PL3799580T3 - Sposób ukierunkowanego wyboru czujnika do opartego na czujnikach sortowania mieszaniny materiałów przez symulację opartego na czujnikach sortowania mieszaniny materiałów - Google Patents

Sposób ukierunkowanego wyboru czujnika do opartego na czujnikach sortowania mieszaniny materiałów przez symulację opartego na czujnikach sortowania mieszaniny materiałów

Info

Publication number
PL3799580T3
PL3799580T3 PL19787203T PL19787203T PL3799580T3 PL 3799580 T3 PL3799580 T3 PL 3799580T3 PL 19787203 T PL19787203 T PL 19787203T PL 19787203 T PL19787203 T PL 19787203T PL 3799580 T3 PL3799580 T3 PL 3799580T3
Authority
PL
Poland
Prior art keywords
capteur
matériaux
sélection
mélange
fonctionnement
Prior art date
Application number
PL19787203T
Other languages
English (en)
Inventor
Marius KERN
Laura TUSA
Jens Gutzmer
Karl Gerald VAN DEN BOOGAART
Original Assignee
Helmholtz-Zentrum Dresden - Rossendorf E.V.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Helmholtz-Zentrum Dresden - Rossendorf E.V. filed Critical Helmholtz-Zentrum Dresden - Rossendorf E.V.
Publication of PL3799580T3 publication Critical patent/PL3799580T3/pl

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34Sorting according to other particular properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00Measuring or testing not otherwise provided for
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/02Food
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/24Earth materials

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
PL19787203T 2018-10-12 2019-10-10 Sposób ukierunkowanego wyboru czujnika do opartego na czujnikach sortowania mieszaniny materiałów przez symulację opartego na czujnikach sortowania mieszaniny materiałów PL3799580T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102018217548.9A DE102018217548A1 (de) 2018-10-12 2018-10-12 Verfahren zur gezielten Auswahl eines Sensors zur sensorbasierten Sortierung eines Materialgemisches durch Simulation der sensorbasierten Sortierung des Materialgemisches
EP19787203.9A EP3799580B8 (de) 2018-10-12 2019-10-10 Verfahren zur gezielten auswahl eines sensors zur sensorbasierten sortierung eines materialgemisches durch simulation der sensorbasierten sortierung des materialgemisches
PCT/EP2019/077524 WO2020074665A1 (de) 2018-10-12 2019-10-10 Verfahren zur gezielten auswahl eines sensors zur sensorbasierten sortierung eines materialgemisches durch simulation der sensorbasierten sortierung des materialgemisches

Publications (1)

Publication Number Publication Date
PL3799580T3 true PL3799580T3 (pl) 2022-05-02

Family

ID=68242659

Family Applications (1)

Application Number Title Priority Date Filing Date
PL19787203T PL3799580T3 (pl) 2018-10-12 2019-10-10 Sposób ukierunkowanego wyboru czujnika do opartego na czujnikach sortowania mieszaniny materiałów przez symulację opartego na czujnikach sortowania mieszaniny materiałów

Country Status (4)

Country Link
EP (1) EP3799580B8 (pl)
DE (1) DE102018217548A1 (pl)
PL (1) PL3799580T3 (pl)
WO (1) WO2020074665A1 (pl)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2021342788B2 (en) * 2020-09-16 2025-02-13 Enersoft Inc. Multiple-sensor analysis of geological samples

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3369488B1 (en) * 2012-05-01 2021-06-23 Minesense Technologies Ltd. High capacity cascade-type mineral sorting method
DE102012106132A1 (de) * 2012-07-09 2014-05-08 Reinhausen Plasma Gmbh Verfahren und System zur Identifizierung und Diskriminierung von heterogenen Materialien zur Verarbeitung in einer Vorrichtung zur Produktbearbeitung

Also Published As

Publication number Publication date
EP3799580A1 (de) 2021-04-07
EP3799580B8 (de) 2022-03-30
DE102018217548A1 (de) 2020-04-16
EP3799580B1 (de) 2022-01-12
WO2020074665A1 (de) 2020-04-16

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