PL3472579T3 - Analiza nadpróbkowanych sygnałów drgań o wysokiej częstotliwości - Google Patents

Analiza nadpróbkowanych sygnałów drgań o wysokiej częstotliwości

Info

Publication number
PL3472579T3
PL3472579T3 PL17800146.7T PL17800146T PL3472579T3 PL 3472579 T3 PL3472579 T3 PL 3472579T3 PL 17800146 T PL17800146 T PL 17800146T PL 3472579 T3 PL3472579 T3 PL 3472579T3
Authority
PL
Poland
Prior art keywords
analysis
high frequency
frequency vibration
vibration signals
oversampled high
Prior art date
Application number
PL17800146.7T
Other languages
English (en)
Inventor
Raymond E. Garvey
Willie T. King
Axel Christian PATTYN
Tristan Frederic J. LAMESCH
Original Assignee
Industrial Consulting Automation Research Engineering (I-Care)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Industrial Consulting Automation Research Engineering (I-Care) filed Critical Industrial Consulting Automation Research Engineering (I-Care)
Publication of PL3472579T3 publication Critical patent/PL3472579T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M13/00—Testing of machine parts
    • G01M13/04—Bearings
    • G01M13/045—Acoustic or vibration analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H1/00—Measuring characteristics of vibrations in solids by using direct conduction to the detector
    • G01H1/04—Measuring characteristics of vibrations in solids by using direct conduction to the detector of vibrations which are transverse to direction of propagation
    • G01H1/06—Frequency
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00—Measuring or testing not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/14—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object using acoustic emission techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36—Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/42—Detecting the response signal, e.g. electronic circuits specially adapted therefor by frequency filtering or by tuning to resonant frequency
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4418—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with a model, e.g. best-fit, regression analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
    • G01N29/4427—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison with stored values, e.g. threshold values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/46—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/48—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by amplitude comparison
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N5/00—Computing arrangements using knowledge-based models
    • G06N5/02—Knowledge representation; Symbolic representation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Signal Processing (AREA)
  • Acoustics & Sound (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Artificial Intelligence (AREA)
  • Computational Linguistics (AREA)
  • Data Mining & Analysis (AREA)
  • Evolutionary Computation (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Software Systems (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
PL17800146.7T 2016-05-18 2017-05-18 Analiza nadpróbkowanych sygnałów drgań o wysokiej częstotliwości PL3472579T3 (pl)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201662338180P 2016-05-18 2016-05-18
US201662496878P 2016-10-31 2016-10-31
US201762448415P 2017-01-20 2017-01-20
PCT/US2017/033266 WO2017201247A1 (en) 2016-05-18 2017-05-18 Analysis of oversampled high frequency vibration signals

Publications (1)

Publication Number Publication Date
PL3472579T3 true PL3472579T3 (pl) 2024-02-05

Family

ID=60325555

Family Applications (1)

Application Number Title Priority Date Filing Date
PL17800146.7T PL3472579T3 (pl) 2016-05-18 2017-05-18 Analiza nadpróbkowanych sygnałów drgań o wysokiej częstotliwości

Country Status (4)

Country Link
US (1) US20220326117A1 (pl)
EP (1) EP3472579B1 (pl)
PL (1) PL3472579T3 (pl)
WO (1) WO2017201247A1 (pl)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10816436B2 (en) 2018-07-06 2020-10-27 The Boeing Company System for temperature insensitive damage detection
US20220129820A1 (en) * 2020-10-23 2022-04-28 Dell Products L.P. Data stream noise identification
CN112533164B (zh) * 2020-10-26 2023-10-10 中国人民解放军92942部队 一种提高可靠性测试中振动数据传输带宽的方法
WO2023126829A1 (en) * 2021-12-30 2023-07-06 Beckman Coulter, Inc. Method for controlling a centrifuge and centrifuge
CN114970735B (zh) * 2022-06-09 2023-06-27 哈尔滨工业大学 基于正弦修正焦点损失的燃机类不平衡诊断方法及系统

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5895857A (en) * 1995-11-08 1999-04-20 Csi Technology, Inc. Machine fault detection using vibration signal peak detector
US5852793A (en) * 1997-02-18 1998-12-22 Dme Corporation Method and apparatus for predictive diagnosis of moving machine parts
US7640139B2 (en) * 2004-10-18 2009-12-29 Nsk Ltd. Abnormality diagnosing system for mechanical equipment
US9927285B2 (en) * 2012-10-26 2018-03-27 Azima Holdings, Inc. Multi-unit data analyzer
US9778080B2 (en) 2013-04-29 2017-10-03 Emerson Electric (Us) Holding Corporation (Chile) Limitada Selective decimation and analysis of oversampled data
US10502594B2 (en) * 2013-04-29 2019-12-10 Emerson Electric (Us) Holding Corporation (Chile) Limitada Dynamic transducer with digital output and method for use
US9335340B2 (en) * 2013-07-23 2016-05-10 Freescale Semiconductor, Inc. MEMS parameter identification using modulated waveforms
BE1021598B1 (fr) * 2014-07-16 2015-12-16 Industrial Consulting Automation Research Engineering, En Abrégé: I-Care Module de transmission de signaux sans fil, systeme de diagnostic de machine industrielle et procede d'alimentation du module de transmission

Also Published As

Publication number Publication date
WO2017201247A1 (en) 2017-11-23
US20220326117A1 (en) 2022-10-13
EP3472579A4 (en) 2020-08-12
EP3472579A1 (en) 2019-04-24
EP3472579B1 (en) 2023-08-16
EP3472579C0 (en) 2023-08-16

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