PL1788347T3 - Sposób automatycznej parametryzacji układów pomiarowych - Google Patents

Sposób automatycznej parametryzacji układów pomiarowych

Info

Publication number
PL1788347T3
PL1788347T3 PL06020135T PL06020135T PL1788347T3 PL 1788347 T3 PL1788347 T3 PL 1788347T3 PL 06020135 T PL06020135 T PL 06020135T PL 06020135 T PL06020135 T PL 06020135T PL 1788347 T3 PL1788347 T3 PL 1788347T3
Authority
PL
Poland
Prior art keywords
measuring system
parameterisation
automatic
automatic parameterisation
measuring
Prior art date
Application number
PL06020135T
Other languages
English (en)
Inventor
Thomas Kaltenbach
Original Assignee
Sick Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=37432264&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=PL1788347(T3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Sick Ag filed Critical Sick Ag
Publication of PL1788347T3 publication Critical patent/PL1788347T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
PL06020135T 2005-11-16 2006-09-26 Sposób automatycznej parametryzacji układów pomiarowych PL1788347T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102005054658A DE102005054658A1 (de) 2005-11-16 2005-11-16 Verfahren zur automatischen Paramentierung von Meßsystemen
EP06020135.7A EP1788347B2 (de) 2005-11-16 2006-09-26 Verfahren zur automatischen Parametrierung von Messsystemen

Publications (1)

Publication Number Publication Date
PL1788347T3 true PL1788347T3 (pl) 2013-02-28

Family

ID=37432264

Family Applications (1)

Application Number Title Priority Date Filing Date
PL06020135T PL1788347T3 (pl) 2005-11-16 2006-09-26 Sposób automatycznej parametryzacji układów pomiarowych

Country Status (6)

Country Link
US (1) US7602505B2 (pl)
EP (1) EP1788347B2 (pl)
DE (1) DE102005054658A1 (pl)
DK (1) DK1788347T3 (pl)
ES (1) ES2393109T3 (pl)
PL (1) PL1788347T3 (pl)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020014533A1 (en) * 1995-12-18 2002-02-07 Xiaxun Zhu Automated object dimensioning system employing contour tracing, vertice detection, and forner point detection and reduction methods on 2-d range data maps
US8264697B2 (en) * 2007-11-27 2012-09-11 Intelligrated Headquarters, Llc Object detection device
US8432577B2 (en) * 2008-05-15 2013-04-30 Microsoft Corporation Scanner parameter techniques
WO2011111079A1 (en) 2010-03-11 2011-09-15 Datalogic Scanning Group Sr.L. Image capturing device
JP2013532823A (ja) * 2010-07-28 2013-08-19 ローベルト ボツシユ ゲゼルシヤフト ミツト ベシユレンクテル ハフツング 医薬品の重量を、ｘ線源を用いて測定する装置及び方法
ITAN20110063A1 (it) * 2011-05-20 2012-11-21 Omg Di Geminiani Gino Sistema d' acquisizione del profilo di automezzi
AT510674B1 (de) * 2011-10-27 2014-05-15 Avl List Gmbh Verfahren und eine vorrichtung zum parametrieren eines sensors
US9541422B2 (en) 2012-01-09 2017-01-10 Packsize Llc Cable-based measuring system
US9651363B2 (en) 2012-07-24 2017-05-16 Datalogic Usa, Inc. Systems and methods of object measurement in an automated data reader
US9201163B2 (en) * 2013-06-07 2015-12-01 Intelligrated Headquarters, Llc Dual laser article detection system
US9546860B2 (en) * 2015-04-18 2017-01-17 Mediatek Singapore Pte. Ltd. Method and system for contactless dimensional measurement of articles
DE102016114477B4 (de) * 2016-08-04 2018-03-22 Sick Ag Fördervorrichtung
CN106524917B (zh) * 2016-12-09 2019-01-11 北京科技大学 一种运输带上物体体积测量方法
CN108629325B (zh) * 2018-05-11 2021-06-22 北京旷视科技有限公司 物品位置的确定方法、装置及系统

