PL3524968T3 - Sposób i urządzenie do oceny zdjęcia rentgenowskiego wieloenergetycznego poprzez rozkład materiału bazowego - Google Patents
Sposób i urządzenie do oceny zdjęcia rentgenowskiego wieloenergetycznego poprzez rozkład materiału bazowegoInfo
- Publication number
- PL3524968T3 PL3524968T3 PL19155543.2T PL19155543T PL3524968T3 PL 3524968 T3 PL3524968 T3 PL 3524968T3 PL 19155543 T PL19155543 T PL 19155543T PL 3524968 T3 PL3524968 T3 PL 3524968T3
- Authority
- PL
- Poland
- Prior art keywords
- evaluating
- energy
- base material
- ray image
- material disassembly
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
- G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
- G01N23/2273—Measuring photoelectron spectrum, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/423—Imaging multispectral imaging-multiple energy imaging
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Pathology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Engineering & Computer Science (AREA)
- Toxicology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102018201967.3A DE102018201967A1 (de) | 2018-02-08 | 2018-02-08 | Verfahren zum Auswerten einer Multi-Energie-Röntgen-Aufnahme mittels einer Basismaterialzerlegung |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PL3524968T3 true PL3524968T3 (pl) | 2024-01-15 |
Family
ID=65520046
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL19155543.2T PL3524968T3 (pl) | 2018-02-08 | 2019-02-05 | Sposób i urządzenie do oceny zdjęcia rentgenowskiego wieloenergetycznego poprzez rozkład materiału bazowego |
Country Status (5)
| Country | Link |
|---|---|
| EP (1) | EP3524968B1 (pl) |
| CN (1) | CN110133005B (pl) |
| DE (1) | DE102018201967A1 (pl) |
| ES (1) | ES2960486T3 (pl) |
| PL (1) | PL3524968T3 (pl) |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101266216A (zh) * | 2007-03-14 | 2008-09-17 | 清华大学 | 标定双能ct系统的方法和图像重建方法 |
| US20090129539A1 (en) * | 2007-11-21 | 2009-05-21 | General Electric Company | Computed tomography method and system |
| DE102009017615A1 (de) * | 2009-04-16 | 2010-12-30 | Siemens Aktiengesellschaft | Verfahren und Bildrekonstruktionseinrichtung zur Erzeugung von radiologischen Bilddaten |
| CN104346820B (zh) * | 2013-07-26 | 2017-05-17 | 清华大学 | 一种x光双能ct重建方法 |
| CN106296633B (zh) * | 2015-05-22 | 2019-08-02 | 浙江大学 | 一种基于多尺度图像域双能分解算法 |
| CN107356615B (zh) * | 2016-05-10 | 2020-01-21 | 清华大学 | 一种用于双能x射线ct的方法和系统 |
-
2018
- 2018-02-08 DE DE102018201967.3A patent/DE102018201967A1/de not_active Withdrawn
-
2019
- 2019-02-05 PL PL19155543.2T patent/PL3524968T3/pl unknown
- 2019-02-05 EP EP19155543.2A patent/EP3524968B1/de active Active
- 2019-02-05 ES ES19155543T patent/ES2960486T3/es active Active
- 2019-02-11 CN CN201910110778.0A patent/CN110133005B/zh active Active
Also Published As
| Publication number | Publication date |
|---|---|
| DE102018201967A1 (de) | 2019-08-08 |
| EP3524968C0 (de) | 2023-08-02 |
| ES2960486T3 (es) | 2024-03-05 |
| EP3524968A3 (de) | 2019-11-13 |
| CN110133005A (zh) | 2019-08-16 |
| EP3524968B1 (de) | 2023-08-02 |
| CN110133005B (zh) | 2022-06-03 |
| EP3524968A2 (de) | 2019-08-14 |
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