PL3191790T3 - Crimping measuring device - Google Patents

Crimping measuring device

Info

Publication number
PL3191790T3
PL3191790T3 PL16767365T PL16767365T PL3191790T3 PL 3191790 T3 PL3191790 T3 PL 3191790T3 PL 16767365 T PL16767365 T PL 16767365T PL 16767365 T PL16767365 T PL 16767365T PL 3191790 T3 PL3191790 T3 PL 3191790T3
Authority
PL
Poland
Prior art keywords
measuring device
crimping
crimping measuring
measuring
Prior art date
Application number
PL16767365T
Other languages
Polish (pl)
Inventor
Luc Sneyders
Original Assignee
Exmore Benelux Bvba
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Exmore Benelux Bvba filed Critical Exmore Benelux Bvba
Publication of PL3191790T3 publication Critical patent/PL3191790T3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
    • G01B5/06—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness
    • G01B5/061—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness height gauges
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • H01R43/04—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for forming connections by deformation, e.g. crimping tool
    • H01R43/048—Crimping apparatus or processes
    • H01R43/0488—Crimping apparatus or processes with crimp height adjusting means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70605—Workpiece metrology
    • G03F7/70616—Monitoring the printed patterns
    • G03F7/70625—Dimensions, e.g. line width, critical dimension [CD], profile, sidewall angle or edge roughness
PL16767365T 2015-12-02 2016-08-31 Crimping measuring device PL3191790T3 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
BE2015/5778A BE1023160B1 (en) 2015-12-02 2015-12-02 Shrink measuring device
PCT/IB2016/055190 WO2017093815A1 (en) 2015-12-02 2016-08-31 Crimping measurement device
EP16767365.6A EP3191790B1 (en) 2015-12-02 2016-08-31 Crimping measuring device

Publications (1)

Publication Number Publication Date
PL3191790T3 true PL3191790T3 (en) 2018-06-29

Family

ID=55352954

Family Applications (1)

Application Number Title Priority Date Filing Date
PL16767365T PL3191790T3 (en) 2015-12-02 2016-08-31 Crimping measuring device

Country Status (9)

Country Link
US (1) US9903706B2 (en)
EP (1) EP3191790B1 (en)
JP (1) JP6291630B1 (en)
CN (1) CN107532876A (en)
BE (1) BE1023160B1 (en)
HU (1) HUE038948T2 (en)
MX (1) MX2017003668A (en)
PL (1) PL3191790T3 (en)
WO (1) WO2017093815A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112461081A (en) * 2020-11-21 2021-03-09 杭州锦航日用品制造有限公司 Wood craft overall dimension detection device
CN115319540B (en) * 2022-07-26 2023-08-25 南阳煜众精密机械有限公司 Visual measurement method for on-machine cutter eccentric parameters

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5263443U (en) * 1975-11-05 1977-05-11
JP2645095B2 (en) * 1988-08-12 1997-08-25 矢崎総業株式会社 Burr height measuring method and measuring tool
US4856186A (en) * 1988-11-04 1989-08-15 Amp Incorporated Apparatus and method for determination of crimp height
US5421101A (en) * 1994-04-14 1995-06-06 Ut Automotive, Inc. Dedicated crimp measuring gauge
JP3379306B2 (en) * 1995-10-26 2003-02-24 住友電装株式会社 Crimped terminal crimp measuring device
JPH10332307A (en) * 1997-05-30 1998-12-18 Mitsuboshi Belting Ltd Back thickness measuring device for toothed belt
EP0964485A1 (en) * 1998-06-11 1999-12-15 The Whitaker Corporation Crimp height measuring device
JP3525072B2 (en) * 1999-03-15 2004-05-10 矢崎総業株式会社 Micrometer
EP1780846B1 (en) * 2005-10-27 2009-03-18 komax Holding AG Measuring head and method for determination of crimp height of a conductor
CN102735138B (en) * 2011-04-12 2015-07-01 科马斯控股股份公司 A measuring assembly and method for determining at least the crimp height of one conductor crimp
JP6013847B2 (en) * 2012-09-14 2016-10-25 矢崎総業株式会社 Terminal crimping inspection method and apparatus
CN104995808B (en) * 2013-02-23 2017-09-12 古河电气工业株式会社 The manufacture method of connection structural bodies and the manufacture device of connection structural bodies
CN104457652A (en) * 2013-09-25 2015-03-25 珠海格力电器股份有限公司 Terminal pressure welding quality detecting device and method and terminal pressure welding system

Also Published As

Publication number Publication date
EP3191790B1 (en) 2018-03-07
CN107532876A (en) 2018-01-02
MX2017003668A (en) 2017-10-31
EP3191790A1 (en) 2017-07-19
US20170307356A1 (en) 2017-10-26
BE1023160B1 (en) 2016-12-05
US9903706B2 (en) 2018-02-27
JP6291630B1 (en) 2018-03-14
WO2017093815A1 (en) 2017-06-08
JP2018507384A (en) 2018-03-15
HUE038948T2 (en) 2018-12-28

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