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US4063820A (en) * 1975-11-10 1977-12-20 Rca Corporation Apparatus for measuring a dimension of an object
US4105925A (en) * 1977-03-14 1978-08-08 General Motors Corporation Optical object locator
US4188544A (en) * 1977-08-22 1980-02-12 Weyerhaeuser Company Method and apparatus for automatically processing a workpiece employing calibrated scanning
US4323772A (en) * 1980-03-06 1982-04-06 R. J. Reynolds Tobacco Company Bar code reader system
DE3423135A1 (de) * 1984-06-22 1986-01-02 Dornier Gmbh, 7990 Friedrichshafen Verfahren zum auslesen einer entfernungsbildzeile
US4677302A (en) * 1985-03-29 1987-06-30 Siemens Corporate Research & Support, Inc. Optical system for inspecting printed circuit boards wherein a ramp filter is disposed between reflected beam and photodetector
US4979815A (en) * 1989-02-17 1990-12-25 Tsikos Constantine J Laser range imaging system based on projective geometry
US4929843A (en) * 1989-06-28 1990-05-29 General Electric Company Apparatus and method for determining a dimension of an object
US5606534A (en) * 1989-09-01 1997-02-25 Quantronix, Inc. Laser-based dimensioning system
WO1991008439A1 (de) * 1989-12-05 1991-06-13 Böhler Gesellschaft M.B.H. Verfahren und anordnung zur optoelektronischen vermessung von gegenständen
JPH0545128A (ja) * 1991-08-15 1993-02-23 Kawasaki Steel Corp 移動物体の測長方法
DE4340756C5 (de) † 1992-12-08 2006-08-10 Sick Ag Laserabstandsermittlungsvorrichtung
DE4411448C5 (de) † 1994-03-31 2009-05-14 Sick Ag Verfahren und Vorrichtung zur Kontrolle eines vorgegebenen Überwachungsbereichs
US6064759A (en) * 1996-11-08 2000-05-16 Buckley; B. Shawn Computer aided inspection machine
US5978521A (en) * 1997-09-25 1999-11-02 Cognex Corporation Machine vision methods using feedback to determine calibration locations of multiple cameras that image a common object
US6094269A (en) * 1997-12-31 2000-07-25 Metroptic Technologies, Ltd. Apparatus and method for optically measuring an object surface contour
US6493079B1 (en) * 2000-09-07 2002-12-10 National Instruments Corporation System and method for machine vision analysis of an object using a reduced number of cameras
US6795200B1 (en) * 2000-11-13 2004-09-21 Point Grey Research Inc. Method and system for dimensioning boxes or other cuboid objects
DE10122664A1 (de) 2001-05-10 2002-11-14 Ibeo Automobile Sensor Gmbh Kalibrierverfahren
DE10226663A1 (de) * 2002-06-14 2003-12-24 Sick Ag Verfahren zum Auffinden von Gegenständen auf einer Trägerebene
TW561241B (en) † 2002-08-22 2003-11-11 Ind Tech Res Inst Method and apparatus for calibrating laser three-dimensional digitizing sensor
DE10260201A1 (de) * 2002-12-20 2004-07-01 Sick Ag Verfahren und Vorrichtung zur Erfassung von auf einem Fördermittel bewegten Objekten mittels eines optoelektronischen Sensors
DE10334640B4 (de) * 2003-07-29 2006-05-04 Siemens Ag Verfahren und Anordnung zum Erkennen der Position eines Objektes

Also Published As

Publication number Publication date
ES2393109T3 (es) 2012-12-18
EP1788347A1 (de) 2007-05-23
DE102005054658A1 (de) 2007-05-24
EP1788347B1 (de) 2012-09-12
US7602505B2 (en) 2009-10-13
EP1788347B2 (de) 2020-01-22
US20070121122A1 (en) 2007-05-31
DK1788347T3 (da) 2012-12-03

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