PH12020500651A1 - Abnormally monitoring device, abnormality monitoring method, program, control device, and plant - Google Patents

Abnormally monitoring device, abnormality monitoring method, program, control device, and plant

Info

Publication number
PH12020500651A1
PH12020500651A1 PH12020500651A PH12020500651A PH12020500651A1 PH 12020500651 A1 PH12020500651 A1 PH 12020500651A1 PH 12020500651 A PH12020500651 A PH 12020500651A PH 12020500651 A PH12020500651 A PH 12020500651A PH 12020500651 A1 PH12020500651 A1 PH 12020500651A1
Authority
PH
Philippines
Prior art keywords
abnormality
display unit
abnormally
plant
program
Prior art date
Application number
PH12020500651A
Inventor
Masanori Kadowaki
Original Assignee
Sumitomo Heavy Industries
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Heavy Industries filed Critical Sumitomo Heavy Industries
Publication of PH12020500651A1 publication Critical patent/PH12020500651A1/en

Links

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0267Fault communication, e.g. human machine interface [HMI]
    • G05B23/0272Presentation of monitored results, e.g. selection of status reports to be displayed; Filtering information to the user
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0262Confirmation of fault detection, e.g. extra checks to confirm that a failure has indeed occurred

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Human Computer Interaction (AREA)
  • Testing And Monitoring For Control Systems (AREA)

Abstract

In this abnormality monitoring device 300, a degree of abnormality display unit 100 displays time series data of the degree of abnormality of a system. A determination result display unit 110 displays a determination result of whether the system is in a normal state or an abnormal state. From multiple process values relating to the state of the system, a process data selection unit 70 allows an operator to select a process value to be viewed. An original data display unit 80 and a statistically processed data display unit 90 display time series data of a process value relating to the state of the system.
PH12020500651A 2018-03-20 2020-08-27 Abnormally monitoring device, abnormality monitoring method, program, control device, and plant PH12020500651A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018053117 2018-03-20
PCT/JP2019/009434 WO2019181572A1 (en) 2018-03-20 2019-03-08 Abnormality monitoring device, abnormality monitoring method, program, control device, and plant

Publications (1)

Publication Number Publication Date
PH12020500651A1 true PH12020500651A1 (en) 2021-06-21

Family

ID=67987153

Family Applications (1)

Application Number Title Priority Date Filing Date
PH12020500651A PH12020500651A1 (en) 2018-03-20 2020-08-27 Abnormally monitoring device, abnormality monitoring method, program, control device, and plant

Country Status (5)

Country Link
JP (1) JP7203085B2 (en)
KR (1) KR102560765B1 (en)
PH (1) PH12020500651A1 (en)
TW (1) TWI711911B (en)
WO (1) WO2019181572A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7230600B2 (en) * 2019-03-13 2023-03-01 オムロン株式会社 display system
JP7418894B2 (en) 2019-12-27 2024-01-22 住友重機械工業株式会社 equipment and systems
JP7423138B2 (en) * 2019-12-27 2024-01-29 住友重機械工業株式会社 equipment and systems
JP7435859B1 (en) * 2023-02-22 2024-02-21 横河電機株式会社 Information processing device, information processing method, and information processing program

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5212007A (en) * 1975-07-18 1977-01-29 Takao Suzuki Method of producing print plate
US9189485B2 (en) * 2010-04-26 2015-11-17 Hitachi, Ltd. Time-series data diagnosing/compressing method
JP5813317B2 (en) * 2010-12-28 2015-11-17 株式会社東芝 Process status monitoring device
JP2013008234A (en) * 2011-06-24 2013-01-10 Omron Corp Data comparison device, data comparison method, control program, and recording medium
JP2016012240A (en) * 2014-06-30 2016-01-21 株式会社日立製作所 Abnormality detection system
WO2016143072A1 (en) * 2015-03-10 2016-09-15 三菱電機株式会社 Programmable logic controller
JP2017211839A (en) 2016-05-25 2017-11-30 横河電機株式会社 Instrument maintenance device, instrument maintenance method, instrument maintenance program, and recording medium

Also Published As

Publication number Publication date
TWI711911B (en) 2020-12-01
TW201941010A (en) 2019-10-16
KR20200135346A (en) 2020-12-02
JPWO2019181572A1 (en) 2021-03-11
KR102560765B1 (en) 2023-07-26
WO2019181572A1 (en) 2019-09-26
JP7203085B2 (en) 2023-01-12

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