbh Transformatorprüfvorrichtung und verfahren zum prüfen eines transformators
PL3245527T3 (pl) * 2015-01-13 2021-09-27 Omicron Electronics Gmbh Urządzenie do testowania transformatora i sposób testowania transformatora
EP3267211A1 (en) 2016-07-06 2018-01-10 NKT HV Cables GmbH A high voltage unit for testing capability of a high voltage component to withstand operational conditions
DE102016114143A1 (de) 2016-08-01 2018-02-01 Endress+Hauser Flowtec Ag Testsystem zur Überprüfung von elektronischen Verbindungen von Bauteilen mit einer Leiterplatte und Leiterplatte
CN207408530U (zh) * 2017-11-27 2018-05-25 航天科工哈尔滨风华有限公司 一种便携式多用途航空航天电缆检测仪
CN110940837A (zh) * 2019-12-03 2020-03-31 南京瑞贻电子科技有限公司 一种便携式录波仪

Also Published As

Publication number Publication date
AT523776A1 (de) 2021-11-15
EP4150357A1 (de) 2023-03-22
CA3183125A1 (en) 2021-11-18
MX2022014278A (es) 2022-12-07
ZA202213419B (en) 2025-06-25
ES3038432T3 (en) 2025-10-13
AU2021272678B2 (en) 2024-01-18
EP4150357C0 (de) 2025-06-18
AT523776B1 (de) 2022-08-15
KR20230015370A (ko) 2023-01-31
US12379415B2 (en) 2025-08-05
AU2021272678A1 (en) 2022-12-15
US20230228817A1 (en) 2023-07-20
EP4150357B1 (de) 2025-06-18
BR112022022732A2 (pt) 2023-02-14
WO2021228841A1 (de) 2021-11-18
CN115769093A (zh) 2023-03-07
KR102787620B1 (ko) 2025-03-28

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