PL204698A1 - Uklad testowy tranzystorow,zwlaszcza dla pomiaru ich parametrow szumowych w zakresie malych i bardzo malych czestotliwosci - Google Patents

Uklad testowy tranzystorow,zwlaszcza dla pomiaru ich parametrow szumowych w zakresie malych i bardzo malych czestotliwosci

Info

Publication number
PL204698A1
PL204698A1 PL20469878A PL20469878A PL204698A1 PL 204698 A1 PL204698 A1 PL 204698A1 PL 20469878 A PL20469878 A PL 20469878A PL 20469878 A PL20469878 A PL 20469878A PL 204698 A1 PL204698 A1 PL 204698A1
Authority
PL
Poland
Prior art keywords
measuring
small
range
test system
low frequencies
Prior art date
Application number
PL20469878A
Other languages
English (en)
Other versions
PL116775B1 (en
Inventor
Zenon Zdybel
Ludwik Spiralski
Original Assignee
Politechnika Gdanska
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Politechnika Gdanska filed Critical Politechnika Gdanska
Priority to PL20469878A priority Critical patent/PL116775B1/pl
Publication of PL204698A1 publication Critical patent/PL204698A1/pl
Publication of PL116775B1 publication Critical patent/PL116775B1/pl

Links

PL20469878A 1978-02-16 1978-02-16 Transistor testing system,particularly for measuring their noise parameters within the scope of low and very low frequencies PL116775B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PL20469878A PL116775B1 (en) 1978-02-16 1978-02-16 Transistor testing system,particularly for measuring their noise parameters within the scope of low and very low frequencies

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL20469878A PL116775B1 (en) 1978-02-16 1978-02-16 Transistor testing system,particularly for measuring their noise parameters within the scope of low and very low frequencies

Publications (2)

Publication Number Publication Date
PL204698A1 true PL204698A1 (pl) 1979-10-22
PL116775B1 PL116775B1 (en) 1981-06-30

Family

ID=19987587

Family Applications (1)

Application Number Title Priority Date Filing Date
PL20469878A PL116775B1 (en) 1978-02-16 1978-02-16 Transistor testing system,particularly for measuring their noise parameters within the scope of low and very low frequencies

Country Status (1)

Country Link
PL (1) PL116775B1 (pl)

Also Published As

Publication number Publication date
PL116775B1 (en) 1981-06-30

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