PH12020500651A1 - Abnormally monitoring device, abnormality monitoring method, program, control device, and plant - Google Patents
Abnormally monitoring device, abnormality monitoring method, program, control device, and plantInfo
- Publication number
- PH12020500651A1 PH12020500651A1 PH12020500651A PH12020500651A PH12020500651A1 PH 12020500651 A1 PH12020500651 A1 PH 12020500651A1 PH 12020500651 A PH12020500651 A PH 12020500651A PH 12020500651 A PH12020500651 A PH 12020500651A PH 12020500651 A1 PH12020500651 A1 PH 12020500651A1
- Authority
- PH
- Philippines
- Prior art keywords
- abnormality
- display unit
- abnormally
- plant
- program
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
- G05B23/0267—Fault communication, e.g. human machine interface [HMI]
- G05B23/0272—Presentation of monitored results, e.g. selection of status reports to be displayed; Filtering information to the user
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
- G05B23/0262—Confirmation of fault detection, e.g. extra checks to confirm that a failure has indeed occurred
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Automation & Control Theory (AREA)
- Human Computer Interaction (AREA)
- Testing And Monitoring For Control Systems (AREA)
Abstract
In this abnormality monitoring device 300, a degree of abnormality display unit 100 displays time series data of the degree of abnormality of a system. A determination result display unit 110 displays a determination result of whether the system is in a normal state or an abnormal state. From multiple process values relating to the state of the system, a process data selection unit 70 allows an operator to select a process value to be viewed. An original data display unit 80 and a statistically processed data display unit 90 display time series data of a process value relating to the state of the system.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018053117 | 2018-03-20 | ||
PCT/JP2019/009434 WO2019181572A1 (en) | 2018-03-20 | 2019-03-08 | Abnormality monitoring device, abnormality monitoring method, program, control device, and plant |
Publications (1)
Publication Number | Publication Date |
---|---|
PH12020500651A1 true PH12020500651A1 (en) | 2021-06-21 |
Family
ID=67987153
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PH12020500651A PH12020500651A1 (en) | 2018-03-20 | 2020-08-27 | Abnormally monitoring device, abnormality monitoring method, program, control device, and plant |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP7203085B2 (en) |
KR (1) | KR102560765B1 (en) |
PH (1) | PH12020500651A1 (en) |
TW (1) | TWI711911B (en) |
WO (1) | WO2019181572A1 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7230600B2 (en) * | 2019-03-13 | 2023-03-01 | オムロン株式会社 | display system |
JP7418894B2 (en) | 2019-12-27 | 2024-01-22 | 住友重機械工業株式会社 | equipment and systems |
JP7423138B2 (en) * | 2019-12-27 | 2024-01-29 | 住友重機械工業株式会社 | equipment and systems |
JP7435859B1 (en) * | 2023-02-22 | 2024-02-21 | 横河電機株式会社 | Information processing device, information processing method, and information processing program |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5212007A (en) * | 1975-07-18 | 1977-01-29 | Takao Suzuki | Method of producing print plate |
US9189485B2 (en) * | 2010-04-26 | 2015-11-17 | Hitachi, Ltd. | Time-series data diagnosing/compressing method |
JP5813317B2 (en) * | 2010-12-28 | 2015-11-17 | 株式会社東芝 | Process status monitoring device |
JP2013008234A (en) * | 2011-06-24 | 2013-01-10 | Omron Corp | Data comparison device, data comparison method, control program, and recording medium |
JP2016012240A (en) * | 2014-06-30 | 2016-01-21 | 株式会社日立製作所 | Abnormality detection system |
WO2016143072A1 (en) * | 2015-03-10 | 2016-09-15 | 三菱電機株式会社 | Programmable logic controller |
JP2017211839A (en) | 2016-05-25 | 2017-11-30 | 横河電機株式会社 | Instrument maintenance device, instrument maintenance method, instrument maintenance program, and recording medium |
-
2019
- 2019-01-28 TW TW108103033A patent/TWI711911B/en active
- 2019-03-08 JP JP2020508199A patent/JP7203085B2/en active Active
- 2019-03-08 KR KR1020207026875A patent/KR102560765B1/en active IP Right Grant
- 2019-03-08 WO PCT/JP2019/009434 patent/WO2019181572A1/en active Application Filing
-
2020
- 2020-08-27 PH PH12020500651A patent/PH12020500651A1/en unknown
Also Published As
Publication number | Publication date |
---|---|
TWI711911B (en) | 2020-12-01 |
TW201941010A (en) | 2019-10-16 |
KR20200135346A (en) | 2020-12-02 |
JPWO2019181572A1 (en) | 2021-03-11 |
KR102560765B1 (en) | 2023-07-26 |
WO2019181572A1 (en) | 2019-09-26 |
JP7203085B2 (en) | 2023-01-12 |
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