PL204698A1 - Uklad testowy tranzystorow,zwlaszcza dla pomiaru ich parametrow szumowych w zakresie malych i bardzo malych czestotliwosci
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Uklad testowy tranzystorow,zwlaszcza dla pomiaru ich parametrow szumowych w zakresie malych i bardzo malych czestotliwosci
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PL20469878A1978-02-161978-02-16Transistor testing system,particularly for measuring their noise parameters within the scope of low and very low frequencies
PL116775B1
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