PL3273276T3 - Sposób i system sterowania akceleratorem skaningowym do emitowania wiązki oraz system inspekcji bezpieczeństwa - Google Patents

Sposób i system sterowania akceleratorem skaningowym do emitowania wiązki oraz system inspekcji bezpieczeństwa

Info

Publication number
PL3273276T3
PL3273276T3 PL17173717T PL17173717T PL3273276T3 PL 3273276 T3 PL3273276 T3 PL 3273276T3 PL 17173717 T PL17173717 T PL 17173717T PL 17173717 T PL17173717 T PL 17173717T PL 3273276 T3 PL3273276 T3 PL 3273276T3
Authority
PL
Poland
Prior art keywords
security inspection
emit beam
controlling scanning
inspection system
scanning accelerator
Prior art date
Application number
PL17173717T
Other languages
English (en)
Inventor
Juxuan LI
Wanhui LI
Weifeng Yu
Shangmin Sun
Yu Hu
Yuan Ma
Original Assignee
Nuctech Company Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuctech Company Limited filed Critical Nuctech Company Limited
Publication of PL3273276T3 publication Critical patent/PL3273276T3/pl

Links

Classifications

    • G01V5/22
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G2/00Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/04Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/04Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00Irradiation devices
    • G21K5/04Irradiation devices with beam-forming means

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Immunology (AREA)
  • Optics & Photonics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Plasma & Fusion (AREA)
  • Health & Medical Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Particle Accelerators (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Burglar Alarm Systems (AREA)
PL17173717T 2016-07-22 2017-05-31 Sposób i system sterowania akceleratorem skaningowym do emitowania wiązki oraz system inspekcji bezpieczeństwa PL3273276T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201610587291.8A CN106018445B (zh) 2016-07-22 2016-07-22 控制扫描加速器出束的方法和系统及安全检查系统
EP17173717.4A EP3273276B1 (en) 2016-07-22 2017-05-31 Method and system for controlling scanning accelerator to emit beam, and security inspection system

Publications (1)

Publication Number Publication Date
PL3273276T3 true PL3273276T3 (pl) 2021-12-13

Family

ID=57117634

Family Applications (1)

Application Number Title Priority Date Filing Date
PL17173717T PL3273276T3 (pl) 2016-07-22 2017-05-31 Sposób i system sterowania akceleratorem skaningowym do emitowania wiązki oraz system inspekcji bezpieczeństwa

Country Status (5)

Country Link
EP (1) EP3273276B1 (pl)
CN (1) CN106018445B (pl)
EA (1) EA036519B1 (pl)
MY (1) MY193920A (pl)
PL (1) PL3273276T3 (pl)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107580404B (zh) * 2017-08-30 2020-03-17 上海联影医疗科技有限公司 一种用于直线加速器的控制方法及直线加速器
CN109682842B (zh) * 2019-02-03 2024-03-26 同方威视技术股份有限公司 一种列车检查系统及检查方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7492861B2 (en) * 2006-10-13 2009-02-17 Tsinghua University Apparatus and method for quick imaging and inspecting moving target
CN101162209B (zh) * 2006-10-13 2010-08-25 清华大学 对移动目标进行快速成像检查的设备及方法
GB0918734D0 (en) * 2009-10-26 2009-12-09 Fortishield Ltd A cargo inspection apparatua
KR101973221B1 (ko) * 2011-09-07 2019-04-26 라피스캔 시스템스, 인코포레이티드 적하목록 데이터를 이미징/검출 프로세싱에 통합시키는 x-선 검사시스템
US9274065B2 (en) * 2012-02-08 2016-03-01 Rapiscan Systems, Inc. High-speed security inspection system
PL2983012T3 (pl) * 2013-11-14 2018-11-30 Tsinghua University Wieloenergetyczny wielodawkowy akcelerator, szybki układ kontrolny mający akcelerator i odpowiedni szybki sposób kontrolowania
CN105445808B (zh) * 2014-08-19 2018-10-02 清华大学 对移动目标进行检查的设备及方法
CN204223708U (zh) * 2014-08-22 2015-03-25 清华大学 车辆检查系统
CN105548223B (zh) * 2015-12-23 2019-07-02 清华大学 扫描方法、扫描系统及射线扫描控制器

Also Published As

Publication number Publication date
MY193920A (en) 2022-11-01
EP3273276B1 (en) 2021-06-23
EA036519B1 (ru) 2020-11-19
EA201790970A2 (ru) 2018-01-31
CN106018445A (zh) 2016-10-12
CN106018445B (zh) 2019-04-05
EA201790970A3 (ru) 2018-02-28
EP3273276A1 (en) 2018-01-24

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